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1.
本文报道了在(001)掺钇氧化锆(YSZ)基片上生长高质量CeO2缓冲层和Tl-2212超导薄膜的制备方法,以及不同厚度的超导薄膜对其特性的影响.XRD和SEM测试表明,在经过合适条件退火的基片和CeO2缓冲层上,所生长的Tl-2212薄膜具有致密的晶体结构、优良的面内和面外取向.最佳样品的临界转变温度(Tc)和临界电流密度为(Jc)可以分别达到107.5 K和 4.24 MA/cm2(77 K,0 T).实验结果表明,采用该工艺所制备的不同厚度Tl-2212超导薄膜的主要指标能满足开发多种超导器件的要求.  相似文献   

2.
CeO_2缓冲层热处理对Tl-2212薄膜超导特性的影响   总被引:1,自引:1,他引:0  
本文采用原子力显微镜(AFM)和XRD研究了生长在蓝宝石(11-02)基片上的CeO_2缓冲层在不同的退火温度和退火时间下表面形貌和相结构的变化,以及对Tl-2212薄膜超导特性的影响.AFM和XRD研究表明,CeO_2薄膜在流动氧环境中退火,表面形貌发生显著的变化;CeO_2薄膜在最佳条件下退火后,可获得原子级光滑表面,结晶质量明显提高.实验结果表明,缓冲层的结晶质量和表面粗糙度与Tl-2212薄膜的超导特性密切相关.在经过最佳条件退火后的CeO_2缓冲层上制备了厚度为500 nm无裂纹的Tl-2212超导薄膜,其临界转变温度(T_c)达到107 K,液氮温度下临界电流密度(J_c)为3.9 MA/cm~2(77 K,0 T),微波表面电阻(R_s)约为281 μΩ(77 K,10 GHz).  相似文献   

3.
本文研究了蓝宝石基片的热处理对Tl-2212薄膜的结晶质量、表面形貌及其超导特性的影响.SEM和XRD研究表明,在经过最佳条件(1000 ℃×20 h)退火后的基片上,可以制作出具有致密的晶体结构、高度c轴取向的外延Tl-2212超导薄膜,其薄膜具有优良的电学性能.  相似文献   

4.
本文报道了采用射频磁控溅射法和快速升温烧结法在R面取向的蓝宝石单晶基片上生长CeO2缓冲层和Tl-1223超导薄膜,研究了缓冲层生长情况和先驱膜后退火条件对超导薄膜结晶情况和超导特性的影响。AFM和XRD表征结果显示,蓝宝石基片经过退火后其表面形成具有光滑平台的台阶结构,同时基片的晶体质量得到了改善;本文所制备的CeO2缓冲层和Tl-1223超导薄膜具有较好的c轴生长取向,而且两者呈现良好的ab面内织构。SEM表征结果显示,生长良好的Tl-1223超导薄膜呈层状结构,表面光滑平整、结构致密。在液氮环境下,测得所制备Tl-1223超导薄膜的临界转变温度Tc约为111 K,临界电流密度Jc(77 K,0 T)约为1.3 MA/cm2。  相似文献   

5.
张影  张爽  张静 《人工晶体学报》2015,44(5):1342-1346
采用Pechini法在STO(100)单晶基底上制备Bi2Sr2CaCu2O8+δ(Bi2212)超导薄膜.重点研究了金属离子比例与预处理温度对Bi2212薄膜相组成及表面形貌的影响.结果表明,适当增加初始计量中Ca的摩尔比,有利于纯相的形成.预处理温度不仅影响样品的表面形貌,同时对相纯度的影响也很显著.较佳条件下,1108 K温度下热处理10 min可制备具有c轴外延取向的纯Bi2212相薄膜.  相似文献   

6.
在铌酸锂(LN)晶体衬底上磁控溅射铟锡氧化物(ITO)薄膜,研究了射频磁控溅射制备ITO/LN薄膜的最佳工艺.采用原子力显微镜(AFM)和X射线衍射(XRD)分析了透明导电ITO膜的制备工艺参数对薄膜表面形貌和晶体结构的影响,同时应用四探针电阻率测量和紫外可见光谱测量技术对所研制的ITO/LN膜的光电性质进行了研究.结果表明,衬底温度为320℃,溅射时间50 min时制备的ITO/LN薄膜具有最佳光电性质,在该条件制备出薄膜的电阻率为3.41×10-4Ω·cm,ITO/LN平均可见光透光率可达74.38;,平均透光率比LN衬底提高了1.1;.应用该溅射条件制备了泰伯效应位相阵列器,其近场衍射成像的相对光强可达0.67.  相似文献   

