Localized exciton dynamics in AlInGaN alloy

Carrier recombination dynamics in AlInGaN alloy has been studied by photoluminescence (PL) and time-resolved PL (TRPL) at various temperatures. The fast red-shift of PL peak energy is observed and well fitted by a physical model considering the thermal activation and transfer processes. This result provides evidence for the exciton localization in the quantum dot (QD)-like potentials in our AlInGaN alloy. The TRPL signals are found to be described by a stretched exponential function of exp[(−t/τ)^β], indicating the presence of a significant disorder in the material. The disorder is attributed to a randomly distributed QDs or clusters caused by indium fluctuations. By studying the dependence of the dispersive exponent β on temperature and emission energy, we suggest that the exciton hopping dominate the diffusion of carriers localized in the disordered QDs. Furthermore, the localized states are found to have 0D density of states up to 250 K, since the radiative lifetime remains almost unchanged with increasing temperature.     

Photocurrents in p-n Si diodes under high intensity (pulsed-laser) illumination: Quantum yields and kinetic evaluation

The photoelectric response of p-n Si photodiodes under pulsed laser illumination (half width 10 ns) at 532 nm was studied as a function of dose which was varied over 6 orders of magnitude. The photocurrent transients are dominated by a plateau-like feature due to the build up of space charge at the intensities used. Increasing bias voltage increases the height of the plateau and decreases its length. In the low-dose range the length of the transient increases linearly with dose and the collected charge (integrated current) reaches a constant value. At high doses (above 10^–5 J/pulse · cm² or 2.7×10¹³ quanta/pulse · cm²) considerable charge loss (decrease in quantum yields) is accompanied by a less than proportional increase of the transient lifetime. From model calculations the dose and voltage dependence of the quantum yield of charge collection is shown to be the result of competition between current flow and first and higher order recombination. The model calculations are consistent with experimental results. Rate constants have been obtained by fitting.     

Preparation and characterisation of crystalline tris(acetylacetonato)Fe(III) films grown on p-Si substrate for dielectric applications

Thin tris(acetylacetonato)iron(III) films were prepared by sublimation in vacuum on glass and p-Si substrates. Then comprehensive studies of X-ray fluorescence (XRF), X-ray diffraction (XRD), optical absorption spectroscopy, AC-conductivity, and dielectric permittivity as a function of frequency and temperature have been performed. The prepared films show a polycrystalline of orthorhombic structure. The optical absorption spectrum of the film was identical with that of the bulk powder layer. For electrical measurements of the complex as insulator, sample in form of metal-insulator-semiconductor (MIS) structure was prepared and characterised by the measurement of the capacitance and AC-conductance as a function of gate voltage. From those measurements, the state density D_it at insulator/semiconductor interface and the density of the fixed charges in the complex film were determined. It was found that D_it was of order 10¹⁰ eV⁻¹/cm² and the surface charge density in the insulator film was of order 10¹⁰ cm⁻². The frequency dependence of the electrical conductivity and dielectric properties of MIS structures were studied at room temperature. It was observed that the experimental data follow the correlated barrier-hopping (CBH) model, from which the fundamental absorption edge, the cut off hopping distance, and other parameters of the model were determined. It was found that the capacitance of the complex increases as temperature increases. Generally, the present study shows that the tris(acetylacetonato)iron(III) films grown on p-Si is a promising candidate for low-k dielectric applications, it displays low-k value around 2.0.     

Photoluminescence characterization of vertically aligned ZnO microrods

A detailed optical characterization of vertically aligned ZnO microrods (μRs) grown using a Ni-based catalyst was carried out by excitation-power- and temperature-dependent photoluminescence (PL) measurements. Low-temperature PL spectra of ZnO μRs are dominated by near-band-edge (NBE) emission consisted of a series of sharp lines typical for the bulk ZnO. Starting from the higher energy free exciton (FX) emission feature, the majority of them can be explained by radiative recombination of excitons bound to neutral donors (D⁰X), defect bound exciton (DBX), two-electron satellites emission, free-to-bound, i.e. free electrons to the neutral acceptors (eA⁰) transition, as well as their longitudinal-optical phonon replicas. An additional excitonic line located in between the FX and D⁰X lines, denoted as the surface excitons (SX) for ZnO μRs is observed. The intensity of the SX line is found to be smaller than that of the nanosized counterpart and has been attributed to the surface–volume ratio effects. The excitation-power-dependent results of FX line at low and high power regimes show quite close values corresponding to, respectively, p=2 and p=1 limits of the theoretical power law expression I～L^p and larger deviations for the D⁰X, SX and DBX lines. The temperature-dependent measurements confirmed the presence of eA⁰ line showing kT/2 influence to the position of eA⁰ emission line in comparison with FX. FX emissions persist up to 300 K and together with the dominant eA⁰ emission govern the line shape of the NBE emission range, while D⁰X and SX lines are quenched completely at 150 K.     

