Magnetic properties of field-annealed FeCo thin films

Fe₅₀Co₅₀ thin films with thickness of 30 and 4 nm have been produced by rf sputtering on glass substrates, and their surface has been observed with atomic force microscopy (AFM) and magnetic force microscopy (MFM); MFM images reveal a non-null component of the magnetization perpendicular to the film plane. Selected samples have been annealed in vacuum at temperatures of 300 and 350 °C for times between 20 and 120 min, under a static magnetic field of 100 Oe. DC hysteresis loops have been measured with an alternating gradient force magnetometer (AGFM) along the direction of the field applied during annealing and orthogonally to it. Samples with a thickness of 4 nm display lower coercive fields with respect to the 30 nm thick ones. Longer annealing times affect the development of a harder magnetic phase more oriented off the film plane. The field applied during annealing induces a moderate magnetic anisotropy only on 30 nm thick films.     

Demonstration of ultra-high-resolution MFM images using Co90Fe10-coated CNT probes

We demonstrate ultra-high-resolution magnetic force microscopy images of perpendicular magnetic storage media using carbon nanotube probes coated by ferromagnetic Co₉₀Fe₁₀ films (20, 30, 40, and 50 nm). By optimizing ferromagnetic film thickness (effective tip diameter), we obtained best magnetic domain image with an 40 nm-Co₉₀Fe₁₀-coated tip (50 nm tip diameter) about a lateral detect density of 1200 k flux per inch on perpendicular magnetic storage medium, one of the highest resolutions in MFM imaging reported for this material system and structure. The observed dependence of tip dimension on signal contrast and image resolution was successfully explained by a theoretical analysis indicating that the signal contrast, along with the physical probe-tip dimension, should be taken into account to design magnetic probes tips for high-resolution magnetic force microscopy.     

Quantification of the lift height for magnetic force microscopy using 3D surface parameters

In this work, the quantitative conditions for the lift height for imaging of the magnetic field using magnetic force microscopy (MFM) were optimized. A thin cobalt film deposited on a monocrystalline silicon (1 0 0) substrate with a thickness of 55 nm and a thin nickel film deposited on a glass with a thickness of 600 nm were used as samples. The topography of the surface was acquired by tapping mode atomic force microscopy (AFM), while MFM imaging was performed in the lift mode for various lift heights. It was determined that the sensitivity of the measurements was about 10% higher for images obtained at a scan angle of 90° compared to a scan angle of 0°. Therefore, the three-dimensional surface texture parameters, i.e., average roughness, skewness, kurtosis and the bearing ratio, were determined in dependence on the lift height for a scan angle of 90°. The results of the analyses of the surface parameters showed that the influence of the substrate and its texture on the magnetic force image could be neglected for lift heights above 40 nm and that the upper lift height limit is 100 nm. It was determined that the optimal values of the lift heights were in the range from 60 to 80 nm, depending on the nature of the sample and on the type of the tip used.     

Structural and magnetic properties of evaporated Fe thin films on Si(1 1 1), Si(1 0 0) and glass substrates

We present experimental results on the structural and magnetic properties of series of Fe thin films evaporated onto Si(1 1 1), Si(1 0 0) and glass substrates. The Fe thickness, t, ranges from 6 to110 nm. X-ray diffraction (XRD) and atomic force microscopy (AFM) have been used to study the structure and surface morphology of these films. The magnetic properties were investigated by means of the Brillouin light scattering (BLS) and magnetic force microscopy (MFM) techniques. The Fe films grow with (1 1 0) texture; as t increases, this (1 1 0) texture becomes weaker for Fe/Si, while for Fe/glass, the texture changes from (1 1 0) to (2 1 1). Grains are larger in Fe/Si than in Fe/glass. The effective magnetization, 4πM_eff, inferred from BLS was found to be lower than the 4πM_S bulk value. Stress induced anisotropy might be in part responsible for this difference. MFM images reveal stripe domain structure for the 110 nm thick Fe/Si(1 0 0) only.     

Magnetic anisotropy study of triangular-shaped Co nanostructures

Atomic force microscopy (AFM), X-ray magnetic circular dichroism (XMCD), magnetic force microscopy (MFM) and vibrating sample magnetometry (VSM) have been used to measure the magnetic and geometrical characteristics of triangular-shaped Co structures of lateral size 730 nm and thickness 32 nm, prepared by nanosphere lithography (NSL). Evidence of in-plane six-fold magnetic anisotropy induced by the symmetry of the structure has been found. By means of XMCD measurements, performed at remanence after applying a pulsed field, a structure rotation angle-dependent oscillation of about 15% with a periodicity of 60° has been observed for both the orbital and spin moments. Furthermore, the system exhibits the angular hysteresis effect. The magnetic measurements performed by MFM show a reduction of the magnetic configurations to only two states, one quasi-single domain Y state and second, a combination of vortex and Y state.     

