Study on Laser Conditioning of Optical Coatings

ＳｔｕｄｙｏｎＬａｓｅｒＣｏｎｄｉｔｉｏｎｉｎｇｏｆＯｐｔｉｃａｌＣｏａｔｉｎｇｓ￥ＺＨＡＯＱｉａｎｇ；ＦＡＮＺｈｅｎｇｘｉｕ；ＷＡＮＧＺｈｉｊｉａｎｇ（ＳｈａｎｇｈａｉＩｎｓｔｉｔｕｔｅｏｆＯｐｔｉｃｓａｎｄＦｉｎｅＭｅｃｈａｎｉｃｓ，Ｃｈｉｎｅｓ...     

3-methyl-4-metroxy-4'-nitrostilbene (MMONS) Crystal Growth and Studies of It

３－ｍｅｔｈｙｌ－４－ｍｅｔｒｏｘｙ－４＇－ｎｉｔｒｏｓｔｉｌｂｅｎｅ（ＭＭＯＮＳ）ＣｒｙｓｔａｌＧｒｏｗｔｈａｎｄＳｔｕｄｉｅｓｏｆＩｔｓＳｅｃｏｎｄＮｏｎｌｉｎｅａｒＯｐｔｉｃａｌＰｒｏｐｅｒｔｉｅｓ￥ＣＡＯＹａｎｇ；ＺＨＵＺｈｉｄｏｎｇ；ＨＵＡ...     

Optical Limiting Effect of SiO_2 Gel Containing C_(60)

ＯｐｔｉｃａｌＬｉｍｉｔｉｎｇＥｆｆｅｃｔｏｆＳｉＯ＿２ＧｅｌＣｏｎｔａｉｎｉｎｇＣ＿（６０）￥ＸＩＡＨａｉｐｉｎｇ；ＺＨＵＣｏｎｇｓｈａｎ；ＧＡＮＦｕｘｉ（ＳｈａｎｇｈａｉＩｎｓｔｉｔｕｔｅｏｆＯｐｔｉｃｓａｎｄＦｉｎｅＭｅｃｈａｎｉｃｓ，Ａｃａｄ...     

Complex-valued Vector-matrix Multiplication Architecture

Ｃｏｍｐｌｅｘ－ｖａｌｕｅｄＶｅｃｔｏｒ－ｍａｔｒｉｘＭｕｌｔｉｐｌｉｃａｔｉｏｎＡｒｃｈｉｔｅｃｔｕｒｅ￥ＺＨＯＵＣｈａｎｇｈｅ；ＬＩＵＬｉｒｅｎ（ＳｈａｎｇｈａｉＩｎｓｔｉｔｕｔｅｏｆＯｐｔｉｃｓａｎｄＦｉｎｅＭｅｃｈａｎｉｃｓ，Ａｃａｄｅｍｉａ...     

Microstructure Evolution in Laser RS Co-base Metastable Alloy

ＭｉｃｒｏｓｔｒｕｃｔｕｒｅＥｖｏｌｕｔｉｏｎｉｎＬａｓｅｒＲＳＣｏ－ｂａｓｅＭｅｔａｓｔａｂｌｅＡｌｌｏｙＷＡＮＧＡｎａｎ；ＣＨＥＮＧＳｈｕｎｑｉ；ＧＵＯＺｈｉｙａｏ（ＫｕｎｍｉｎｇＵｎｉｖｅｒｓｉｔｙｏｆＳｃｉｅｎｃｅａｎｄＴｅｃｈｎｏｌｏｇｙ，...     

Compact Optical Omega Network

ＣｏｍｐａｃｔＯｐｔｉｃａｌＯｍｅｇａＮｅｔｗｏｒｋ￥ＷＡＮＧＮｉｎｇ；ＹＩＮＹａｏａｌ；ＱＩＡＮＪｉａｊｕｎ；ＬＩＵＬｉｒｅｎ（ＳｈａｎｇｈａｉＩｎｓｔｉｔｕｔｅｏｆＯｐｔｉｃｓａｎｄＦｉｎｅＭｅｃｈａｎｉｃｓ，ＡｃａｄｅｍｉａＳｉｎｉｃａ，Ｐ．Ｏ...     

Repetition Operation of Flashlamp Pumped Ti: sapphire Laser

ＲｅｐｅｔｉｔｉｏｎＯｐｅｒａｔｉｏｎｏｆＦｌａｓｈｌａｍｐＰｕｍｐｅｄＴｉ：ｓａｐｐｈｉｒｅＬａｓｅｒ￥ＬＩＺｉｙａｏ；ＧＡＯＧｕｏｃｈａｎｇ；ＹＩＮＳｈａｏｔａｎｇ（ＡｎｈｕｉＩｎｓｔｉｔｕｔｅｏｆＯｐｔｉｃｓａｎｄＦｉｎｅＭｅｃｈａｎｉｃｓ，Ｃ...     

