Effect of Pb on the electrical properties of a-Ge20Se80 glasses

The present paper reports the effect of Pb impurity (low ∼2 at% and high ∼10 at%) on the ac conductivity (σ_ac) of a-Ge₂₀Se₈₀ glass. Frequency-dependent ac conductance and capacitance of the samples over a frequency range ∼100 Hz to 50 kHz have been taken in the temperature range ∼268 to 358 K. At frequency 2 kHz and temperature 298 K, the value of σ_ac increases at low as well as at higher concentration of Pb. σ_ac is proportional to ω^s for undoped and doped samples. The value of frequency exponent (s) decreases as the temperature increases. The static permittivity (ε_s) increases at both Pb concentrations. These results have been explained on the basis of some structural changes at low and higher concentration of Pb impurity.     

Dielectric properties and conductivity in CuO and MoO3 doped borophosphate glasses

A novel set of glasses of the type (B₂O₃)_0.10-(P₂O₅)_0.40-(CuO)_0.50−x-(MoO₃)_x, 0.05≤x≥0.50, have been investigated for dielectric properties in the frequency range 100 Hz-100 kHz and temperature range 300-575 K. From the total conductivity derived from the dielectric spectrum the frequency exponent, s, and dc and ac components of the conductivity were determined. The temperature dependence of dc and ac conductivities at different frequencies was analyzed using Mott's small polaron hopping model, and the high temperature activation energies have been estimated and discussed. The observed initial decrease in conductivity (ac and dc) and increase in activation energy with the addition of MoO₃ have been understood to be due to the hindrance offered by the Mo⁺ ions to the electronic motions. The observed peak-like behavior in conductivity (dip-like behavior in activation energy) in the composition range 0.20-0.50 mol fractions of MoO₃ may be due to mixed transition effect occurring in the present glasses. The temperature dependence of frequency exponent, s, has been analyzed using different theoretical models. It is for the first time that the mixed transition metal ion (TMI) doped borophosphate glasses have been investigated for dielectric properties and conductivity over wide temperature and frequency ranges and the data have been subjected to a thorough analysis.     

Dielectric properties for the ordered-perovskite cuprate Sr2Cu(Re0.69Ca0.31)O6

Dielectric properties are reported on polycrystalline cubic ordered-perovskite cuprate Sr₂Cu(Re_0.69Ca_0.31)O₆ in the frequency range 10 Hz-100 kHz at temperature from 300 to 500 K. Both the dielectric permittivity and dielectric loss factor are found to be frequency and temperature dependent. The enhanced value of the low frequency dielectric permittivity is associated to ionic polarization and interfacial phenomena. The material is found to possess significantly high dielectric permittivity. The calculated ac conductivity suggests semiconducting behaviour for the Sr₂Cu(Re_0.69Ca_0.31)O₆.     

Rotational spectra of gauche perfluoro-n-butane, C4F10; perfluoro-iso-butane, (CF3)3CF; and tris(trifluoromethyl)methane, (CF3)3CH

The microwave spectra of the gauche conformer of perfluoro-n-butane, n-C₄F₁₀, of perfluoro-iso-butane, (CF₃)₃CF, and of tris(trifluoromethyl)methane, (CF₃)₃CH, have been observed and assigned. The rotational and centrifugal distortion constants for gauche n-C₄F₁₀ are: A = 1058.11750(7) MHz, B = 617.6832(1) MHz, C = 552.18794(1) MHz, Δ_J = 0.0257(5) kHz, δ_J = 0.0052(3) kHz. A C-C-C-C dihedral angle, ω, of ∼55° has been determined. These values agree well with those obtained from a coupled cluster (CCSD/cc-PVTZ) calculation. The rotational and centrifugal distortion constants for iso-C₄F₁₀ and iso-C₄HF₉ are: B_o = 816.4519(4) MHz, D_J = 0.023(2) kHz, and B_o = 903.6985(25) MHz, D_J = 0.043(4) kHz, respectively. The dipole moment of iso-C₄F₁₀ and iso-C₄HF₉ have been measured and found to be 0.0338(8) and 1.69(9) D, respectively.     