7.
采用真空热蒸发技术在石英玻璃衬底上蒸镀约400 nm的铝膜,并在空气中580℃的条件下退火1 h。在退火过程中Al与石英中的SiO2反应形成纳米硅nc-Si∶(Al2O3+SiO2)复合膜。利用X射线衍射(XRD)、拉曼散射(Raman)及扫描电镜(SEM)等方法研究了薄膜的结构特性。测得膜厚约为760 nm,估算出薄膜中纳米硅(nc-Si)的平均尺寸约为25 nm。实验发现该nc-Si∶(Al2O3+SiO2)复合膜有热电特性,研究了其电阻率及Seebeck系数随温度(293~413 K)的变化关系,在293 K和413 K该薄膜的Seebeck系数分别约为-624μV/K和-225μV/K。  相似文献   

8.
利用脉冲激光沉积技术,在MgO(100)衬底上生长了BaTi2O5薄膜,探讨了沉积条件(衬底温度和氧分压)对薄膜结构的影响,并对其介电和光学性能进行了研究.结果表明:随衬底温度和氧分压的改变,BaTi2O5薄膜的物相和结晶取向逐渐变化;适宜的脉冲激光沉积工艺为衬底温度950~1000 K、氧分压12.5 Pa,在该条件下获得了b轴方向择优生长的BaTi2O5薄膜;该薄膜具有较高的居里温度(750 K),介电常数达2000,而且在可见光和红外波长范围内具有较高的透过率.  相似文献   

9.
WS2二维材料独特的光吸收体特性使其成为可饱和吸收体的优选材料。溶胶凝胶法具有操作方便、设备简单、成本低廉等优点。利用溶胶凝胶法在石英基片上制备SiO2材料为主体的WS2-SiO2薄膜是一种实现可饱和吸收体的新思路。本文通过改变实验过程中原料配比、热处理条件、旋涂速度等实验参数确定出溶胶凝胶法制备SiO2薄膜的最佳条件,在此基础上再加入WS2溶液制备出WS2-SiO2薄膜可饱和吸收体,通过共聚焦显微镜、透射电子显微镜、拉曼光谱、X射线衍射等方法对制备的样品进行了测试分析,结果表明采用本文提出的制作方法可以得到外观良好的WS2-SiO2薄膜可饱和吸收体、WS2在 SiO2薄膜中呈多层的多晶颗粒,晶面指数主要为(002)、(004)、(101)、(103)、(006)、(105)。  相似文献   

10.
用溶胶-凝胶法在酸碱复合催化条件下制备了Si O2溶胶,采用浸渍提拉法在K9玻璃上制备了性能稳定的Si O2薄膜,并用三甲基氯硅烷对Si O2薄膜进行了表面改性。用反射式椭圆偏振光谱仪测试薄膜的椭偏参数,并用Cauchy模型对椭偏参数进行数据拟合,获得了Si O2改性前后在300~700 nm波段的色散关系。讨论了薄膜改性与光学性能间的关系。结果表明:Cauchy模型能较好的描述溶胶-凝胶薄膜在300~650 nm波段的光学性能;表面改性后Si O2薄膜光学常数发生改变,但未影响色散关系的变化趋势;薄膜改性后具有随着膜层数的增加,折射率增加,而最大峰值透光率、孔隙率减小的规律,且薄膜改性后表面更加致密。  相似文献   

11.
The article presents an analysis into agglomeration during KCl vacuum crystallization. The theoretical and experimental investigations into the mechanism of agglomeration during mass crystallization result in an extension of the growth phenomena within the known model equations. The basis for this is essentially constituted by the collision model concepts of the theory of floculation in disperse systems. The parameters derived from the microprocess analysis (energy dissipation, content of solids, growth rate of individual grains) lead to model equations which are confirmed by laboratory and test trials.  相似文献   

12.
Rakin  V. I. 《Crystallography Reports》2020,65(6):1033-1041
Crystallography Reports - The relationship of morphological spectra (sets of data on the morphological types of real polyhedral crystals and their probabilities under current physicochemical...  相似文献   

13.
The evolution of the geometric characteristics introduced by Pauling and their dependence on the specific features of the structure and chemical bonds have been considered. The values of the covalent and van der Waals radii are given as well as their relationships and mutual transitions.  相似文献   