Laser-induced free-carrier absorption in Si single crystal

The transmitted energy density in thin single Si crystal, wafers is measured at=1.06 m as a function of the incident energy density for a Nd laser pulse of 30 ns duration. Non-linear effects begin to become important at about 0.3 J/cm². The contribution due to free-carriers is separated from the interband one by using measurements made at low energy density and at different sample temperatures in the 20°–150 °C range. The time dependence of the free-carrier concentration and of the lattice temperature is computed for different values of the Auger constant. The experimental data in the 0.2–2.5 J/cm² energy density range are fitted with an Auger constant of 10^–30 cm⁶s^–1.Work supported in part by M.P.I. and G.N.S.M.-C.N.R.     

Optical excitation study on the efficiency droop behaviors of InGaN/GaN multiple-quantum-well structures

Efficiency droop is generally observed in electroluminescence under high current injection. Optical characterization on efficiency droop in InGaN/GaN multiple-quantum-well structures has been conducted at 12 K. Clear droop behaviors were observed for the sample excited by above-bandgap excitation of GaN with pulse laser. The results show that dislocation is not the crucial factor to droop under high carrier density injection, and Auger recombination just slightly affects the efficiency. The radiative recombination may be mainly affected by a multi-carrier-related process (diffusion and drift with a factor of n ^3.5 and n ^5.5) at the interface between GaN barrier and InGaN well.     

Low temperature deposition of SrS:Cu,F ACTFEL device by electron beam evaporation

Photoluminescence (PL) and electroluminescence (EL) of SrS:Cu,F alternating current thin film electroluminescent (ACTFEL) device prepared by electron beam/thermal multi-source evaporation are presented. The active layer was grown at 380 °C and neither post-deposition annealing nor sulphur co-evaporation was performed. Two bands at 380 and 435 nm were present in the PL spectrum, which are suggested to be due to donor acceptor recombination. EL spectrum consisted of an additional band at 535 nm, which is attributed to Cu⁺ intracenter emission. The device exhibited yellowish white EL emission with chromaticity coordinates x=0.25, y=0.27 and low threshold voltage.     

Photoconductivity of highly excited A IV B VI thin films

We report the results of picosecond photoconductivity measurements in photosensitive electrolytically deposited PbS and vacuum evaporated PbTe polycrystalline films. We determine Auger recombination to be the prevailing carrier recombination mechanism in highly excited PbTe and PbS films and found Auger coefficients _A5×10^–28 cm⁶ s^–1 for PbTe and _A5.3×10^–29 cm⁶ s^–1 for PbS for carrier concentration changes N>10¹⁸ cm^–3. The results indicate that the low mobility values are controlled by intergrain carrier scattering. We have studied the thermal annealing influence on picosecond photoconductivity of the films.     

Optoelectronic characteristics of close-packed HgTe nanoparticles in the infrared range

Absorption, photoluminescence (PL), photoresponse, and I-V measurements were made for a close-packed HgTe nanoparticle film without organic capping materials to investigate its optoelectronic characteristics in the infrared (IR) range. In the absorption and PL spectra taken for the close-packed nanoparticle film, the wavelength of exciton peak was red-shifted, compared with 1-thioglycerol capped HgTe nanoparticles dispersed in solution. For the HgTe nanoparticle film, dark current was below several pA level, current was increased by about three orders of magnitude at a biased voltage of 3 V under the illumination, and photoresponse was very rapid compared with 1-thioglycerol capped HgTe nanoparticles. These optoelectronic characteristics illustrate that HgTe nanoparticles are one of promising materials for the photodetector in the IR range. Finally, the origin for the increase of photocurrent with increasing temperature observed in this study will be discussed.     

