Sr_2RuO_4正常态的c方向的磁阻的研究

研究了典型的层状钙钛矿结构超导单晶Sr2RuO4在c方向的磁阻(Δρ/ρ0)(H∥ab,J∥c)的变化.实验发现,磁阻表现出强烈的各向异性,并且随着温度T的降低,磁阻效应越明显;当在平面ab内旋转磁场H的方向时,磁阻成周期性变化;实验表明,磁场沿(110)方向时,出现磁阻的极大值.分别从Sr2RuO4的费米面的各向异性、载流子散射率、c方向能带色散的各向异性等方面来解释这些输运性质.     

Sr2RuO4正常态的c方向的磁阻的研究

研究了典型的层状钙钛矿结构超导单晶Sr₂RuO₄在c方向的磁阻(Δρ/ρ₀)(H∥ab,J∥c)的变化.实验发现,磁阻表现出强烈的各向异性,并且随着温度T的降低,磁阻效应越明显;当在平面ab内旋转磁场H的方向时,磁阻成周期性变化;实验表明,磁场沿(110)方向时,出现磁阻的极大值.分别从Sr₂RuO₄的费米面的各向异性、载流子散射率、c方向能带色散的各向异性等方面来解释这些输运性质. 关键词： 2RuO₄')" href="#">Sr₂RuO₄ 磁阻     

GdBa_2Cu_3O_(7-δ)单晶的各向异性研究

本文报道了对GdBa_2Cu_3O_(7-8)单晶正常态电阻率、超导临界温变,以及磁转变的各向异性观测结果,发现ab平面上及c轴方向的电阻率,除T_c附近由于超导涨落引起的明显偏离以外,在正常态都能很好地满足Anderson-Zou关系:ρ=A/T BT,但两方向的A,B存在显著差异说明其输运电荷是由不同机制产生,它具有显著的二维特征;沿c轴方向的超导电性比沿ab平面的超导电性要弱,T_(ce)比T_(ce∥)低2K;H∥ab平面时的交流屏蔽效应仅是H⊥ab平面时的76％。     

GdBa2Cu3O7-δ单晶的各向异性研究

本文报道了对GdBa₂Cu₃O_7-δ单晶正常态电阻率、超导临界温变,以及磁转变的各向异性观测结果,发现ab平面上及c轴方向的电阻率,除T_c附近由于超导涨落引起的明显偏离以外,在正常态都能很好地满足Anderson-Zou关系:ρ=A/T+BT,但两方向的A,B存在显著差异说明其输运电荷是由不同机制产生,它具有显著的二维特征;沿c轴方向的超导电性比沿ab平面的超导电性要弱,T_ce⊥比T_ce∥低2K;H∥ab平面时的交流屏蔽效应仅是H⊥ab平面时的76％。 关键词：     

BROADENING OF RESISTIVE TRANSITION AND IRREVERSIBILITY LINE FOR EPITAXIAL

The broadening of resistive transition of c axis oriented epitaxial YBCO thin film has been measured for three configurations: (1) H∥c and H⊥I; (2) H∥ab plane and H⊥I; (3) H∥ab plane and H∥I in magnetic field up to 8 Teala(T), and for different angle θ of magnetic field relative to the ab plane with H = 4T. The results obtained indicate that the broadening of resistive transition is mainly determined by the angle θ, but is hardly related to the angle α made between magnetic field and tran sport current in ab plane. This means that the broadening of resistive transition is not determined by flux motion drived by apparent Lorentz force. Au expression of angular dependence of irreveraibility line has been given.     

