基于纳米光学等离子晶体的新型纳米光子学器件的发展

通过设计合适的纳米表面等离子结构,纳米光学等离子晶体具有光场增强效应,能调控近场范围内的光场分布,可用来设计新型的纳米光子学器件。介绍了纳米光学等离子晶体的原理、结构特点、制作工艺和纳米光子学器件的设计方法,对纳米光学等离子晶体和普通光子晶体做了比较。归纳了纳米光学等离子晶体的物理机制、光学特征,描述并分析了波长选择性场增强效应和束流效应等。给出几种基于纳米光学等离子晶体的纳米光子学器件应用实例。     

近场光学虚拟光探针的数值分析

虚拟光探针是基于近场光学隐失场干涉原理产生的一种非实体探针，可以应用于近场光学超高密度存储、纳米光刻、近场光学成像、光谱探测、纳米样品的近场光学操作等领域。本研究采用三维时间域有限差分（FDTD）方法对近场光学虚拟光探针的光场分布特性进行了数值模拟计算和比较，分析了孔的形状、大小及偏振态等因素对虚拟光探针光场分布的影响，研究结果表明虚拟光探针的通光效率较普通的纳米孔径光纤探针提高10^2-10^4倍；其光场分布的中间峰的半峰全宽（即虚拟光探针的尺寸）在一定距离范围内基本保持不变，从而可以解决近场光学系统中纳米间距控制的难题，避免光学头与介质的磁撞。优化虚拟光探针的设计参量能有效的抑制虚拟光探针中的旁瓣。文章还给出了应用虚拟探针实现高密度光存储的原理方案。     

近场拉曼光谱技术的发展

将近场光学技术与拉曼光谱相结合,发展出近场拉曼光谱术。综述了近场拉曼光谱探测技术的发展现状,讨论了近场拉曼光谱术的优点和纳米局域光谱分析能力。对两种常用的探测方法(常规近场光谱探测方法和近场增强拉曼光谱探测方法)进行了比较,并介绍了近场拉曼光谱技术在生物、化学、纳米材料等领域的一些应用。     

偏振不敏感的表面等离激元三维聚焦研究获进展

正表面等离激元(surfaceplasmons)是一种局域在金属和电介质界面处的电磁场模式,能够突破光学衍射极限,将携带的光学信息和能量局域在亚波长尺度。在高端纳米光学应用领域,如高分辨近场光学成像、针尖增强拉曼光谱,光学集成器件、纳米光     

纳米光学和生物单分子探测

纳米光学技术展示了纳米级探测本领，同时生物单分子探测所需要分辨尺度也是纳米数量级的，因此在生物单分子探测过程中，纳米光学发挥了巨大的作用．文章介绍了与生物单分子探测技术相关的纳米光学技术，包括量子近场光学探针技术、近场光学成像技术(包括扫描近场光学显微术及全内反射荧光显微术)和激光光钳测控技术及它们在生物单分子探测上的进展，从而在染色、成像、测控三个方面展示了纳米光学技术在生物方面的应用，并对其未来的发展方向进行了展望．     

扫描近场光学显微镜探针与光场相互作用的分析

采用时域有限差分方法对镀金属膜光纤探针在近场光探测中对光场产生的扰动和相互作用过程进行了数值分析。选择纳米孔径的隐失场光场和镀金属膜光纤探针建立了近场光探测的理论模型,讨论了探针孔径尺寸、扫描高度等因素对光场探测的影响,以及测量光场与初始光场之间的关系等。研究结果表明,当探针孔径尺寸与待测纳米孔径尺寸相当,探针扫描高度在接近探针孔径尺寸的一半时,测量得到的光场分布数据能够准确描述初始光场分布。     

基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像

本文结合近场扫描结构和纳米线-微光纤耦合技术,提出了一种基于硫化镉纳米线/锥形微光纤探针结构的被动近场光学扫描成像系统.该系统采用被动式纳米探针,保留了纳米探针对样品表面反射光的强约束优势.其理论收集效率为4.65‰,相比于传统的金属镀膜近场探针收集效率提高了一个数量级,可有效地提高扫描探针对样品形貌信息的检测能力;而后通过硫化镉纳米线与微光纤之间高效的倏逝场耦合,将检测的光强信号传输到远场进行光电探测,最终实现对目标样品形貌的分析成像,其样品宽度测量误差在7.28%以内.该系统不需要外部激发光路,利用显微镜自身光源进行远场照明,被动扫描探针仅作为样品表面反射光的被动收集系统.本文基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像方案,可有效地降低探针的制备难度和目标光场的检测难度,简化扫描成像的结构,为近场光学扫描显微系统之后的发展提供新的思路.     