Structural and dielectric properties of Bi modified PLZT ceramics

Polycrystalline samples of bismuth (Bi) doped lead lanthanum zirconate titanate (PLZT) with the general formula Pb_0.9(La_1−zBi_z)_0.1(Zr_0.65Ti_0.35)_0.975O₃, where [z=0.0, 0.3, 0.5, 0.7] near the morphotropic phase boundary (MPB) has been synthesized by a solid solution mixing technique. Some aspect of crystal structure of the compound at room temperature was studied using X-ray diffraction (XRD) technique. Detailed studies of dielectric constant (ε) and dielectric loss () obtained both as a function of frequency (100 Hz-100 kHz) at room temperature (RT) and temperature (RT-600 K) at 10 kHz suggest that compounds undergo ferroelectric-paraelectric phase transition of diffuse type. Both ac and dc conductivity have been studied over a wide range of temperature. The activation energy (E_a) of the samples was calculated from the plot of ac conductivity vs. inverse of absolute temperature. The temperature variation of resistivity shows that the compounds have negative temperature coefficient of resistance (NTCR).     

Conduction mechanism and the dielectric relaxation process of a-Se75Te25−xGax (x=0, 5, 10 and 15 at wt%) chalcogenide glasses

Se₇₅Te_25−xGa_x (x=0, 5, 10 and 15 at wt%) chalcogenide compositions were prepared by the well known melt quenching technique. Thin films with different thicknesses in the range (185–630 nm) of the obtained compositions were deposited by thermal evaporation technique. X-ray diffraction patterns indicate that the amorphous nature of the obtained films. The ac conductivity and the dielectric properties of the studied films have been investigated in the frequency range (10²–10⁵ Hz) and in the temperature range (293–333 K). The ac conductivity was found to obey the power low ω^s where s≤1 independent of film thickness. The temperature dependence of both ac conductivity and the exponent s can be well interpreted by the correlated barrier hopping (CBH) model. The experimental results of the dielectric constant ε₁ and dielectric loss ε₂ are frequency and temperature dependent. The maximum barrier height W_m calculated from the results of the dielectric loss according to the Guintini equation, and agrees with that proposed by the theory of hopping of charge carriers over a potential barrier as suggested by Elliott for chalcogenide glasses. The density of localized state was estimated for the studied film compositions. The variation of the studied properties with Ga content was also investigated. The correlation between the ac conduction and the dielectric properties were verified.     

Crystal structure,ionic conductivity and dielectric relaxation studies in the (C5H10N)2BiBr5 compound

The synthesis and crystal structure of the bis (3-dimethylammonium-1-propyne) pentabromobismuthate(III) salt are given in the present paper. After an X-ray investigation, it has been shown that the title compound crystallizes at 298 K in a centrosymmetric monoclinic system, in the space group C₂/c with the following lattice parameters a=12.9034(3) Å, b=19.4505(6) Å, c=8.5188(2) Å, β=102.449(2). Not only were the impedance spectroscopy measurements of (C₅H₁₀N)₂BiBr₅ carried out from 209 Hz to 5 MHz over the temperature range of 318 K–373 K, but also its ac conductivity evaluated. Besides, the dielectric relaxation was examined using the modulus formalism. Actually, the near values of activation energies obtained from the impedance and modulus spectra confirms that the transport is of an ion hopping mechanism, dominated by the motion of the H⁺ ions in the structure of the investigated material.     

Thermal, electrical, and electrochemical properties of Lanthanum-doped Ba0.5Sr0.5 Co0.8Fe0.2O3-δ

Crystal structure, thermogravimetry (TG), thermal expansion coefficient (TEC), electrical conductivity and AC impedance of (Ba_0.5Sr_0.5)_1-xLa_xCo_0.8Fe_0.2O_3-δ (BSLCF; 0.05?x?0.20) were studied in relation to their potential use as intermediate temperature solid oxide fuel cell (IT-SOFC) cathode. A single cubic pervoskite was observed by X-ray diffraction (XRD). The TEC of BSLCF was increasing slightly with the increasing content of La, and all the compounds showed abnormal expansion at high temperature. Proved by the TG result, it was associated with the loss of lattice oxygen. The electrical conductivity, which is the main defect of Ba_0.5Sr_0.5 Co_0.8Fe_0.2O_3-δ (BSCF), was improved by La doping, e.g., the compound of x=0.20 demonstrated a conductivity of σ=376 S cm⁻¹ at 392 °C. The increase of electrical conductivity resulted from the increased concentration of charge carrier induced by La doping. In addition, the AC impedance revealed the better electrochemical performance of BSLCF. For example, at 500 °C, the sample with composition x=0.15 yielded the resistance values of 2.12 Ω cm², which was only 46% of BSCF.     