BROADENING OF RESISTIVE TRANSITION AND IRREVERSIBILITY LINE FOR EPITAXIAL YBa2Cu3O7-$\delta$ THIN FILM

The broadening of resistive transition of c axis oriented epitaxial YBCO thin film has been measured for three configurations: (1) H∥c and H⊥I; (2) H∥ab plane and H⊥I; (3) H∥ab plane and H∥I in magnetic field up to 8 Teala(T), and for different angle θ of magnetic field relative to the ab plane with H = 4T. The results obtained indicate that the broadening of resistive transition is mainly determined by the angle θ, but is hardly related to the angle α made between magnetic field and tran sport current in ab plane. This means that the broadening of resistive transition is not determined by flux motion drived by apparent Lorentz force. Au expression of angular dependence of irreveraibility line has been given.     

Ag基Bi-2223相复合带材中晶粒取向分布

基于Ag基Bi2223相(Bi2223/Ag)复合带材中晶面取向对提高临界电流密度等实际应用方面的重要性,我们在带材临界电流密度测量的基础上,由金兹玻-朗道(GL)理论计算出沿ab平面和c轴方向的上临界磁场Hc2(H∥ab)和Hc2(H∥c),其比值强烈依赖于晶粒ab平面与带材宽面的夹角θ,由此得到带材中晶粒平面的取向分布.我们发现,Bi2223/Ag带材中晶粒可在-75°<θ<75°范围内自由生长,但不可能有晶粒的ab面垂直于带材宽面的晶粒存在.研究结果表明:95%的晶粒取向为|θ|<75°范围,|θ|=75°～85°在的晶粒只有5%,而在|θ|>85°的区域没有晶粒分布.     

Nd1.85Ce0.15CuO4±δ单晶ab面与c方向电阻率的比较

本文通过对Nd1.85Ce0.15CuO4±δ单晶ab面(ρab)和c方向电阻率(ρc)的测量,发现未经过氮气退火的样品的ρc与温度成线性依赖关系,但是同一个样品经过氮气退火后的ρc中不仅有一次方的温度依赖关系还有二次方的.这说明样品经过氮气退火后,电子与空穴两种载流子共同参与导电.样品在退火处理前的各向异性比(ρc-ρc0)/(ρab-ρab0)存在强的温度依赖关系,这是由于ρc与温度成线性依赖关系,然而ρab不仅有一次方的温度依赖关系还有二次方的.样品经过退火处理后的各向异性比存在弱的温度依赖赖关系,这是由于ρc与ρab中都同时有一次方和二次方的温度依赖关系.我们用电子和空穴沿c方向有不同的隧穿几率来解释ρc和(ρc-ρc0)/(ρab-ρab0).     

Gd掺杂对Bi2Sr2Ca1-xGdxCu2Oy单晶载流子浓度和各向异性电阻率的影响

系统地研究了Gd掺杂对Bi2Sr2Ca1-xGdxCu2Oy单晶超导电性及各向异性电阻率的影响.Tc满足Tc/Tc,max=1-82.6(ax+b)2,并随Gd含量的增加而下降,这是由于Gd掺杂引起载流子浓度减小所导致.在x≥0.19时,ρab(T)在Tc附近有类半导体行为,dρab/dT随Gd含量增大而增大.ρc(T)呈半导体行为,并可用唯象公式ρc(T)=(a/T)exp(Δ/T)+bT+c加以描述.电阻率各向异性ρc/ρab随掺杂浓度增大而增大.     

氧化铬外延薄膜的x射线研究

采用分子束外延技术(MBE)在MgO(001)基板上沉积了氧化铬薄膜，并利用x射线衍射 (XRD)和x射线反射谱(XRR)对薄膜的晶体结构进行了表征.θ—2θ扫描和倒易空间图(R SM)揭示出薄膜为单相c轴外延生长，晶体结构为体心正交，晶胞常数a，b，c分别为0.8940±0.0003，0.298±0.0002和0.3897±0.0002nm.扫描表明薄膜在面内具有90°孪晶，取向关系为a∥MgO〈110〉,c∥MgO(001).XRR谱测得薄膜的电子 密度为1350±20nm-3，与由晶胞体积 计算得 关键词： 一氧化铬薄膜 x射线衍射 倒易空间图 x射线反射谱