基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像

本文结合近场扫描结构和纳米线-微光纤耦合技术,提出了一种基于硫化镉纳米线/锥形微光纤探针结构的被动近场光学扫描成像系统.该系统采用被动式纳米探针,保留了纳米探针对样品表面反射光的强约束优势.其理论收集效率为4.65‰,相比于传统的金属镀膜近场探针收集效率提高了一个数量级,可有效地提高扫描探针对样品形貌信息的检测能力;而后通过硫化镉纳米线与微光纤之间高效的倏逝场耦合,将检测的光强信号传输到远场进行光电探测,最终实现对目标样品形貌的分析成像,其样品宽度测量误差在7.28%以内.该系统不需要外部激发光路,利用显微镜自身光源进行远场照明,被动扫描探针仅作为样品表面反射光的被动收集系统.本文基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像方案,可有效地降低探针的制备难度和目标光场的检测难度,简化扫描成像的结构,为近场光学扫描显微系统之后的发展提供新的思路.     

等离子体纳米结构中的Fano共振效应及其应用

Fano共振效应是一种具有非对称线型的共振散射现象,起源于共振过程和非共振过程的量子干涉效应。近年来,在等离子体纳米结构中Fano共振现象也被发现,并成为纳米光子学的一个研究热点。等离子体Fano共振通常具有较窄的光谱线宽,且不能直接与入射光耦合,只能局域在近场,强的近场局域特性可以获得巨大的表面电磁场增强。由于等离子体Fano共振独特的光学特性,已经被应用到单分子探测、高灵敏度传感、增强光谱、完美吸收、电磁诱导透明和慢光光子学器件等众多领域当中。     

基于近场激发与增强的新型多层纳米薄膜结构在非线性光学器件上的应用与发展前景

传统光学引入了远场衍射的尺度极限。自从提出了近场光学技术以来 ,由于近场扫描光学显微镜 (NSOM)系统的复杂性而使得近扬的引入和利用变得困难。具有多层纳米薄膜结构的超分辨近场结构 (Super RENS)的提出改变了这种局面 ,并在诸如超高密度光学数据存储、近场光刻技术、纳米光子学晶体管等领域获得了重要的应用。围绕Su per RENS技术 ,通过综述它的基本原理、物理机制以及各项应用 ,指出了基于近场激发与增强原理的新型多层纳米薄膜结构在未来非线性光学器件上的应用与发展前景     

Observation of amplitude and phase in ridge and photonic crystal waveguides operating at 1.55 microm by use of heterodyne scanning near-field optical microscopy

We apply heterodyne scanning near-field optical microscopy (SNOM) to observe with subwavelength resolution the amplitude and phase of optical fields propagating in several microfabricated waveguide devices operating around the 1.55 microm wavelength. Good agreement between the SNOM measurements and predicted optical mode propagation characteristics in standard ridge waveguides demonstrates the validity of the method. In situ observation of the subwavelength-scale distribution and propagation of optical fields in straight and 90 degrees bend photonic crystal waveguides facilitates a more detailed understanding of the optical performance characteristics of these devices and illustrates the usefulness of the technique for investigating nanostructured photonic devices.     

“禁戒光”近场光学显微镜原理与系统

扫描近场光学显微术是８０年代后期发展起来的一种分辨率超过衍射极限的新型光学显微镜技术。本文介绍了国外最近出现的“禁戒光”近场光学显微镜系统的工作原理及结构。透射式ＳＮＯＭ中部分光沿着光轴向前传播；部分光沿着大于全内反射临界角的方向传播。前者称为允许光；后者称为禁戒光。应用“禁戒光”近场光学显微镜可同时获得三幅图像，即允许光像、禁戒光像和反映样品表面形貌的剪切力图像。禁戒光图像能够提供很好的对比度和分辨率。     

Ultrafast optical switching in Kerr nonlinear photonic crystals

Nonlinear photonic crystals made from polystyrene materials that have Kerr nonlinearity can exhibit ultrafast optical switching when the samples are pumped by ultrashort optical pulses with high intensity due to the change of the refractive index of polystyrene and subsequent shift of the band gap edge or defect state resonant frequency. Polystyrene has a large Kerr nonlinear susceptibility and almost instantaneous response to pump light, making it suitable for the realization of ultrafast optical switching with a response time as short as a few femtoseconds. In this paper, we review our experimental progress on the continual improvement of all-optical switching speed in two-dimensional and three-dimensional polystyrene nonlinear photonic crystals in the past years. Several relevant issues are discussed and analyzed, including different mechanisms for all-optical switching, preparation of nonlinear photonic crystal samples by means of microfabrication and self-assembly techniques, characterization of optical switching performance by means of femtosecond pump-probe technique, and different ways to lower the pump power of optical switching to facilitate practical applications in optical information processing. Finally, a brief summary and a perspective of future work are provided.     

Ultrafast optical switching in Kerr nonlinear photonic crystals

Nonlinear photonic crystals made from polystyrene materials that have Kerr nonlinearity can exhibit ultrafast optical switching when the samples are pumped by ultrashort optical pulses with high intensity due to the change of the refractive index of polystyrene and subsequent shift of the band gap edge or defect state resonant frequency. Polystyrene has a large Kerr nonlinear susceptibility and almost instantaneous response to pump light, making it suitable for the realization of ultrafast optical switching with a response time as short as a few femtoseconds. In this paper, we review our experimental progress on the continual improvement of all-optical switching speed in two-dimensional and three-dimensional polystyrene nonlinear photonic crystals in the past years. Several relevant issues are discussed and analyzed, including different mechanisms for all-optical switching, preparation of nonlinear photonic crystal samples by means of microfabrication and self-assembly techniques, characterization of optical switching performance by means of femtosecond pump-probe technique, and different ways to lower the pump power of optical switching to facilitate practical applications in optical information processing. Finally, a brief summary and a perspective of future work are provided.     

