低温分子束外延生长的GaMnAs反射光谱的低能振荡现象

通过傅里叶变换红外光谱和光调制反射光谱技术测量了不同Mn含量的低温分子束外延生长在GaAs衬底上的GaMnAs样品的反射光谱.在低于Ga(Mn)As带边的红外反射光谱和光调制反射光谱上观测到低能振荡现象.通过分析振荡产生的原因并使用双层界面反射模型拟合了红外反射光谱的低能振荡过程,拟合结果与实验相符.研究表明,反射光谱的低能振荡是由于GaMnAs中空穴浓度的变化导致GaMnAs中的折射率发生变化,GaMnAs与衬底GaAs之间的折射率差导致了不同Mn含量的GaMnAs材料的反射谱的低能振荡现象.测量了不同 关键词： GaMnAs 反射光谱 空穴浓度 折射率     

杂质与缺陷对GaMnAs光学特性影响的研究

提高GaMnAs材料中Mn的含量可以提高其居里温度, 但随之而来也会引入很多缺陷。为了研究高含量Mn引入的缺陷对稀磁半导体材料的影响, 本文对低温分子束外延技术（LT-MBE）生长的GaMnAs外延层进行了光电导以及红外等光谱的分析。通过对样品的光谱分析, 发现样品中存在大量的As反位缺陷（AsGa）、Mn的间隙位缺陷（MnI）、以及在生长和退火过程中产生的Mn以及MnAs团簇等缺陷, 这些缺陷都会影响外延层的光谱特性, 同时也会影响器件的电学性能。     

SmFeO_3/La_(0.7)Sr_(0.3)MnO_3超晶格中应力效应与磁性质

本文采用脉冲激光沉积(PLD)方法,在NdGaO3(110)衬底上制备出了由钙钛矿锰氧化物材料La0.7Sr0.3MnO3和正铁氧体材料SmFeO3构成的高质量外延超晶格.在这一超晶格体系中,固定层数不变,当La0.7Sr0.3MnO3层厚度大于SmFeO3层的厚度时,超晶格的晶格逐渐发生弛豫,反之,则与衬底很好地共格.此外,伴随着这种应变状态的改变,超晶格的磁转变温度TC逐步增加,易磁化轴发生转变.我们认为这种应力状态以及磁性质的改变来源于强正交性的SmFeO3与菱形La0.7Sr0.3MnO3中氧八面体的界面耦合.     

(Ga,Mn)As光调制反射光谱

室温下我们研究了稀磁半导体(Ga,Mn)As的光调制反射(PR)光谱,观测到来自样品的Franz-Keldysh振荡(FKO)信号。随着Mn原子浓度的增加,PR线形展宽,但是临界点E₀和E₀+Δ₀没有明显的移动。根据FKO振荡数据,计算得到样品表面电场强度随Mn原子掺杂浓度的增加而增强。测量到与Mn原子掺杂相关的杂质带,其能量位置离GaAs价带边~100 meV。根据样品的表面电场强度和表面耗尽层模型,估算样品的空穴浓度为~10¹⁷cm^-3,较低的空穴浓度可能与样品具有较低的居里温度有关,或测量的PR信号来自于样品中外延层的部分耗尽区域。     

GaMnAs薄膜洛伦兹振子模型参数提取以及材料缺陷分析

利用改进的遗传算法从GaMnAs外延薄膜的远红外反射光谱中提取了GaMnAs薄膜的洛伦兹振子模型参数,发现GaAs掺入Mn后,ωTO向低频方向移动,ωLO基本保持不变,ε∞和εs均减小,γ有很大变化.并通过XRD以及近红外谱发现Mn的掺入会引入缺陷,这种缺陷会影响晶格质量,导致γ发生很大变化.     

退火对AlGaInP/GaInP多量子阱 LED外延片性能的影响

采用LP-MOCVD技术在n-GaAs衬底上生长了AlGaInP/GaInP多量子阱红光LED外延片.研究表明退火对外延片性能有重要影响.与未退火样品相比,460℃退火15min,外延片p型GaP层的空穴浓度由5.6×10¹⁸cm^-3增大到6.5×10¹⁸cm^-3,p型AlGaInP层的空穴浓度由6.0×10¹⁷cm^-3增大到1.1×10¹⁸cm^-3.但退火温度为780℃时,p型GaP层和p型AlGaInP层的空穴浓度分别下降至8×10¹⁷cm^-3和1.7×10¹⁷cm^-3,且Mg原子在AlGaInP系材料中的扩散加剧,导致未掺杂AlGaInP/GaInP多量子阱呈现p型电导.在460～700℃退火范围内,并没有使AlGaInP/GaInP多量子阱的发光性能发生明显变化.但退火温度为780℃时,AlGaInP/GaInP多量子阱的发光强度是退火前的2倍.     