Dielectric properties and magnetoelectric effect of (x)NiFe2O4+(1−x)Ba0.8Sr0.2TiO3 composites

Magnetoelectric composites of NiFe₂O₄ and Ba_0.8Sr_0.2TiO₃ were prepared using conventional double-sintering ceramic method. The phase formation of magnetoelectric composites was confirmed by XRD technique. Variation of dielectric constant and loss tangent at room temperature with frequency in the range 100 Hz-1 MHz has been studied. Also the variation of dielectric constant and loss tangent with temperature and composition at fixed frequencies of 1 kHz, 10 kHz, 100 kHz and 1 MHz is reported. The static value of the magnetoelectric conversion factor was measured as a function of intensity of the magnetic field. The ME voltage coefficient of about 430 μV/cm Oe was observed for 15% NiFe₂O₄+85% Ba_0.8Sr_0.2TiO₃ composite. All the samples show linear variation of magnetoelectric conversion in the presence of static magnetic field.     

Effects of low frequency near metal-insulator transition temperatures on polycrystalline La0.65Ca0.35Mn1−yFeyO3 (where y=0.05-0.10) ceramic oxides

The ac electrical properties of 5-10% Fe doped polycrystalline sample have been investigated by complex impedance analysis over the frequency and temperature ranges of 1-100 kHz and 77-300 K, respectively. The average normalized change (ΔZ′/Δf)/Z₀ has been deduced for these Fe doped CMR samples which shows an increasing trend with iron doping. The most pronounced effect of frequencies is at T_c, with the increase of Fe doping it is observed that not only T_c is lowered substantially but also the height of the peaks of real part of impedance (Z′) is increased which in turn decreases considerably with the increase of the ac field. An equivalent circuit model, R_g(R_gbC_gb), i.e. a resistor-capacitor network, has been proposed to explain the impedance results at different temperatures. The plot between τ and 1/T gives a straight line from where relaxation time (τ₀) has been deduced. The correlated barrier hopping (CBH) model has been employed and the binding energy of the defect states is estimated to be between 0.39 and 0.25 eV while the minimum hoping distance varies within the range of 2.93-5.21 Å for these 5-10% Fe doped LCM samples.     

Structural,optical and dielectric properties of Ni substituted NdFeO3

Present study reports the structural, optical and dielectric properties of Ni substituted NdFe_1−xNi_xO₃ (0 ≤ x ≤ 0.5) compounds prepared through the ceramic method. X-ray diffraction (XRD) confirmed an orthorhombic crystal structure of all the samples. Both unit cell volume and grain size were found to decrease with an increase in Ni concentration. Morphological study by Scanning electron microscope (SEM) shows less porosity with Ni substitution in present system. From UV–vis spectroscopy, the optical band gap was found to increase with Ni doping. This observed behavior was explained on the basis of reduction in crystallite size, unit cell volume and its impact on the crystal field potential of the system after Ni substitution. The dielectric properties (?′ and tanδ) as a function of frequency or temperature, and the ac electrical conductivity (σ_ac) as a function of frequency have been studied. Hopping of charge carriers between Fe²⁺ → Fe³⁺ ions and Ni²⁺ → Ni³⁺ ions are held responsible for both electrical and dielectric dispersion in the system. Wide optical band gap and a very high dielectric constant of these materials promote them to be a suitable candidate for memory based devices in electronic industry.     

Structural, ferroelectric and impedance spectroscopy properties of Y modified Pb(Fe0.5Nb0.5)O3 ceramics

Some ceramic samples of Pb_1−xY_x(Fe_0.5Nb_0.5)_1−x/4O₃ (PYFN) (0.00≤x≤0.08) were synthesized by a mixed oxide route. X-ray diffraction patterns of all the above samples confirm the formation of single phase material crystallizing in monoclinic structure. Dielectric properties (ε_r and tan δ) were analyzed in a wide temperature (30-350 °C) and frequency range (100 Hz-1 MHz). Ferroelectric properties of these compounds were confirmed from polarization (P-E hysteresis loop) measurements at room temperature. All the room temperature hysteresis loops of PYFN ceramics were well simulated using the ferroelectric capacitor model. Yttrium substitution resulted in notable enlargement of room temperature remnant polarization (2P_r). The 2P_r of PYFN (x=0.02) reaches to a large value (23 μC/cm²), which is nearly 5 times greater than that of PFN ceramic (4.6 μC/cm²). All the compounds exhibits negative temperature coefficient of resistivity (NTCR) type behavior as that of semiconductors. Dc conductivity (estimated via bulk resistivity) variation with temperature of all the samples follows Arrhenius type of electrical conductivity.     

