双凸厚透镜曲率半径及焦距的测定探讨

利用双凸厚透镜的折反折成像,测定已知折射率的厚透镜前后表面的曲率半径及焦距。此方法可以修正测量透镜焦距忽略透镜厚度所产生的误差。     

凹凸厚透镜曲率半径和折射率的测定

观察凹凸厚透镜的球面反射成像及折反折成像,利用这一实验现象结合物像公式测定凹凸厚透镜前后表面的曲率半径和折射率。该方法不仅可以修正薄透镜测量中忽略透镜厚度所产生的误差,而且可作为测量透镜焦距和曲率半径的设计性、研究性和创新性实验项目,有利于学生深刻理解共轴球面系统成像,掌握符号规则和几何光学的成像计算。     

双凸厚透镜曲率半径和折射率的测定

运用球面成像原理,应用物像同屏和物像异屏方法,采用透镜折反折和折折成像,测定双凸厚透镜的曲率半径和折射率,并利用焦距公式计算得双凸厚透镜的焦距.该实验测定方法,体现了透镜成像的过程,得到了双凸厚透镜曲率半径和折射率的计算公式,拓展了透镜光学参量测定的方法和途径.     

消畸变成像折反射全景成像系统设计

 单视点折反射全景成像系统畸变较大,通过计算反射镜面型可有效地实现折反射全景成像系统消畸变成像。在反射镜入射角与反射角呈线性关系的基础上,推导适用于消畸变折反射全景成像的反射镜面型公式。为说明反射镜面型的准确性,设计了F#为3.3,视场为138°的消畸变成像折反射全景成像系统,并利用实际像平面和虚拟像平面间的坐标映射关系,实现了系统的消畸变设计。各视场MTF在奈奎斯特频率下均达到0.6, 边缘视场相对畸变小于4 %。结果表明：该面型可实现消畸变折反射全景成像,反射角光线追迹法适用于折反射全景成像系统畸变评价,为折反射全景成像系统消畸变设计提供了必要的模型和计算方法。     

去散焦模糊的折反射全向成像系统设计

随着高分辨率传感器和大光圈的采用,光圈和反射面曲率造成的折反射全向成像散焦模糊问题越发突出。提出了一种有效去除散焦模糊的折反射全向成像系统设计。理论分析折反射成像散焦模糊的原因,建立全向图点扩展函数与实景空间物点及成像系统虚像位置的关系;在一次曝光成像时间内匀速旋转镜头对焦环,通过累积曝光使全向图散焦模糊核具有期望的空间不变性;利用反卷积算法对散焦模糊全向图进行复原,得到全局清晰的全向图像。该方法较好地解决了折反射全向成像散焦模糊问题,对提高折反射全向成像质量,促进其在相关领域的广泛应用具有重要意义。     

水平场景无畸变的折反射全景成像系统

基于透视成像模型，建立了一套较完整的水平场景无畸变的折反射全景成像系统设计方法，分析了该系统的近似透视成像性质；设计制作了特殊面形反射镜，建立了水平场景无畸变的折反射全景成像系统，给出了实验图像，并与双曲面折反射全景成像系统的实景图像和透视全景图像进行了比较。     

基于编码孔径的折反射全向压缩成像技术

为解决折反射全向成像分辨率低的问题,设计了一种基于编码孔径的折反射全向压缩成像原型系统。在分析点扩展函数和测量矩阵关系的基础上,提出了基于随机点扩展函数的编码孔径设计方式,并通过中继透镜和空间光调制器实现编码孔径的可编程控制。结合折反射成像特点,基于全向全变分算法实现全向图像稀疏重构,得到高分辨率的全向图像。研究搭建了光学成像硬件平台,通过仿真实验和实际装置实验两个方面验证了折反射全向压缩成像技术的有效性和可行性,有效地解决了折反射全向成像分辨率低的问题,对促进其在相关领域的广泛应用具有重要意义。     