MFM and AFM study of thin cobalt films modified by fluorosilane

Polycrystalline cobalt films 100 nm thick were thermally evaporated on oxidized Si(100) substrates. Then 1H, 1H, 2H, 2H perfluorodecyltrichlorosilane (FDTS) films of various thicknesses, in the range of about 2 nm to 30 nm, were grown on cobalt surfaces by vapor phase deposition (VPD). The cobalt films modified by FDTS were investigated using magnetic force microscopy (MFM) and atomic force microscopy (AFM). MFM observation showed that the magnetic structure of the cobalt films modified by FDTS is composed of domains with a considerable component of magnetization perpendicular to the film surface. This in turn indicates that the cobalt films on oxidized Si(100) substrates crystallize in the hexagonal close-packed (HCP) phase and exhibit a texture with the hexagonal axis perpendicular to the film surface. The magnetic domains formed a maze structure. The domain width increased from typically 80–120 nm to 400–500 nm with increasing the thickness of FDTS films from about 2 nm to 30 nm. AFM imaging of the surfaces of FDTS films revealed the presence of an agglomerate morphology. The agglomerates varied in size from typically 30–70 nm to 150–300 nm as the film thickness was increased from about 2 nm to 30 nm.     

Enhanced pinning of superconducting vortices at circular magnetic dots in the magnetic-vortex state

Low-temperature magnetic force microscopy (LT-MFM) was used to study the distribution of superconducting vortices in Nb above a square array of 1 μm-sized circular ferromagnetic dots in a magnetic-vortex state. The force that the MFM tip exerts on the individual vortex in the depinning process was used to estimate the spatial modulation of the pinning potential. It was found, that the superconducting vortices which are preferably located on top of the Py dots experience a pinning force, about 15 times stronger as compared to the pinning force in the pure Nb film. This strong pinning exceeds the repulsive interaction between the superconducting vortices and allows vortex clusters to be located above the dots.     

Magnetic properties of hexagonal ferrite dot arrays

Patterned magnetic media have been considered as one of the promising candidates for future ultra-high-density magnetic recording. In this paper, a new kind of patterned medium based on hexagonal ferrite have been studied. We have successfully fabricated strontium ferrite dot arrays by electron beam lithography. Their magnetic properties are evaluated by magnetic force microscopy (MFM) and superconducting quantum interference device (SQUID). The results show the dot arrays have perpendicular anisotropy. Dots with the lateral size larger than 500 nm show multidomain magnetization configuration in the initial magnetization state. However, with dot size decreased to 500 nm, all the dots have single-domain configuration both in the initial magnetization state and remanent magnetization state.     

Studies of the domain structure of anisotropic sintered SmCo5 permanent magnets

In this work, investigations of the magnetic microstructure of anisotropic sintered SmCo₅ permanent magnets with high coercivity have been made using the colloid-scanning electron microscopy (SEM) technique and magnetic force microscopy (MFM). The magnets were produced by powder metallurgy (sintering) process and consisted of oriented grains with an average size of about 20 μm. They were studied in the thermally demagnetized state. Owing to the application of digital image recording, enhancement and analysis, high-quality images of the magnetic microstructure were obtained and analyzed not only qualitatively but also quantitatively. Improvements over previous results were achieved. The grains show the presence of magnetic domains, as expected. At the surface perpendicular to the alignment axis, the coarse domain structure in the form of a maze pattern with surface reverse spikes is observed. The main (maze) domains had typical widths 3–5 μm. The reverse spike domains were imaged as circles typically 1–2 μm in diameter or as elongated regions up to about 6 μm in length. Interestingly, in addition to the coarse maze domains and reverse spikes near the surface, a fine surface domain structure is revealed with MFM. The fine scale domains are found to be magnetized perpendicular to the surface and their occurrence is attributed to further reduction of the magnetostatic energy at the cost of a larger domain wall energy. On the surface parallel to the alignment axis, the main domains within individual grains are imaged as stripe domains with domain walls running approximately parallel to the alignment axis, while reverse spike domains are displayed in the form of triangular domains and occur near some grain boundaries, pores or precipitations. The magnetic alignment of grains was found to be good, but certainly not perfect. In most cases the domain structures within grains were independent of their neighbors, but in some cases (not so rare) observations indicated the existence of significant magnetostatic coupling between neighboring grains. The main and surface domain widths were determined by digital means using the stereologic method of Bodenberger and Hubert. Moreover, the domain wall energy and other intrinsic parameters for the studied magnets were determined.     

