Transient vibration measurements using multi-pulse digital holography

An optical system for the evaluation of transient deformations will be described. In order to increase the temporal resolution, a ruby laser producing four pulses has been used. Four separate digital holograms (one hologram for each pulse) of the test object are recorded in a few microseconds on three CCD sensors. The Fourier method is used for the quantitative evaluation of the digital holograms. The phases are obtained from the complex amplitudes, and the deformation at different times is calculated from phase subtraction. Experimental results are presented.     

Multiple-exposure high-sensitivity holographic interferometry for studying moving objects

A method for increasing the sensitivity of measurements through aberration compensation upon reconstruction of interferograms from two multiple-exposure holograms is proposed. At the early stage of object investigation, the holographic structures recorded at certain time instants are rerecorded by two coherent beams on new image carriers. In this case, the interference moiré method is employed to monitor the equality of the vectors of the holographic structures rerecorded. At the final stage, the new nonlinear holograms are processed in an optical analyzer of conjugate holograms with the use of incoherent light. The hologram thus reconstructed offers a high sensitivity of measurements and is free of aberrations. The method is tested by visualizing the temperature-field variations in a glass substrate with a conducting coating.     

Phase profile analysis of transparent objects through the use of a two windows interferometer based on a one beam splitter configuration

In this research we implemented a two windows interferometer based on polarization phase shifting and grating interferometry techniques in order to retrieve the phase data profile of the object in a single capture. The optical configuration has two optical beams with circular polarization in opposite directions, and it is coupled with a 4-f system. An amplitude grid is used as a filter which is placed at the Fourier plane to obtain replicas of each beam which can properly interfere, depending on the separation between beams. The interferometer presents the capability of changing the beam separation in order to make different orders interfere properly. The interference patterns produced can be separately modulated through the operation of linear polarizer's placed on each interference replica. In order to present the capabilities of the system we will select four interferograms result of contiguous orders interference.     

A system combining several interferometers to investigate spatial gas-dynamic phenomena and high-speed photography of axisymmetric processes

A system is described consisting of five compensated shear interferometers intended for observing a test object from various directions. Pulsed ruby lasers serve as light sources. While studying axisymmetric phenomena, the interferometer system is used for high-speed photography. Some interferograms are presented.     

基于数字全息及复用技术的全场偏振态测试方法

提出了一种在数字全息记录系统中利用偏振和角分复用技术对光场进行偏振态检测的方法. 将全息系统中的一束参考光分为偏振方向相互正交、初相位相同的两束光, 并分别与物光相同偏振方向的两个分量干涉, 形成两幅子全息图, 同时记录在一帧画面中. 为了分开记录到的物光两个分量, 系统中利用了角分复用技术, 即在两束参考光中引入不同载频, 使物光两分量的频谱位于全息图频谱面的不同区域. 通过滤波、逆傅里叶变换和衍射计算, 获取距离全息图不同位置处物光两正交分量复振幅信息. 利用复振幅信息, 可以构建被测物光的斯托克斯参量和琼斯矢量, 从而表征物光的偏振态. 实验中, 通过对一束椭圆偏振光进行偏振态测量以及对该光束在不同空间位置处的偏振态进行表征, 表明该方法可以实现光束偏振态全场测试, 并且具有较高的可靠性. 关键词： 数字全息 偏振态 琼斯矢量 斯托克斯参量     

Application of the holographic carrier fringe and FFT technique for deformation measurement

This paper describes a holographic system based on the use of fibre optics and automatic spatial carrier fringe pattern analysis. Carrier fringes are generated by simply translating the object beam between two exposures. Single-mode optical fibres are used to transfer both the object and reference beams. The fast Fourier transform method is used to process the interferograms: it extracts phase from fringe patterns resulting from the interference of tilted wavefronts. The method is illustrated by measuring the deformation of an arbitrarily clamped, uniformly loaded circular plate. The results are given for the perspective plot of the out-of-plane deformation field, the maps of wrapped and unwrapped phase, and a contour map of the unwrapped phase.     