AlN/NbN纳米结构多层膜的共格异结构外延生长研究

采用射频磁控溅射法制备了NbN,AlN单层膜及不同调制周期的AlN/NbN纳米结构多层膜,采用X射线衍射仪、小角度X射线反射仪和高分辨透射电子显微镜等对薄膜进行了表征.结果表明：单层膜AlN为六方结构,NbN为面心立方结构;AlN/NbN多层膜中AlN为六方结构,NbN为面心立方结构,界面处呈共格状态,其共格关系为c-NbN（111）面平行于h-AlN（0002）面,晶格错配度为013%.热力学计算表明:AlN/NbN多层膜中不论AlN层与NbN层的厚度如何,AlN层均不会形成亚稳的立方AlN,而是形成 关键词： AlN/NbN纳米结构多层膜 共格外延生长 异结构     

NdBa2Cu3-xMnxOy体系的结构和声子振动

利用X光衍射、红外光谱、电子顺磁共振等实验手段对多晶样品NdBa2Cu3-xMnxOy(0≤x≤0.3)的结构、声子振动和自旋关联情况进行了研究.结果表明:随着Mn掺杂浓度的增加,样品由四方结构转变为正交结构.红外谱的研究发现:所有样品在580cm-1附近都有一个峰,强度随着掺杂浓度的增加而增强,振动膜逐渐软化这和样品的微结构变化密切有关.ESR研究表明: NdBa2Cu3-xMnxOy体系在不掺杂或低掺杂浓度时只有很弱的自旋共振信号,进一步增加Mn含量,自旋信号增强,线宽降低,显示Mn掺杂浓度增加引起Mn离子的自旋局域化程度增强.本文讨论了掺杂对结构、红外谱和自旋关联的影响.     

热退火对Mn离子注入非故意掺杂GaN微结构、光学及磁学特性的影响

通过Mn离子注入非故意掺杂GaN外延层制备了GaN:Mn薄膜,并研究了退火温度对GaN:Mn薄膜的微结构、光学及磁学特性的影响.对不同退火温度处理后的GaN:Mn薄膜的拉曼谱测试显示,出现了由与离子注入相关的缺陷的局域振动(LV)和(Ga,Mn)N中Mn离子的LV引起的新的声子模.在GaN:Mn薄膜的光致发光谱中观察到位于2.16,2.53和2.92 eV处的三个新发光峰(带),其中位于2.16 eV处的新发光带不能排除来自Mn相关辐射复合的贡献.对GaN:Mn薄膜的霍尔测试显示,退火处理后样品表现出n型体材料特征.对GaN:Mn薄膜的振动样品磁强计测试显示,GaN:Mn薄膜具有室温铁磁性,其强弱受Mn相关杂质带中参与调节磁相互作用的空穴浓度的影响.     

晶体相场法模拟异质外延过程中界面形态演化与晶向倾侧

采用晶体相场模型研究了异质外延过程中失配应变与应力弛豫对外延层界面形态演化的影响, 并对由衬底倾角引起的外延层晶向倾侧进行了分析.研究结果表明: 在有一定倾角的衬底晶体上进行外延生长时,若衬底和外延层之间失配度较大 (ε>0.08),外延层中弹性畸变能会以失配位错的形式释放, 最终薄膜以稳定的流动台阶形式生长且外延层的晶向倾角与衬底倾角呈近似线性关系. 而当衬底和外延层之间失配度较小(ε<0.04)不足以形成失配位错时, 外延层中弹性畸变能会以表面能的形式释放,最终使薄膜以岛状形态生长. 在高过冷度条件下,衬底倾角和失配度较大时,衬底和外延层之间会形成由大量位错规则排列而成的小角度晶界从而显著改变外延层的生长位向.     

Ferromagnetic transition in GaAs/Mn/GaAs/In x Ga1 − x As/GaAs structures with a two-dimensional hole gas

The transport properties of GaAs/Mn/GaAs/In _x Ga_{1 ? x} As/GaAs structures with a layer that is separated from the quantum well and contains Mn impurities in the concentration range 4–10 at % corresponding to the reentrant metal-insulator transition observed in the bulk GaMnAs material [17] have been investigated. The hole mobility in the objects under investigation is more than two orders of magnitude higher than the known values for the GaMnAs semiconductor and GaMnAs-based magnetic heterostructures. This makes it possible to observe Shubnikov-de Haas oscillations, which confirm a two-dimensional character of the hole energy spectrum. The calculated Curie temperature for heterostructures with indirect exchange interaction through a two-dimensional hole channel is in good agreement with the position of the maximum (at 25–40 K) in the temperature dependences of the electrical resistance of the channel. This suggests that two-dimensional holes play an important role in ferromagnetic ordering of the Mn layer under these conditions. The observations of a negative spin-dependent magnetoresistance and an anomalous Hall effect, whose magnitude correlates well with the results of theoretical calculations for two-dimensional ferromagnetic systems based on III-Mn-V, also indicate a significant role of the two-dimensional channel in ferromagnetic ordering.     