Magnetic force microscopic study of the magnetic field induced antiferro to ferrimagnetic transition in Mn1.85Co0.15Sb

Magnetic field induced first order antiferromagnetic (AFM) to ferrimagnetic (FRI) transition in polycrystalline Mn_1.85Co_0.15Sb has been studied using magnetic force microscopy (MFM) at 60 K and up to 8 T magnetic fields. Our MFM studies provide real space visualization of AFM to FRI transition. It shows growth (decay) of FRI phase with increasing (decreasing) magnetic field. The hysteretic behavior and co-existing FRI and AFM phases across the critical field required for FRI-AFM transition in Mn_1.85Co_0.15Sb are highlighted. This study demonstrates the potential of MFM for studying phase co-existence at high field and low temperatures.     

Hard disk magnetic domain nano-spatial resolution imaging by using a near-field scanning microwave microscope with an AFM probe tip

A near-field scanning microwave microscope (NSMM) incorporating an atomic force microscope (AFM) probe tip was used for the direct imaging of magnetic domains of a hard disk under an external magnetic field. We directly imaged the magnetic domain changes by measuring the change of reflection coefficient S₁₁ of the NSMM at an operating frequency near 4.4 GHz. Comparison was made to the magnetic force microscope (MFM) image. Using the AFM probe tip coupled to the tuning fork distance control system enabled nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitative measurement of magnetic domains with nano-scale resolution and high sensitivity.     

Read/write characteristics of a new type of bit-patterned-media using nano-patterned glassy alloy

The paper reports a feasibility study of new type bit-patterned-media using a nano-patterned glassy alloy template for ultra-high density hard disk applications. The prototype bit-patterned-media was prepared using a nano-hole array pattern fabricated on a Pd-based glassy alloy thin film and a Co/Pd multilayered film filled in the nano-holes. The prepared prototype bit-patterned-media had a smooth surface and isolated Co/Pd multilayer magnetic dots, where the average dot diameter, the average dot pitch and the average dot height were 30, 60 and 19 nm, respectively. MFM (magnetic force microscope) observation revealed that each dot was magnetized in a perpendicular direction and the magnetization could reverse when an opposite magnetic field was applied. Static read/write tester measurements showed that repeated writing and reading on isolated magnetic dots were possible in combination with conventional magnetic heads and high-accuracy positioning technologies. The present study indicates that the new type of bit-patterned-media composed of nano-hole arrays fabricated on glassy alloy film template and Co/Pd multilayer magnetic dots are promising for applications to next generation ultra-high density hard disk drives.     

Characterization of high‐density bit‐patterned media using ultra‐high resolution magnetic force microscopy

Bit‐patterned media at one terabit‐per‐square‐inch (Tb/in²) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Structural characterization and optical properties of UO2 thin films by magnetron sputtering

Uranium dioxide films were deposited on Si (1 1 1) substrates by dc magnetron sputtering method at different sputtering parameters. The structure, morphology and chemical state of the films were studied by field emission scanning electron microscopy, X-ray diffraction, X-ray photoelectron spectroscopy and atomic force microscopy. Influences of film thickness on the microstructure and optical properties were investigated. Experimental results show that the film crystallites are preferentially oriented with the (1 1 1) planes. The average grain size increases with increasing film thickness. AFM images show that the root mean square roughness of the films is between 1.2 nm and 2.1 nm. Optical constants (refractive index, extinction coefficient) of the films in the wavelength range of 350-1000 nm are obtained by ellipsometric spectroscopy. The result shows that the refractive index decreases with the increasing film thickness, while extinction coefficient increases with the film thickness.     

Perpendicular magnetic anisotropy of ultrathin FeCo alloy films on Pd(0 0 1) surface: First principles study

Using the full potential linearized augmented plane wave (FLAPW) method, thickness dependent magnetic anisotropy of ultrathin FeCo alloy films in the range of 1 monolayer (ML) to 5 ML coverage on Pd(0 0 1) surface has been explored. We have found that the FeCo alloy films have close to half metallic state and well-known surface enhancement in thin film magnetism is observed in Fe atom, whereas the Co has rather stable magnetic moment. However, the largest magnetic moment in Fe and Co is found at 1 ML thickness. Interestingly, it has been observed that the interface magnetic moments of Fe and Co are almost the same as those of surface elements. The similar trend exists in orbital magnetic moment. This indicates that the strong hybridization between interface FeCo alloy and Pd gives rise to the large magnetic moment. Theoretically calculated magnetic anisotropy shows that the 1 ML FeCo alloy has in-plane magnetization, but the spin reorientation transition (SRT) from in-plane to perpendicular magnetization is observed above 2 ML thickness with huge magnetic anisotropy energy. The maximum magnetic anisotropy energy for perpendicular magnetization is as large as 0.3 meV/atom at 3 ML film thickness with saturation magnetization of . Besides, the calculated X-ray magnetic circular dichroism (XMCD) has been presented.     