14.
A review of measurement of thermophysical properties of silicon melt   总被引:2,自引:0,他引:2  
Measurements of thermophysical properties of Si melt and supplementary study of X-ray scattering/diffraction by the authors' group were reviewed. The values obtained differed variously from those of literature. Density was 2–3% larger, surface tension 20–30% smaller, viscosity up to 40% larger, electrical conductivity 8% smaller, spectral emissivity more or less in good agreement with literature values, and thermal diffusivity a few percent larger. An anomalous density jump was found near the melting point. Surface tension and viscosity also showed anomaly. A strange time-dependent change of density was observed over 3 h after melting. X-ray analyses suggested a slight change in local atom ordering, but showed no sign of cluster formation. An addition of 0.1 at% gallium caused the density jump to disappear, while that of boron caused no change. An EXAFS study of the former melt indicated a strong interaction between Ga and Si atoms as if molecules of GaSi3 existed. The implications of the measured properties are a possibility of soft-turbulence in an Si melt in a relatively large crucible, a more complicated manner of intake of oxygen depleted molten Si from the free surface region to underneath the growing crystal, and a relaxation of the melt after melting arising from trapped gas species.  相似文献   

15.
Within the method of discrete modeling of packings, an algorithm of generation of possible crystal structures of heteromolecular compounds containing two or three molecules in the primitive unit cell, one of which has an arbitrary shape and the other (two others) has a shape close to spherical, is proposed. On the basis of this algorithm, a software package for personal computers is developed. This package has been approved for a number of compounds, investigated previously by X-ray diffraction analysis. The results of generation of structures of five compounds—four organic salts (with one or two spherical anions) and one solvate—are represented.  相似文献   

16.
The formulae for absolute Rdisap and relative R velocities of disappearance and lifetime τ of faces of growing crystals have been derived for stationary growth. It was shown that the quantities are determined by the relative growth velocity RA/RcritA of the vanishing face A with respect to the critical growth velocity RcritA and by the geometry of a crystal expressed by the trigonometric functions of interfacial angles β and γ formed between face A and the adjacent faces. R increases and τ decreases with the increase in RA/RcritA to certain limiting values. The calculations have been verified and illustrated by the experimental results for triclinic potassium bichromate (KBC) crystals. Results enable ones to predict values of velocities of disappearance and lifetimes of undesirable, supplementary faces of any real crystal.  相似文献   

17.
I. Avramov 《Journal of Non》2011,357(22-23):3841-3846
The temperature dependence of viscosity of silicate melts is discussed in the framework of the Avramov–Milchev (AM) equation. The composition is described by means of two parameters: the molar fraction, x, and the “lubricant fraction”, l. The molar fraction is the sum of the molar parts xi of all oxides dissolved in SiO2, the molar fraction of the latter being 1 ? x. It is shown that, with sufficient precision, two of the parameters of the AM equation can be presented as unique functions of the molar fraction. On the other hand, x is not sufficient to determine properly the reference temperature Tr , at which viscosity is ηr = 1013 [dPa.s]. Therefore, additional parameter, “lubricant fraction” l, is introduced. For each of the components, li is a product of molar part xi and a specific dimensionless coefficient 0  ki  1 accounting for the specific contribution of this component to the increased mobility of the system. It is demonstrated that, for l > 0, the reference temperature is related to the “lubricant fraction” l through the reference temperature Tr,SiO2 of pure SiO2.  相似文献   

18.
Two types of domain-wall equations are analyzed: the equations derived by the Sapriel method and the equations obtained by interface matching of the thermal-expansion tensor. It is shown that, for W-type domain walls, these methods yield the same equations. For W′-type domain walls, the equations obtained by different methods coincide for proper ferroelastics and differ for improper ferroelastics.  相似文献   

19.
Crystal chemical characteristics of the α and β modifications of Zn2V2O7 are calculated based on in situ high-temperature X-ray measurements. The expansion of the structure is found to be strongly anisotropic up to the negative volumetric thermal expansion of the α-Zn2V2O7 unit cell in the temperature range of 300–600°С, α V =–17.94 × 10–6 1/K. The transformations of the “hard” and “soft” sublattices with an increase temperature and at the phase transition are considered in detail. It is shown that the negative volumetric thermal expansion of α-Zn2V2O7 is due to the degeneracy of the zigzag-like shape of zinc–oxygen columns at constant distances between their vertices.  相似文献   

20.
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