Tunable Solid-State Laser Using Organic Dye DCM Doped ORMOSIL

ＴｕｎａｂｌｅＳｏｌｉｄ－ＳｔａｔｅＬａｓｅｒＵｓｉｎｇＯｒｇａｎｉｃＤｙｅＤＣＭＤｏｐｅｄＯＲＭＯＳＩＬ￥ＹＥＨｕｉ；ＨＵＷｅｎｔａｏ；ＪＩＡＮＧＺｈｏｎｇｈｏｎｇ（ＳｈａｎｇｈａｉＩｎｓｔｉｔｕｔｅｏｆＯｐｔｉｃｓａｎｄＦｉｎｅＭｅｃｈａｎｉｃｓ...     

Crystal Growth and Nonlinear Optical Properties of 4－Br－4＇－Methoxychalcone（BMC）

Ｃｒｙｓｔａｌ Ｇｒｏｗｔｈ ａｎｄ Ｎｏｎｌｉｎｅａｒ Ｏｐｔｉｃａｌ Ｐｒｏｐｅｒｔｉｅｓ ｏｆ ４－Ｂｒ－４＇－Ｍｅｔｈｏｘｙｃｈａｌｃｏｎｅ（ＢＭＣ）￥ＣＡＯＹａｎｇ；ＺＨＵＺｈｉｄｏｎｇ；ＳＨＥＮＸｉａｏｐｉｎｇ（ＤｅｐａｒｔｍｅｎｔｏｆＣ...     

Multi-channel Associative Memory Using Liquid Crystal Photoelectric Switches

Ｍｕｌｔｉ－ｃｈａｎｎｅｌＡｓｓｏｃｉａｔｉｖｅＭｅｍｏｒｙＵｓｉｎｇＬｉｑｕｉｄＣｒｙｓｔａｌＰｈｏｔｏｅｌｅｃｔｒｉｃＳｗｉｔｃｈｅｓ￥ＬＩＨｅｑｉａｏ；ＬＩＵＷｅｉ；ＺＨＡＮＧＹｉｍｏ（ＩｎｓｔｉｔｕｔｅｏｆＯｐｔｏ－ｅｌｅｃｔｒｏｎｉｃｓａｎ...     

Rapid surface roughness measurements of silicone thin films with different thicknesses

A rapid optical measurement system for rapid surface roughness measurement of polycrystalline silicon (poly-Si) thin films was developed in this study. Two kinds of thickness of poly-Si thin films were used to study rapid surface roughness measurements. Six different incident angles were employed for measuring the surface roughness of poly-Si thin films. The results reveal that the incident angle of 20° was found to be a good candidate for measuring the surface roughness of poly-Si thin films. Surface roughness (y) of poly-Si thin films can be determined rapidly from the average value of reflected peak power density (x) measured by the optical system developed using the trend equation of y = ?0.1876x + 1.4067. The maximum measurement error rate of the optical measurement system developed was less than 8.61%. The savings in measurement time of the surface roughness of poly-Si thin films was up to 83%.     

基于光腔环路衰荡光谱技术气体浓度测量的研究

为了实现痕量气体在线测量与分析,设计了光纤环路光腔衰荡多组分气体浓度在线测量系统;基于非线性光腔衰荡技术,利用所设计的系统对气体浓度在线测量并进行了实验分析;得出了同种气体不同浓度时光的吸收程度随时间变化的规律和1 ppb的分辨率.实验表明该方法对痕量气体的在线测量是有效的.     

Measurements of NO2 mixing ratios with topographic target light scattering-differential optical absorption spectroscopy system and comparisons to point monitoring technique

A topographic target light scattering-differential optical absorption spectroscopy(ToTaL-DOAS) system is developed for measuring average concentrations along a known optical path and studying surface-near distributions of atmospheric trace gases.The telescope of the ToTaL-DOAS system points to targets which are located at known distances from the measurement device and illuminated by sunlight.Average concentrations with high spatial resolution can be retrieved by receiving sunlight reflected from the targets.A filed measurement of NO2 concentration is performed with the ToTaL-DOAS system in Shijiazhuang in the autumn of 2011.The measurement data are compared with concentrations measured by the point monitoring technique at the same site.The results show that the ToTaL-DOAS system is sensitive to the variation of NO2 concentrations along the optical path.     

Repeatability and reproducibility study of thin film optical measurement system

Investigation on surface roughness of thin films is an important issue in manufacturing engineering because the performance of a coated film is significantly affected by the surface roughness of thin films. A fast and flexible optical measurement system to measure surface roughness of hard coatings deposited by cathodic arc evaporation is developed in this work. The objective of this work is to examine the repeatability and reproducibility (R&R) of an optical measurement system. Percentage of equipment variation, appraiser variation and R&R is 7.25%, 1.42% and 7.39%. Thin film optical measurement system developed is acceptable according to the measurement systems analysis and the R&R technique.     