折反射周视系统研究进展与展望

折反射周视系统作为近十几年发展起来的一种新型周视视觉实现形式,相比相机旋转扫描、多相机图像拼接和鱼眼镜头大视场成像等常规方法,在小型化、结构灵活性、成本和实时性方面具有优势。本文综述了折反射周视系统的成像模型、系统标定、畸变校正和全视场清晰成像等基本问题研究状况,讨论了折反射周视系统在红外成像和立体视觉领域的扩展应用研究现状,最后总结了目前存在的问题,并提出未来折反射周视成像系统将围绕非单视点成像模型、提高空间分辨力的方法和处理算法实时实现开展研究。     

折射混合望远物镜的设计、制作及实验

介绍了用以取代传统双胶合望远镜的混合单透镜的设计方法,结合设计实例详细介绍了折衍混合单透镜的制作过程及实验结果,并对实际成像效果进行了分析。首次给出了反映折衍混合系统成像性能的图片,它们对混合光学系统及其应用的研究具有重要的参考价值和指导意义     

基于仿视网膜成像器件的折反射全景系统设计

针对传统折反射全景成像系统的图像必须依赖展开技术的问题,提出一种基于仿视网膜成像器件的折反射全景系统设计。利用国内首款仿视网膜CMOS探测器各环上像元与周向、径向空间瞬时视场的对应关系,推导了双曲面反射镜的镜面参数,构建了基于BIT Retina52探测器的全景成像系统。系统实现了无需坐标变换的全景图像直接输出,较之传统折反射成像系统,改善了空间角分辨率变尺度分布问题。     

Optical properties of multilayer structures

This paper describes the magneto-optical effects of metallic multilayers under the condition of total internal reflection. In the framework of the Green's dyadic technique, we present numerical simulations which account for the variation of the magneto-optical signal with the angle of incidence. The Attenuated Total Reflection (ATR) has become a new technique of characterization for thin films. We show, in this paper, optical effects due to a slight variation of the indice of refraction for thin dielectric films in reflection by the reflectivity and the Kerr rotation spectra of an optimized system. In transmission, this variation is brought to the fore by the near-field intensity spectra. Received 29 March 2000     

X-ray Cerenkov radiation at grazing incidence of electrons

We have developed a theory of X-ray Cerenkov radiation for grazing incidence of relativistic electrons on a thin foil while taking into account absorption, reflection and refraction of radiation. The possibilities for the enhancement of radiation intensity are discussed on the basis of the theory developed.     

Anomalous propagation characteristics of evanescent waves

An analysis is done of the crossing of a forbidden region in a thin plate by a backward propagating Lamb wave: the refraction/reflection effects undergone by the coupled modes produced at each boundary of the forbidden region are taken into consideration, as well as the penetration of the backward wave as an evanescent wave. The outcome of the acoustic perturbation is analysed for a few angles of incidence and experiments are performed that confirm the theoretical predictions.     

高斯光束在单轴挛晶界面上的反射与折射

给出了高斯光束入射到挛晶结构的电磁场分布,解出了反射系数和透射系数。根据晶体的色散关系解出了入射角、反射角和折射角关于晶体参量及波矢的方程,并根据角度方程给出了在一定参量下反射角和折射角关于入射角变化的关系图,以图示的方法显示了光束在界面处的异常性质。根据角度关系和反射、透射系数分析了异常光束在界面处能够出现二性折射、负反射、全透射和全反射等光束的奇特性质;分析了出现这些奇特性质对晶体参量和入射角所要求的条件。根据时间平均的能流密度公式,用数值模拟的方法给出了二性折射、全透射和全反射在特定参量下的高斯光束在挛晶内的能流密度分布图及当发生全反射时不同宽度光束在界面处关于入射角的古斯-亨兴(Goos-Hanchen)位移。     

Vectorial approach of determining the wave propagation at metasurfaces

Vector approach often benefits optical engineers and physicists, and a vector formulation of the laws of reflection and refraction has been studied (Tkaczyk, 2012). However, the conventional reflection and refraction laws may be violated in the presence of a metasurface, and reflection and refraction at the metasurface obey generalized laws of reflection and refraction (Yu et al., 2011). In this letter, the vectorial laws of reflection and refraction at the metasurface were derived, and the matrix formulation of these vectorial laws are also obtained. These results enable highly efficient and unambiguous computations in ray-tracing problems that involve a metasurface.     