Properties of Cu film and Ti/Cu film on polyimide prepared by ion beam techniques

Cu film and Ti/Cu film on polyimide substrate were prepared by ion implantation and ion beam assisted deposition (IBAD) techniques. Three-dimension white-light interfering profilometer was used to measure thickness of each film. The thickness of the Cu film and Ti/Cu film ranged between 490 nm and 640 nm. The depth profile, surface morphology, roughness, adhesion, nanohardness, and modulus of the Cu and Ti/Cu films were measured by scanning Auger nanoprobe (SAN), atomic force microscopy (AFM), and nanoindenter, respectively. The polyimide substrates irradiated with argon ions were analyzed by scanning electron microscopy (SEM) and AFM. The results suggested that both the Cu film and Ti/Cu film were of good adhesion with polyimide substrate, and ion beam techniques were suitable to prepare thin metal film on polyimide.     

Enhanced cell affinity of poly(l-lactide) film by immobilizing phosphonized chitosan

Graft polymerization of acrylic acid (AA) onto poly(l-lactide) (PLLA) film by UV irradiation was carried out to develop surfaces for N-methylene phosphonic chitosan (NMPC) immobilization. The properties of modified films were discussed by colorimetric method, attenuated total reflection-Fourier transform infrared spectroscopy (ATR-FTIR), contact angles, atomic force microscopy (AFM) and osteoblast incubation. The results showed that AA solution concentration and irradiation time had effect on the graft carboxyl densities. Comparing the ATR-FTIR images, two new peaks at 1561 cm⁻¹ and 1632 cm⁻¹ proved that NMPC was immobilized on the film surface successfully. The water contact-angles were decreased from 90 ± 5° to 37 ± 5° after modification. The AFM images indicated that the surface of the combined film was rougher than that of untreated film. The grafted film provided an excellent substrate for the growth of osteoblast.     

Microstructural and surface property variations due to the amorphous region formed by thermal annealing in Al-doped ZnO thin films grown on n-Si (1 0 0) substrates

X-ray diffraction (XRD) patterns revealed that the as-grown and annealed Al-doped ZnO (AZO) films grown on the n-Si (1 0 0) substrates were polycrystalline. Transmission electron microscopy (TEM) images showed that bright-contrast regions existed in the grain boundary, and high-resolution TEM (HRTEM) images showed that the bright-contrast regions with an amorphous phase were embedded in the ZnO grains. While the surface roughness of the AZO film annealed at 800 °C became smoother, those of the AZO films annealed at 900 and 1000 °C became rougher. XRD patterns, TEM images, selected-area electron diffraction patterns, HRTEM images, and atomic force microscopy (AFM) images showed that the crystallinity in the AZO thin films grown on the n-Si (1 0 0) substrates was enhanced resulting from the release in the strain energy for the AZO thin films due to thermal annealing at 800 °C. XRD patterns and AFM images show that the crystallinity of the AZO thin films annealed at 1000 °C deteriorated due to the formation of the amorphous phase in the ZnO thin films.     

Magnetic force microscopy studies of domain walls in nickel and cobalt films

A magnetic force microscopy is used to examine the domain walls in nickel and cobalt films deposited by argon ion sputtering. Thin nickel films deposited at high substrate temperatures exhibit coexistent Bloch and Neel walls. Films grown at room temperature display alternative Bloch lines with cap switches. These films agglomerate to form grains after annealed at high temperatures. The film composed of larger grains behaves better nucleation implying magnetic domains of closure, while the film composed of smaller grains exhibits more defects implying alternative Bloch lines. We have also observed domain displacements and cap switches, which occur due to precipitation of particles in small grain size films. Stripe domains are observed for film thicknesses larger than 100 nm. They become zigzag cells when an external field of 1.5 T is applied perpendicular to the surface of the films. This experiment indicates that the domain sizes in thin films and the strip widths for thick films both depend on the square-root of the film thickness, which varies from 5 to 45 nm and from 100 to 450 nm, respectively.     

Rapid thermal annealing effects on the structural and optical properties of ZnO films deposited on Si substrates

The structural and optical properties of ZnO films deposited on Si substrate following rapid thermal annealing (RTA) have been investigated by X-ray diffraction (XRD), atomic force microscopy (AFM), and photoluminescence (PL) measurements. After RTA treatment, the XRD spectra have shown an effective relaxation of the residual compressive stress, an increase of the intensity and narrowing of the full-width at half-maximum (FWHM) of the (0 0 2) diffraction peak of the as-grown ZnO film. AFM images show roughening of the film surface due to increase of grain size after RTA. The PL spectrum reveals a significant improvement in the UV luminescence of ZnO films following RTA at 800 °C for 1 min.