Rapid determination of surface roughness of polycrystalline silicon following frontside and backside excimer laser irradiation

Excimer-laser crystallization (ELC) is the most commonly employed technology for fabricating low-temperature polycrystalline silicon (LTPS). Investigations on the surface roughness of polycrystalline silicon (poly-Si) thin films have become an important issue because the surface roughness of poly-Si thin films is widely believed to be related to its electrical characteristics. In this study, we develop a simple optical measurement system for rapid surface roughness measurements of poly-Si thin films fabricated by frontside ELC and backside ELC. We find that the incident angle of 20° is a good candidate for measuring the surface roughness of poly-Si thin films. The surface roughness of polycrystalline silicon thin films can be determined rapidly from the reflected peak power density measured by the optical system developed using the prediction equation. The maximum measurement error rate of the optical measurement system developed is less than 9.71%. The savings in measurement time of the surface roughness of poly-Si thin films is up to 83%. The method of backside ELC is suggested for batch production of low-temperature polycrystalline silicon thin-film transistors due to the lower surface roughness of poly-Si films and higher laser-beam utilization efficiency.     

Signal measurement system for intra-body communication using optical isolation method

In this paper, we describe an induced signal measurement on the human body for developing a high-performance transceiver of an intra-body communication system. It is important to isolate awearable transceiver from an electrical instrument for precise measurement. We have developed a probe system using an optical isolation method including a laser diode, photo-diode, and optical fiber. The probe system can be successfully applied to the precise measurement of a receiving signal power at a wearable transceiver. We verify that the experimental results agree with the simulation results based on our previous channel model of intra-body communication.     

一种光学频率梳绝对测距的新方法

采用光学频率梳的高精度绝对距离测量技术在航空航天、科学研究和工业生产等领域都发挥着重要作用.提出一种利用光学频率梳技术,通过检测光强实现绝对距离测量的新方法,研究了光学频率梳发出脉冲的时间相干性,分析了光强与被测距离之间的关系、干涉条纹峰值点位置与被测距离之间的关系.建立了基于Michelson干涉原理的测距系统,通过测量光强信息得到被测距离.以高精度纳米位移平台的位移量作为长度基准进行了绝对测距实验,在每个被测距离点都重复进行了10次实验,将10次实验测得的光强值取平均后用于距离的计算.实验结果表明,该方法可以实现绝对距离测量,在10μm测量范围内,最大误差为47 nm.因此,该方法可以应用于大尺寸高精度的绝对距离测量.     

大量程激光位移传感器的成像系统设计

为了解决目前国内自主研发的激光位移传感器基准工作距离短和测量范围小的问题,设计了一种适用于远距离测量的大量程激光位移传感器成像光学系统。基于激光三角测量原理,结合具体使用要求计算了大量程激光位移传感器的性能指标和成像光学系统的设计参数。选择5片式透镜结构作为系统的初始结构,利用光学设计软件对大量程激光位移传感器成像光学系统进行了仿真,完成了系统优化和性能分析,实现了基准工作距离为1 000 mm、量程为±500 mm、分辨率为0.4 mm的大量程激光位移传感器成像系统设计。结果表明,在测量范围±500 mm内,系统均可以满足成像质量要求。该激光位移传感器成像系统具有工作距离远、测量量程大、结构简单的特点,可满足1 000 mm远距离处大量程范围的测量使用要求。     

多束高重复频率全光纤激光脉冲时间波形实时精密测量技术

提出了一种基于时分复用的多束高重复频率全光纤激光脉冲时间波形实时精密测量技术,针对分类成组的多束高重复频率全光纤激光系统不同测量功能需求,分别设计了1×8时分复用器、不同延时量的1×2时分复用器,实现了48路、144个1kHz光纤激光整形脉冲时间波形宽度、上升沿、面积等关键参数的精密测量,同时实现了多束高重复频率全光纤脉冲激光系统运行状态的实时监测。     

研制超宽带全光取样示波器设备

全光取样示波器是研究与开发超高速光通信系统和光子交换网络的关键性测试仪器设备. 本文简介了我们自行设计和研制出的超宽带全光取样示波器设备的实验样机系统, 并报道了我们已取得的初步实验结果. 采用自主研发的高稳定性被动锁模飞秒光纤激光器作为该光学示波器的光脉冲取样源, 我们通过利用高度非线性光纤中的四波混频效应, 成功地实现了对脉宽为1.8ps、重复频率分别为10GHz和40GHz的光脉冲信号的全光取样. 然后通过数字信号处理和计算机图形处理, 得到了再现后的超短光脉冲信号波形, 并测出了其脉冲宽度值为2.3ps. 借助于该光学取样示波器实验样机, 我们还成功地完成了对脉宽为1.8ps、经过伪随机数据序列调制后的10Gbit/s和40Gbit/s光数据信号眼图的精确测量. 这是我国首次报道有关超宽带全光取样示波器设备的实际研制工作及其相应的实验测试结果. 所得到的有关超短光脉冲信号波形的测试结果也与用70GHz宽带电子示波器和超快光电探测器组成的常规光电测量系统所获得的结果进行了比较, 清楚地表明了我们研制出的全光取样示波器实验样机比后者具有更高的时间分辨率和更大的测量带宽.