Structural and electrical properties of (Na0.85K0.15)0.5Bi0.5TiO3 thin films deposited on LaNiO3 and Pt bottom electrodes

(Na_0.85K_0.15)_0.5Bi_0.5TiO₃ thin films were deposited on LaNiO₃(LNO)/SiO₂/Si(1 0 0) and Pt/Ti/SiO₂/Si(1 0 0) substrates by metal-organic decomposition, and the effects of bottom electrodes LNO and Pt on the ferroelectric, dielectric and piezoelectric properties were investigated by ferroelectric tester, impedance analyzer and scanning probe microscopy, respectively. For the thin films deposited on LNO and Pt electrodes, the remnant polarization 2P_r are about 22.6 and 8.8 μC/cm² under 375 kV/cm, the dielectric constants 238 and 579 at 10 kHz, the dielectric losses 0.06 and 0.30 at 10 kHz, the statistic d_33eff values 95 and 81 pm/V. The improved piezoelectric properties could make (Na_1−xK_x)_0.5Bi_0.5TiO₃ thin film as a promising candidate for piezoelectric thin film devices.     

Effects of substrates on the structure and dielectric properties of Ba(Sn0.15Ti0.85)O3 thin films

Ba(Sn_0.15Ti_0.85)O₃ (BTS) thin films were grown on Pt(1 1 1)/Ti/SiO₂/Si and LaNiO₃(LNO)/Pt(1 1 1)/Ti/SiO₂/Si substrates by a sol-gel processing technique, respectively. The BTS thin films deposited on annealed Pt(1 1 1)/Ti/SiO₂/Si and annealed LNO/Pt(1 1 1)/Ti/SiO₂/Si substrates exhibited strong (1 1 1) and perfect (1 0 0) orientations, respectively. The BTS thin films grown on un-annealed Pt(1 1 1)/Ti/SiO₂/Si substrates showed random orientation with intense (1 1 0) peak, while the films deposited on un-annealed LNO/Pt(1 1 1)/Ti/SiO₂/Si substrate exhibited random orientation with intense (1 0 0) peak, respectively. The dielectric constant of the BTS films deposited on annealed Pt(1 1 1)/Ti/SiO₂/Si, annealed LNO/Pt(1 1 1)/Ti/SiO₂/Si, un-annealed Pt(1 1 1)/Ti/SiO₂/Si and un-annealed LNO/Pt(1 1 1)/Ti/SiO₂/Si substrates was 512, 565, 386 and 437, respectively, measured at a frequency of 100 kHz. A high tunability of 49.7% was obtained for the films deposited on annealed LNO/Pt(1 1 1)/Ti/SiO₂/Si substrate, measured at the frequency of 100 kHz with an applied electric field of 200 kV/cm. The high tunability has been attributed to the (1 0 0) texture of the films and larger grain sizes.     

Dc and ac electrical conductivity of bulk CdSexTe1−x (0x0.4)

Measurements of the dc and ac conductivity were made for polycrystalline CdSe_xTe_1−x (0x0.4) at various frequencies (0.1–100 kHz) and at various temperatures (293–413 K). The temperature dependence of the dc conductivity was measured in the temperature range (293–413 K). It was found that the obtained dc activation energy for the investigated compositions decrease with the increase of Se content. The ac conductivity is found to be frequency and temperature dependent and obeys the Aω^s law, where s decreases with the increase of temperature. The ac conductivity of these compositions are explained on the basis of the correlated barrier hopping model.     

High-precision frequency measurements of the ν1 + ν3 combination band of C2H2 in the 1.5 μm region

A pair of 1.5 μm semiconductor laser frequency standards have been developed for optical telecommunications use, stabilised to transitions of ¹²C₂H₂ and ¹³C₂H₂, using cavity-enhanced Doppler-free saturation absorption spectroscopy. The absolute frequencies of 41 lines of the ν₁ + ν₃ band of ¹²C₂H₂, covering the spectral region 1520-1545 nm, have been measured by use of a passive optical frequency comb generator, referenced to ¹³C₂H₂ transitions of known frequency. The mean experimental uncertainties (coverage factor k = 1) of the frequency values are 3.0 kHz (type A) and 10 kHz (type B). Improved values of the band origin ν₀, rotational constants B′ and B″, and centrifugal distortion coefficients D′, D″, H′, and H″ are presented.     