光子晶体的光学特性与近场光学测量表征

光子晶体具有独特而优异的光学特性及广泛的应用前景。介绍了光子晶体的概念、应用、发展,着重讨论了光子晶体的光子禁带、光子局域以及其它光学特性。从近场光学的原理和实验技术出发阐述了近场光学测量表征光子晶体的方法,对于光子晶体的研究具有重要的意义。     

纳米集成光路中的光源、光波导和光增强

使用近场光学显微术(scanning near-field optical microscopy, SNOM)研究了ZnO亚微米线端面出射性质，不同空间形貌Ⅱ-Ⅵ族半导体荧光器件光波导特性，二维光子晶体、准晶光子晶体对LED的出射增强作用以及表面等离激元(surface plasmon polariton, SPP)与半导体纳米荧光器件的相互作用，对纳米集成光路中的光源、光波导、光增强三个重要问题做了实验和理论上的分析.研究发现半导体微纳米线端面出射光束的质量与样品的直径有密切关系.通过合理地设计其直径和     

纳米集成光路中的光源、光波导和光增强

使用近场光学显微术(scanning near-field optical microscopy, SNOM)研究了ZnO亚微米线端面出射性质,不同空间形貌Ⅱ-Ⅵ族半导体荧光器件光波导特性,二维光子晶体、准晶光子晶体对LED的出射增强作用以及表面等离激元(surface plasmon polariton, SPP)与半导体纳米荧光器件的相互作用,对纳米集成光路中的光源、光波导、光增强三个重要问题做了实验和理论上的分析.研究发现半导体微纳米线端面出射光束的质量与样品的直径有密切关系.通过合理地设计其直径和 关键词： 纳米集成光路 扫描近场光学显微术 光波导 光增强     

A new tool for nanoscale X-ray absorption spectroscopy and element-specific SNOM microscopy

Investigations of complex nanostructured materials used in modern technologies require special experimental techniques able to provide information on the structure and electronic properties of materials with a spatial resolution down to the nanometer scale. We tried to address these needs through the combination of X-ray absorption spectroscopy (XAS) using synchrotron radiation microbeams with scanning near-field optical microscopy (SNOM) detection of the X-ray excited optical luminescence (XEOL) signal. The first results obtained with the prototype instrumentation installed at the European Synchrotron Radiation Facility (Grenoble, France) are presented. They illustrate the possibility to detect an element-specific contrast and to perform nanoscale XAS experiments at the Zn K and W L(3)-absorption edges in pure ZnO and mixed ZnWO(4)/ZnO thin films.     

Development of Scanning Near-Field Optical Microscope Working under Cryogenic Temperature and Strong Magnetic Field

We report on the development of a cantilever-based scanning near-field optical microscope (SNOM) working in an extreme environment, at cryogenic temperature around 10 K and under strong magnetic field up to 7 T. We designed a new optical system based on an infinite conjugate microscope, which extracts the near-field signal from a small aperture through a narrow chamber into free space as collimated light. Using this system, we successfully measured near-field and topographical images of a metal-hole sample simultaneously. Combining the local optical accessing technique with the external control of the electronic state, this SNOM system will be a powerful tool to study optical properties of semiconductor nanostructures.     

Inspection of nano-sized SNOM-tips by optical far-field evaluation

High resolution optical microscopy has many interesting applications in solid state physics, low temperature physics, biology and semiconductor technology. Unfortunately, the lateral resolution of conventional microscopes is limited by the Rayleigh-limit. “Scanning nearfield optical microscopy” (SNOM) seems to be a promising new approach to characterize the properties of materials optically with a high lateral resolution of 50–100 nm. The most important part of such a microscope is the scanning probe (a special glass fiber tip). However, the quality of the optical fiber tip is of decisive importance. Since the production process of pulled and coated glass fiber tips is still highly empirical and error-prone, a technique would be useful to determine the tips’ quality before they are shipped to the user or mounted in the microscope. The tips’ apertures are smaller than λ/2 and therefore they cannot be measured in a non-destructive way by conventional optical microscopy. This paper discusses an easy and fast method for the optical characterization of common glass fiber SNOM tips. The effective aperture of the tip is measured from the far-field distribution of the emitted intensity recorded by a CCD target. A numerical model is introduced to solve this inverse task and a simple optical setup is presented to detect light emitted by the tip at an angle of up to 90° from the optical axis. Experimental investigation, near/far-field calculations and scanning electron microscope investigations show the working principle of this measurement technique for the analysis and evaluation of a typical nanostructured object.