Some investigations in holographic microscopic interferometry with respect to the estimation of stress and strain in micro-opto-electro-mechanical systems (MOEMS)

Holographic microscopy with conjugate reconstruction for the interferometric determination of three-dimensional displacement was used for the investigation of the mechanical behaviour of micromechanic and microelectronic components. An experimental set-up for the exposure of the holographic interferograms is described for the application of the spatial heterodyne technique, for the application of phase shifting, and for electro-optic holography. Three holograms for different illumination directions recorded on one holographic plate were reconstructed conjugately, and spatial-heterodyne technique as well as phase-shift technique were used to evaluate the interferograms. Only by conjugated reconstruction, it is possible to obtain a perfectly optimised interferometer for the static evaluation method. The evaluation of interferograms, which are strongly disturbed by speckle noise, can be performed successfully. A comparison of the results of the application of these techniques is given. The influence of the speckle effect on the resolution was investigated.     

Holographic reverse shearing interferometry with high measurement sensitivity

The possibility of studying phase objects by reverse shearing interferometry with high measurement sensitivity is demonstrated. Phase objects are studied in two stages. In the first stage, holographic reverse shear interferograms are measured with and without an object under nonlinear conditions with tuning to frequent reference fringes. In the next stage, these interferograms are optically processed to obtain two interference patterns. The behavior of the interference fringes is the same as in the case of conventional double-beam interferometry with a standard reference wave. The increase in the measurement sensitivity in the thus-obtained interference patterns is due to the use of higher diffraction orders reconstructed from the holographic interferograms. A possibility of controlling the width of interference fringes is considered. The results of experimental approval of this technique are presented.     

Shearing interferometry using lateral shears in opposite directions

Different schemes of recording shearing interferograms using shears of wave fronts in opposite directions are considered. It is shown that interference patterns depicting the derivative of the wave front phase with an increased sensitivity can be obtained both on separate carriers and on one common carrier without nonlinear recording of a pair of interferograms. Results of experimental verification of the method including a series of interference patterns with sensitivity increased by two times and different tuning of fringes are given.     

Generalized phase-shifting algorithm for dynamic phase measurement in electron-wave interferometry

A generalized phase-shifting algorithm is implemented in the electron-wave interferometry with a transmission electron microscope, based on simultaneous measurement of the initial phases of the interferograms. The initial phase of each interferogram that has inherent linear carrier fringes is calculated using the Fourier co-efiicients of the interferogram itself corresponding to the carrier-frequency. Taking advantage of this phase-shifting method in both spatial resolution and precision, the phase distribution of a biological weak phase object is successfully measured. This promises to be one of the most spectacular application fields for this new technology.     

3-D surface profilometry based on modulation measurement by applying wavelet transform method

A new analysis of 3-D surface profilometry based on modulation measurement technique by the application of Wavelet Transform method is proposed. As a tool excelling for its multi-resolution and localization in the time and frequency domains, Wavelet Transform method with good localized time-frequency analysis ability and effective de-noizing capacity can extract the modulation distribution more accurately than Fourier Transform method. Especially for the analysis of complex object, more details of the measured object can be well remained. In this paper, the theoretical derivation of Wavelet Transform method that obtains the modulation values from a captured fringe pattern is given. Both computer simulation and elementary experiment are used to show the validity of the proposed method by making a comparison with the results of Fourier Transform method. The results show that the Wavelet Transform method has a better performance than the Fourier Transform method in modulation values retrieval.     

Phase-shifting algorithm to achieve high-speed long-depth-range probing by frequency-domain optical coherence tomography

Standard Fourier-domain optical coherence tomography (FDOCT) suffers from the presence of autocorrelation terms that obscure the object information and degrade the sensitivity and signal-to-noise ratio. By exploiting the phase information of the recorded interferograms, it is possible to remove those autocorrelation terms and to double the measurement range. However, standard phase-retrieval algorithms need three to five interferograms. We present a novel technique that shows all the features of complex FDOCT with only two recorded interferograms.     

A method for increasing the sensitivity of determination of the wavefront distortion in optical processing of holographic lateral shear interferograms

A method for obtaining interference patterns of increased sensitivity in optical processing of holographic lateral shear interferograms recorded under linear conditions at a shear exceeding the size of a phase object under study is proposed. Cases of reconstruction of interference patterns of increased sensitivity using matched and optically conjugate holographic lateral shear interferograms are considered. It is shown that two-and fourfold increases in sensitivity, respectively, are obtained in these cases. The validity of the method proposed is confirmed experimentally     

Spatial Filtering of Lateral-Shear Interferograms in the Case of Double-Exposure Recording of a Lens Fourier Hologram of a Mat Screen. II

Distortions of lateral-shear interferograms in fringes of infinite width due to hologram aberrations are analyzed in a third approximation for a complex field amplitude. The interferometer sensitivity range in the field is shown to increase in the case where a Fourier hologram of a mat screen is recorded using a negative lens, two identical subjective speckles of two exposures are superimposed in the hologram plane, and errors of control are eliminated.     