Structure, thermal and transport properties of PVAc-LiClO4 solid polymer electrolytes

The lithium ion conducting solid polymer electrolytes (SPE) based on PVAc-LiClO₄ of various compositions were prepared by solution casting technique. Structure and surface morphology characterization were studied by X-ray diffraction (XRD) analysis and scanning electron microscopy (SEM) measurements, respectively. Thermal and conductivity behavior of polymer-salt complexes were studied by employing differential scanning calorimetry (DSC) and ac impedance measurements, respectively. XRD and SEM analyses indicate the amorphous nature of the polymer-salt complexes. DSC measurements show decrease in T_g with the increase in LiClO₄ concentrations. The bulk conductivity of the PVAc:LiClO₄ polymer electrolytes was found to vary between 7.6×10⁻⁷ and 6.2×10⁻⁵ S cm⁻¹ at 303 K with the increase in salt concentration. The temperature dependence of the polymer electrolyte complexes appear to obey Arrhenius law.     

Electron hopping mechanism in hematite (α-Fe2O3)

The frequency dependence of the real (?′) and imaginary (?″) parts of the dielectric constant of polycrystalline hematite (α-Fe₂O₃) has been investigated in the frequency range 0-100 kHz and the temperature range 190-350 K, in order to reveal experimentally the electron hopping mechanism that takes place during the Morin transition of spin-flip process. The dielectric behaviour is described well by the Debye-type relaxation (α-dispersion) in the temperature regions T<233 K and T>338 K. In the intermediate temperature range 233 K<T<338 K a charge carrier mechanism takes place (electron jump from the O²⁻ ion into one of the magnetic ions Fe³⁺) which gives rise to the low frequency conductivity and to the Ω-dispersion. The temperature dependence of relaxation time (τ) in the −ln τ vs 10³/T plot shows two linear regions. In the first, T<238 K, τ increases with increasing T implying a negative activation energy −0.01 eV, and in the second region T>318 K τ decreases as the temperature increases implying a positive activation energy 0.12 eV. The total reorganization energy (0.12-0.01) 0.11 eV is in agreement with the adiabatic activation energy 0.11 eV given by an ab initio model in the literature. The temperature dependence of the phase shift in the frequencies 1, 5, 10 kHz applied shows clearly an average Morin temperature T_Mo=284±1 K that is higher than the value of 263 K corresponding to a single crystal due to the size and shape of material grains.     

Auto-combustion synthesis and properties of Ce0.85Gd0.15O1.925 for intermediate temperature solid oxide fuel cells electrolyte

A typical composition of the system Ce_1 − xGd_xO_2 − δ with x = 0.15 (CGO15) has been synthesized by auto-combustion method. DTA/TGA of the precursor compound indicated the completion of reaction at about 270 °C. Greater than 95% of the theoretical density has been achieved by sintering at 1300 °C for 10 h. Single phase formation in as-burnt stage has been confirmed by its powder X-ray diffraction (XRD) pattern. The structural morphology was studied employing bright field transmission electron micrograph (BFTEM) and high resolution transmission electron micrograph (HRTEM). BFTEM image indicates that particles are highly agglomerated and appear to be dispersed in amorphous matrix. Also BFTEM image reveals that the average particle size is 26 ± 5 nm. The presence of amorphous phase in as-prepared ash was also confirmed by HRTEM and selected area diffraction (SAD). The scanning electron micrograph (SEM) of the thermally etched system shows grains having an average size of 400 nm. Impedance measurements have been made in the frequency range 1 Hz to 1.3 MHz between 200 and 500 °C and the total conductivity was measured. An enhanced conductivity value is observed which may make this system suitable for application as a solid electrolyte material for intermediate temperature solid oxide fuel cells (IT-SOFCs).     

Diffuse phase transition in Ba5NdTi3−xZrxNb7O30 ferroelectric ceramics

Polycrystalline samples of Ba₅NdTi_3−xZr_xNb₇O₃₀ (x=0, 1, 2, 3) compounds of the tungsten-bronze (TB) structural family were prepared by a high-temperature solid-state reaction technique. X-ray study of the compounds shows the formation of single phase compounds in the orthorhombic crystal system at room temperature. Detailed studies of the dielectric properties (dielectric constant and loss tangent) as a function of temperature (−50 to 350°C) at four different frequencies, 1, 10, 100 and 1000 kHz show relaxor behavior and diffuse phase transition of the compounds. Study of temperature dependence of resistivity shows that these compounds have negative temperature coefficients of resistance (NTCR).