Experimental and simulation investigations of the peculiarities of relativistic electron beam scattering at a small angle of incidence on a thin flat target

The refraction angles θ _d of electron beams passing through aluminum and thin flat copper foils and reflection angles θ _r are measured. A microtron with 7.4 MeV particles is used as a source of electrons. The angle between the particle trajectory and the target surface α is varied in the range 5°–30°. The dependences of the refraction and reflection angles on the α angle and foil thickness δ are measured. A dosimetric film is used to make pictures of cross sections of the electron beam scattered by a thin 50 μm copper foil. Image processing allows the spatial distributions of refracted and reflected particles to be obtained. The processes of relativistic electron scattering at a small angle of incidence on a flat target are simulated by the Monte Carlo method. The results of simulation are compared with experimental data. Particle scattering at a bimetallic target consisting of 200-μm aluminum and 70-μm lead layers are simulated. A dependence of the spatial-energy distributions on the order of metal layers placed along electron trajectories is found.     

Reflection and refraction of waves in oscillatory media

This paper uses the two-dimensional Brusselator model to study reflection and refraction of chemical waves. It presents some boundary conditions of chemical waves, with which occurence of observed phenomena at interface as refraction and reflection of chemical waves can be interpreted. Moreover, the angle of reflection may be calculated by using the boundary conditions. It finds that reflection and refraction of chemical waves can occur simultaneously even if plane wave goes from a medium with higher speed to a medium with lower speed, provided the incident angle is larger than the critical angle.     

Exhaustive study of reflection and refraction at spherical surfaces on the basis of the newly discovered generalized vectorial laws of reflection and refraction

This paper deals with the application of the newly discovered generalized vectorial laws of reflection and refraction for making an extensive analysis of reflection and refraction at spherical surfaces. Various cases of image formation have been considered. It has been observed that, direct application of the generalized vectorial laws of reflection and refraction leads to the appropriate formula of ray optics for each of the cases considered. The analysis of the results are ultimately summed up to give birth to the generalized mirror formula as well as the generalized formula for refraction at spherical surfaces. Also by using the results obtained for refraction at spherical surfaces, the Lens makers’ formulae have been finally offered.     

用于相位突变界面的广义的反射定律和折射定律

考虑到位于两物质界面上的Metasurface对光线传播行为的影响, 从费马原理和边界条件连续两种角度出发, 推导了可用于相位突变界面的广义反射与折射定律. 该定律在界面对光波的相位改变量为零的情况下, 回归为通常的反射定律和折射定律. 利用广义的折射定律和反射定律讨论了介质折射率、界面上的相位梯度等因素对光传播行为的影响, 发现利用广义的折射定律和反射定律很容易实现反常反射和反常折射行为, 并给出了出现反常反射和反常折射的条件, 以此为基础可以实现对光波的随意控制. 依据广义的折射定律和反射定律分析了一维相位掩模板对光场传播行为的影响. 关键词： 超材料 相位突变界面 反射定律 折射定律     

Analysis of mesoporous thin films by X-ray reflectivity, optical reflectivity and grazing incidence small angle X-ray scattering

It is well-established that X-ray reflectivity (XR) is an invaluable tool to investigate the structure of thin films. Indeed, this technique provides under correct analysis, the electron density profile of thin films in the direction perpendicular to the substrate. For thin films that exhibit lateral ordering at the nanometer scale, grazing incidence small angle X-ray scattering (GISAXS) ideally complements the XR technique to measure the scattering in off-specular directions. As typical examples, XR and GISAXS data of mesoporous silica thin films and porous materials are presented. The analysis of the XR curve allows to determine the porosity of the film. We also show that the combination of X-ray and visible optical reflection provides information about the index of refraction of thin films. Finally we report how capillary condensation of water can be monitored by XR and GISAXS.