Simultaneous measurement with one-capture of the two in-plane components of displacement by electronic speckle pattern interferometry

We present the simultaneous measurement of the two in-plane displacement components by electronic speckle pattern interferometry with three object beams and without an in-line reference beam. Three interference fringe patterns, corresponding to three different sensitivity vectors, are recorded in a single interferogram and separated by means of the Fourier transform method. Then, two interference fringe patterns are selected to obtain the in-plane displacement components.     

一种减少空间调制快拍成像测偏仪伪信息的方法

空间调制快拍成像测偏技术能将偏振信息编码到一幅干涉图中,通过一次测量同时获取目标全部斯托克斯参量.针对空间调制快拍成像测偏技术中,目标像的高频部分对偏振信息通道产生串扰,导致重构的偏振信息包含有伪信息和频域重构目标像的空间分辨率低等问题,提出一种消除伪信息和获取全分辨率目标像的方法.该方法通过对两次快拍测量获得的干涉图进行简单加减运算,便可获得探测目标清晰的纯图像和高信噪比的偏振分量干涉图.本文对该方法进行了详细的理论分析,并通过计算机仿真和搭建实验平台,验证了该方法的可行性.这为空间调制快拍成像测偏技术获取全分辨率目标像和高质量重构偏振信息提供了新思路.     

Two-dimensional cell parameters measurement of nematic liquid crystal using optical interferometry and Fourier transform fringe analysis technique

We report a method for the measurement of nematic liquid crystal (NLC) cell parameters i.e., switching voltage, birefringence, retardation, dielectric anisotropy, average tilt angle and change in refractive index with applied DC voltage to LC material. The proposed method is based on optical interferometry and Fourier transform fringe analysis technique, in which we obtain 2-dimensional (2D) phase map of the interferograms as a function of applied voltage. Mach-Zehnder interferometer (MZI) was used for the study of cell parameters and interferograms were recorded at different applied DC voltages to NLC cell using CCD camera. From the phase map, 2D-refractive index distribution of the LC cell with applied voltage was reconstructed. Analytical equations are derived based on optical interferometry and then solved to obtain cell parameters. The present method is fast and can give 2D-cell parameters from only two quick interferograms.     

Dual-channel phase-shifting interferometry for microscopy with second wavelength assistance

Dual-channel phase-shifting interferometry for simultaneous phase microscopy is presented. Red and blue light beams are used for microscope illumination. A 45 tilted beamsplitter replicates the object and reference waves in red light together with the object wave in blue light into two parallel beams. The two resulting quadrature phase-shifting interferograms in red light and the object waves in blue light are generated in the two channels. The two interferograms are recorded simultaneously by a color charge-coupled device (CCD) camera, and can be separated via RGB components of the recorded color patterns without crosstalk. As a result, the phase of tested specimen can be retrieved. The feasibility of the proposed method is demonstrated by test performed on a microscopic specimen.     

两幅差分干涉诊断铝丝阵Z箍缩等离子体

研制了两幅激光差分干涉诊断系统,可在一次实验中获得两幅间隔3～12 ns的高分辨干涉图像。该系统采用分光延时装置产生两束有一定夹角和时间间隔的探测激光脉冲,采用特殊的偏轴4f传像系统在同一块CCD的不同区域产生两幅干涉图像。应用该系统开展了铝丝阵Z箍缩激光干涉诊断实验,获得了丝膨胀和消融、晕等离子体产生和发展、以及先驱等离子体产生和发展等Z箍缩演化过程的实验图像,并给出了Z箍缩早期阶段的等离子体电子密度分布。     

Measurement of non-monotonous phase changes in temporal speckle pattern interferometry using a correlation method without a temporal carrier

Recently, a phase evaluation method was proposed to measure nanometric displacements by means of digital speckle pattern interferometry when the phase change introduced by the deformation is in the range [0,π) rad. This method is based on the evaluation of a correlation coefficient between two speckle interferograms generated by both deformation states of the object. In this paper, we present a novel technique to measure non-monotonous displacements in temporal speckle pattern interferometry using a correlation method without a temporal carrier. In this approach, the sign ambiguity is resolved automatically due to the introduction of a function that determines the correct sign of the displacement between two consecutive speckle interferograms. The rms phase errors introduced by the proposed method are determined using computer-simulated speckle interferograms. An application of the phase retrieval method to process experimental data is also presented.