Effect of thermal annealing on the magnetic anisotropy of GaMnAs ferromagnetic semiconductor

We have systematically investigated the influence of annealing on the magnetic anisotropy properties of GaMnAs film using an epilayer with a Mn concentration of 6.2%. The GaMnAs epilayer was grown by molecular beam epitaxy and the planar Hall effect measurement was used to monitor the magnetic anisotropy of the film. We found significant annealing-induced changes in the magnetic anisotropy properties of the GaMnAs film that depended on the annealing conditions. For example, the cubic anisotropy that gave a four-fold symmetry of magnetic easy axes decreased while the uniaxial anisotropy that gave a two-fold symmetry of magnetic easy axes increases in the samples annealed temperature below 300 °C. In particular, the uniaxial anisotropy along the [010] direction in as-grown GaMnAs film changed to the [100] direction by rotating by 90° after the sample was annealed at 300 °C for 3 h. This investigation thus indicates that the magnitude and the direction of the magnetic anisotropy in the GaMnAs film can be effectively controlled by choosing an appropriate annealing time and temperature.     

GaMnAs合金中等离子体激元-LO声子耦合模的拉曼光谱研究

理论分析了两种阻尼条件下重掺杂GaAs中的等离子体激元-LO声子耦合模,证实在小阻尼条件下耦合模的拉曼谱分为两支,而在大阻尼条件下只有一个耦合模可以被观测到。推导得到了只出现一个耦合模所需的最小阻尼的解析表达式。测量了Mn组分从2.6%到9%的GaMnAs合金的拉曼光谱。利用等离子体激元-LO声子耦合模理论进行了谱形拟合,得到了所测的GaMnAs合金中的空穴浓度。     

The source of room temperature ferromagnetism in granular GaMnAs layers with zinc blende clusters

Granular GaAs:(Mn,Ga)As films were prepared by annealing the Ga_0.985Mn_0.015As/GaAs layers at 500 °C or 600 °C. It is commonly accepted that this processing should result in the formation of cubic or hexagonal MnAs clusters, respectively. We demonstrate that such a priori assumption is not justified. If in the as grown sample there are not many defects with the interstitial Mn atoms, only small cubic clusters can be formed even after annealing at 600 °C. Moreover, in a sample containing solely cubic GaMnAs clusters, the Mn ions are ferromagnetically coupled at room temperature. This fact was explained by the existence of GaMnAs solid solution in the clusters, with content of Mn close to 20% (higher than ever found in the layers) as was confirmed by experiment and theory. Extended X‐ray absorption spectroscopy studies excluded the possibility of formation of the hypothetic zinc blende MnAs clusters. Not more than one Mn atom was detected in the second shell around central Mn atom. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

基于XPS与XAS的稀磁半导体GaMnN电子结构研究

采用基于同步辐射技术的X射线光电子能谱(XPS)与X射线吸收谱(XAS)测试由金属有机化学气相沉积(MOCVD)技术制备的不同Mn掺杂浓度的稀磁半导体GaMnN薄膜的电子结构,探究Mn掺杂浓度对磁性原子Mn周围的局域环境和电子态等方面的影响,并阐述材料铁磁性变化的机理. XPS和XAS图谱分析表明：Mn²⁺和Mn³⁺共存于薄膜样品内,样品D中Mn²⁺占比高达70%-80%,N空位随Mn掺杂浓度增加而增多且N空位能够使空穴浓度降低,导致Mn 3d和N 2p轨道间的相互交换作用减小,从而减弱体系铁磁性.此外,Mn不同的掺杂浓度会影响GaMnN薄膜p-d耦合杂化能力的强弱,当掺Mn 1.8%时具有较强的p-d耦合杂化能力.     

Spatial structure of an individual Mn acceptor in GaAs

The wave function of a hole bound to an individual Mn acceptor in GaAs is spatially mapped by scanning tunneling microscopy at room temperature and an anisotropic, crosslike shape is observed. The spatial structure is compared with that from an envelope-function, effective mass model and from a tight-binding model. This demonstrates that anisotropy arising from the cubic symmetry of the GaAs crystal produces the crosslike shape for the hole wave function. Thus the coupling between Mn dopants in GaMnAs mediated by such holes will be highly anisotropic.     

Magnetic coupling in ferromagnetic semiconductor GaMnAs/AlGaMnAs bilayer devices

We carefully investigated the ferromagnetic coupling in the as-grown and annealed ferromagnetic semiconductor GaMnAs/AlGaMnAs bilayer devices. We observed that the magnetic interaction between the two layers strongly affects the magnetoresistance of the GaMnAs layer with applying the out of plane magnetic field. After low temperature annealing, the magnetic easy axis of the AlGaMnAs layer switches from out of plane into in-plane and the interlayer coupling efficiency is reduced from up to 0.6 to less than 0.4. However, the magnetic coupling penetration depth for the annealed device is twice that of the as-grown bilayer device.