DC conductivity of silver vanadium tellurite glasses

The mixed electronic-ionic conduction in 0.5[xAg₂O-(1−x)V₂O₅]-0.5TeO₂ glasses with x=0.1-0.8 has been investigated over a wide temperature range (70-425 K). The mechanism of dc conductivity changes from predominantly electronic to ionic within the 30?mol% Ag₂O?40 range; it is correlated with the underlying change in glass structure. The temperature dependence of electronic conductivity has been analyzed quantitatively to determine the applicability of various models of conduction in amorphous semiconducting glasses. At high temperature, T>θ_D/2 (where θ_D is the Debye temperature) the electronic dc conductivity is due to non-adiabatic small polaron hopping of electrons for 0.1?x?0.5. The density of states at Fermi level is estimated to be N(E_F)≈10¹⁹-10²⁰ eV⁻¹ cm⁻³. The carrier density is of the order of 10¹⁹ cm⁻³, with mobility ≈2.3×10⁻⁷-8.6×10⁻⁹ cm² V⁻¹ s⁻¹ at 300 K. The electronic dc conductivity within the whole range of temperature is best described in terms of Triberis-Friedman percolation model. For 0.6?x?0.8, the predominantly ionic dc conductivity is described well by the Anderson-Stuart model.     

Lattice dynamics in two-photon-excited CdS studied by picosecond time-resolved X-ray diffraction

Lattice dynamics and radiative processes in single-crystal cadmium sulfide induced by two-photon excitation with a femtosecond laser are investigated. The development of lattice expansion is directly observed by picosecond time-resolved X-ray diffraction. The obtained lattice dynamics are explained on the basis of a thermally induced impulsive-strain model. The model calculation indicates that two- and more-photon absorption processes occur and that reflectivity rapidly increases under laser irradiation. In photoluminescence spectroscopy, the spectra for TW cm⁻² excitation are shifted to lower energy and show an additional shoulder at 2.35 eV. Furthermore, emission due to Fabry-Perot laser modes with self-formed cavities was observed under 11 TW cm⁻² excitation. The discrepancy between carrier densities deduced from the lattice expansion and the PL spectra indicates that the predominant process at a higher carrier density is not radiative recombination, but Auger recombination followed by lattice heating.     

Optical and theoretical investigations of V ions in CdZnTe crystal

High-resistivity CdZnTe:V crystals are investigated by photoluminescence (PL) and by time-resolved PL in the infrared spectral range. A double peaked emission band is detected around 0.8 eV and it is related to vanadium doping. No-phonon lines of the internal transitions were detected. This emission is interpreted as a balance between the ⁴T₁(⁴P)→⁴T₁(⁴F) internal transition and an electronic transition from the conduction band to the ⁴T₁(⁴F) ground state of V²⁺. The corresponding decay time after laser excitation gives evidence to the contribution of two different recombination processes. These two emission bands are separated by time-resolved luminescence. Crystal-field calculations of the detected transition energies based on Tanabe-Sugano scheme are presented and the Racah parameter B and crystal-field intensity D_q were determined.In addition, a model is developed in terms of one-electron orbital, to explain the characteristics of the PL excitation processes of V²⁺. Excitations with above and below band edge energy confirm the proposed schemes.     

Dependence of photoluminescence of ZnO/Zn0.85Mg0.15O multi-quantum wells on barrier width

Temperature-dependent photoluminescence (PL) from two multi-quantum well (MQW) structures with different barrier widths has been systematically investigated. The PL band in the well layers is dominated by localized excitons (LE), D⁰X, and D⁰X-1LO. As the temperature increases, luminescence from the excitons localized in the well layers shows an ‘S’-shaped shift in the thin barrier MQW whereas a monotonic redshift is observed from the thick barrier MQW. Quenching of well-related emission is associated with delocalization of the excitons in the potential minima induced by interface fluctuations or alloy disorder. The activation energies correlated with depths of the local potential are deduced to be 7 and 17 meV for the thick and thin barrier MQWs, respectively.     

Probing into the effect of Auger recombination mechanism on zero bias resistance-area product in In1−xGaxAs detector

D* (Detectivity), an important figure of merit for photodetectors, is limited by zero bias resistance-area product (R₀A). R₀A is determined by Auger recombination mechanism, depending on the composition, temperature, carrier concentration and other parameters of the photodetectors. To investigate R₀A of In_1−xGa_xAs infrared photodetectors, in this paper, theoretical analysis of Auger recombination mechanism was carried out in the room temperature, by taking CCCH, CHHL and CHHS into account. The calculated results show that there are significant influences on R₀A for various parameters in both p- and n-type regions of the devices. With carrier concentration around 10¹⁷ to 10¹⁸ cm⁻³, R₀A of 10⁸ Ω cm² (n-region) and 10⁶ Ω cm² (p-region) are obtained for x=0.47, when thickness and surface recombination velocity of the sample are 5 μm and 100 m/s, respectively.     

Edge current switch of two-dimensional electron gas using carrier density control

We have investigated the effects of electron density discontinuity on the transports of edge currents of two-dimensional electron gas (2DEG). The electric field applied to a gate, which covers the 2DEG partially, gives rise to change in the carrier density and results in a density gradient, which deforms the edge currents. The transverse and longitudinal resistances were measured as functions of gate voltage V_G in the quantum Hall regime. The deviations of the longitudinal resistances from the normal quantum Hall resistances are attributed to the reflections of the edge currents under the influence of the abrupt density discontinuity. A switching behavior of the transverse resistance by controlling the gate voltage was observed when V_G=−2.2 and −2.0 V for magnetic field H=5 and 7.2 T, respectively.     

Radiation-stimulated pulse conductivity of CsBr crystals

The radiation-stimulated pulse conductivity of CsBr crystals is investigated upon picosecond excitation with electron beams (0.2 MeV, 50 ps, 0.1–10 kA/cm²). The time resolution of the measuring technique is ～150 ps. It is shown that the lifetime of conduction band electrons is limited by their bimolecular recombination with autolocalized holes (V _k centers). A delay in the conduction current pulse build-up is revealed. This effect is explained within the proposed model, according to which the Auger recombination of valence band electrons and holes of the upper core band substantially contributes to the generation of conduction band electrons.     

High optical power dependence of the EL2 recovery in GaAs

In this work, a new way of achieving the recovery from the EL2 metastable state is reported and analyzed theoretically. Despite being an old problem, no definitive picture of the EL2 center has been established to date. For this reason, long past the days of effervescent research on the EL2, new models and investigations keep appearing in the literature as, for example, the recently proposed autocatalytic model to describe the inter-defect correlation during the thermal recovery process [A. Fukuyama, T. Ikari, Y. Akashi, M. Suemitsu, Phys. Rev. B 67 (2003) 113202]. In the course of a re-evaluation of the EL2 for nanosecond volume holographic storage, we found that a strong laser pulse is capable of destroying the metastable state and decided to investigate further this effect. The experiment reported here consists of monitoring the transmission of a λ = 1.05 μm continuous-wave (CW) laser, used to populate the metastable state, while subjecting the sample to the incidence of a strong λ = 1.06 μm laser pulse. A full simulation of the problem has been carried out and the results could be fit very well by assuming a recovery induced by electron-hole recombination and a nonlinear free-carrier production mechanism. It is perhaps worth noting that such a fast recovery induced by the nanosecond laser may prove to be an interesting tool to initiate a recovery process (even at low temperature) in a controlled way to check the predictions of the recently proposed autocatalytic recovery process.     

Noise and correlation functions of hot carriers in semiconductors

We present a unifying theory of electronic noise appropriate to semiconductor materials in the presence of electric fields of arbitrary strength. In addition to thermal noise, a classification scheme for excess noise indicating different microscopic sources of fluctuations responsible for number and mobility fluctuations is provided. On the basis of simple two-level models, numerical calculations using a Monte Carlo technique are performed for the case of p-type Si at 77 K. The primary quantity which is evaluated by the theory is the auto-correlation function of current fluctuations which, subsequently, is analyzed in terms of correlation functions of the relevant physical variables. Accordingly, the corresponding current spectral-densities are determined and then compared with direct experimental results and/or analytical expressions. Important subjects which have been investigated are: (i) the effect of field assisted ionization on generation-recombination noise from shallow impurity levels; (ii) the contribution to the total noise spectrum of cross-correlation terms coupling fluctuations in velocity with those in energy and number; (iii) the current random telegraph signal and the corresponding spectral density associated with a mobility fluctuator. In all cases the numerical calculations are found to be in satisfactory agreement with experiments and/or analytical expressions thus fully supporting the physical reliability of the theoretical approach here proposed.List of the Symbols Used e Absolute value of the electron charge - f Frequency - f Distribution function - g ₁ Scattering strength with the scatter in state 1 - g ₂ Scattering strength with the scatter in state 2 - Reduced Planck constant - j Total current density - j _c Conduction current density - j _d Displacement current density - j _x Component along the x direction of the total current density - k Carrier wavevector - m Carrier effective mass - m ₀ Free electron mass - r Position vector - s Average sound velocity - t Time - u Fraction of ionized carriers - u _i Random telegraph signal related to carrier state - u _m Random telegraph signal related to scatterer state - v _d Ensemble average of the free carrier drift-velocity - v _i Carrier group velocity - v _t Ensemble average of the carrier velocity in the direction transverse to the applied field - v _ix Component along the x direction of the carrier group velocity - v _d ^r Ensemble average of the reduced drift-velocity - v ^r _i Reduced velocity component in the field direction of the i-th particle - v _ix ^j Reduced velocity component along the x axis of the i-th particle in band j - v ^r _ix Reduced velocity component along the x axis of the i-th particle - x _d Ensemble average of the carrier displacement along the x direction from the initial position - x _i Displacement along the x direction of the i-th carrier from the initial position - y _i i-th stochastic parameter - A Cross-sectional area of a homogeneous sample - C _I Auto-correlation function of the total current fluctuations - Auto-correlation function of the total current fluctuations due to mobility fluctuations - D Diffusion coefficient - D _t K Optical deformation potential - E Electrical field strength - E Electric field - E _x Component of the electric field along the x direction - E ₁ ⁰ Acoustic deformation potential - G Conductance - I Total current - I ₀ Total current in the voltage noise operation - I _m Total current associated with mobility fluctuations - I ^V Total current in the current noise operation - K _B Boltzmann constant - L Length of a homogeneous sample - N Number of free carriers which are instantaneously present in the device - N _A Acceptor concentration - N _I Total number of carriers inside the device participating in the transport (here assumed to be constant in time) - N _T Total number of carriers which are instantaneously present in the device - S _I Spectral density of current fluctuations - S _V Spectral density of voltage fluctuations - Spectral density of current fluctuations associated with the mobility fluctuations - Spectral density of current fluctuations due to correlations between fluctuations in number and velocity - Spectral density of current fluctuations due to generation-recombination processes - Spectral density of current fluctuations due to free carrier drift-velocity fluctuations - S _I ^l Longitudinal component with respect to the applied field of the current spectral-density - S _I ^t Transverse component with respect to the applied field of the current spectral-density - T Absolute temperature - T _e Electron temperature - V Electrical potential - V ^I Electrical potential in the voltage noise operation - W Collision rate - Z Small signal impedance - Poole-Frenkel factor - Equilibrium generation rate - _E Field dependent generation rate - Typical energy for thermally escaping from the impurity level - v _d ⁽⁰⁾ Fluctuation of the ensemble average of the driftvelocity associated with Brownian-like motion - v _d ^r(0) Fluctuation of the ensemble average of the reduced drift-velocity associated with Brownian-like motion - Carrier energy - ₀ Vacuum permittivity - _a Energy of the acceptor level - _r Relative static dielectric constant - Angle between initial and final k states - _op Optical phonon equivalent temperature - Mobility - ₀ Chemical potential - ₁ Mobility with the fluctuating scatterer in state 1 - ₂ Mobility with the fluctuating scatterer in state 2 - ₀ Crystal density - _E Field dependent volume recombination rate - _eq Equilibrium volume recombination rate - Conductivity - _g Cross-section for impact ionization - _c Average scattering time - _g Generation time - _l Carrier lifetime - _m Scatterer lifetime - _m1 Mean value of the time spent by the fluctuating scatterer in state 1 - _m2 Mean value of the time spent by the fluctuating scatterer in state 2 - _r Average recombination time - _T Transit time - Scattering rate - _AB Correlation function of the two variables A and B     

Bifurcation phenomena in a periodically driven current filament and a conjecture on the turbulent patterns by computer simulations

Bifurcation routes to chaos in a periodically driven current filament have been studied by computer simulations. By an impact ionization model, theS-shaped currentvoltage curve is perturbed by the dc+ac bias ofE ₀+E _acsin(27f ₀t). The bifurcation maps are described as a function ofE ₀. In the prebreakdown region, the fractal basin boundary, the crisis and the intermittency are discussed, based on the general considerations of the carrier dynamics on the catastrophe manifold. The intermittent burst of the current filament is explained by the destabilization of the weak turbulence generated in the lower branch. In the diffusion-reaction model, the spatio-temporal mode patterns of the transverse carrier profile have revealed the competitive evolution of the hyper-freezing and the firing.