A novel method to measure dielectric properties of materials in terahertz spectroscopy

We present a simple method to obtain the optical and dielectric properties of samples without reference measurement in the reflection-type terahertz time-domain spectroscopy. The dielectric properties of the samples of silicon and gallium arsenide were examined. The optical and dielectric properties of the samples were measured through only simple configuration, without the misplacement error. The obtained dielectric functions of the samples in reflection geometry are in good agreement with that predicated by the theory. The main advantage of this method over other methods is its simplicity and accuracy and ease for application of the reflection systems with different incident angle.     

Methods of terahertz-subterahertz BWO spectroscopy of conducting materials

This paper considers present spectroscopic methods developed for measurement of dielectric response (conductivity and permittivity spectra) of condensed media in the terahertz-subterahertz spectral regions. The techniques based on the use of BWO spectrometers and designed for direct quantitative measurements (without invoking the Kramers-Kronig relations) in the terahertz-subterahertz frequency range (0.03–1.45 THz) of the conductivity σ(ν) and permittivity ?′(ν) spectra of conducting and absorbing materials are described. The techniques are based on measuring the amplitude and phase of the transmission coefficient of film samples on dielectric substrates and the reflection coefficient of a reference plane-parallel dielectric plate contacting the surface of the sample under study. The use of these techniques in measurement of the σ(ν)) and ?′(ν) spectra of conductors and superconductors is illustrated with examples.     

Independent determination of the complex refractive index and wave impedance by time-domain terahertz spectroscopy

We present a method for simultaneous determination of the refractive index and wave impedance - or equivalently of the dielectric permittivity and magnetic permeability - of bulk samples. Two independent complex spectroscopic quantities required for an unambiguous evaluation are experimentally obtained by temporal windowing of time domain waveforms measured in the transmission or reflection geometry. We discuss several approaches that can be used for the evaluation of the complex refractive index and wave impedance; three are quantitatively analyzed and compared. Successful evaluation of the dielectric and magnetic dispersion then crucially depends on the accuracy of the wave impedance measurements.     

Energy loss measurements and electronic properties of thianthren

Summary The dielectric and electronic properties of thianthren (C₆H₄(S)₂H₄C₆) are determined by means of optical reflectivity, absorption measurements and reflection electron energy loss spectroscopy. The experimental results are interpreted on the basis of a Complete Neglect of Differential Overlap (CNDO) calculation used in three different parametrization schemes. Emphasis is laid on the discussion of the problems which generally affect the analysis of electron energy loss spectra, and a procedure to obtain the complex dielectric function from electron energy loss measurements performed in the reflection mode is suggested. Work partially supported by the MURST through the GNSM.     

薄板型介质材料复介电常数的无损测量

采用带法兰结构的TE01n圆柱谐振腔,用无损检测的方法测量薄板型微波介质材料的复介电常数。利用轴向模式匹配法对谐振腔内的电磁场进行了求解,给出了相对介电常数和损耗角正切的计算公式,并利用矢量网络分析仪对几种常用微波介质材料进行了测量,其结果表明:该测量方法对相对介电常数的测量误差不超过1%,而对损耗角正切的测量误差不超过10%。该方法还具备一腔多模的测试能力,测量频率可调,可用于介质材料频率特性的测量。     

Method of polarization reflection matrix measurement in the submillimeter wave range

Homodyne method of measurement of polarization reflection matrix, providing the possibility of simultaneous measurement of all four complex coefficients of polarization reflection matrix in submillimeter quasi-optical (QO) circuits is presented. Technical realizability of the method for QO waveguides of the class of "hollow dielectric wavequide" is shown.     

光波经多层介质膜反射的时延表达式

 利用基于多光束干涉原理的等效腔模型导出了多层介质膜的反射系数的递推式，在此基础上证明了在中心频率附近，复反射系数可表示为中心频率处的反射系数与相位因子的积，进而导出了相位角的函数和反射时延的表达式。     

Diffuse phase transition of Fe doped lead ytterbium tantalate ceramics

The effect of different concentration of Fe on the phase transition behavior of Lead ytterbium tantalate is investigated by dielectric and differential scanning calrimetry measurements. The samples are prepared through solid state reaction method and it has been found that the sintering temperature significantly lowered when the proportion of Pb(Fe_1/2Ta_1/2)O₃ increased. It has been observed that the doping in small amounts (0≤x≤0.2) of Fe could meliorate the dielectric and ferroelectric properties. The diffuseness in the mode of phase transition increases and the phase transition temperature decreases as a function of Fe content. It is revealed that the dielectric data and heat capacity data follow a similar trend in the variation of the mode of phase transition and phase transition temperatures. The phase transition temperature values obtained from the heat capacity measurement well agreed with the values obtained from dielectric measurement.     

Measurement of the dielectric constant of thin films by terahertz time-domain spectroscopic ellipsometry

We present a reflection-type terahertz time-domain spectroscopic ellipsometry (THz-TDSE) technique for measuring the complex dielectric constants of thin-film materials without replacement of the sample. THz-TDSE provides complex dielectric constants from the ratio of the complex amplitude reflection coefficients between p- and s-polarized THz waves. The measured dielectric constants of doped GaAs thin films show good agreement with predictions of the Drude model, even though the film thickness is of the order of a tenth of the penetration depth of the THz waves. In addition, we demonstrate the measurements of soft-phonon dispersion in SrTiO(3) thin films deposited on a Pt layer. The obtained dielectric constants agree well with the predictions of a generalized harmonic oscillator model.     

Inverse estimation of the acoustic impedance of a porous woven hose from measured transmission coefficients

A porous tube, comprised of a resin-coated woven fabric has recently been used as an effective component for use in intake systems of internal combustion engines to reduce the intake noise. For the prediction of the acoustic performance of an engine intake system with a porous woven hose, the acoustic wall impedance of the hose must be known. However, the accurate measurement of the wall impedance of a porous woven hose is not easy because of its peculiar acoustical and structural characteristics. A new measurement technique is proposed herein, that is valid over the low to mid frequency ranges. The acoustics impedance is inversely estimated from an overdetermined set of measured pressure transmission coefficients for specimens of different lengths and the reflection coefficient of end termination. The method involves only one measurement setup, and, as a result, it is very simple. A variation of the proposed method, an inverse estimation method using one of the four-pole parameters is also proposed. An error sensitivity analysis was performed to investigate the effect of measurement error on the accuracy of the final result. The measured TL for samples with arbitrary lengths and arbitrary porous frequency are in reasonably good agreement with values predicted from curve-fitted impedance data.     

CdxHg1-xTe混晶的远红外反射光谱和多振子模型

在温度4.2—300K和波数15—450cm^-1范围内研究了x=0.18到0.45的不同组份的Cd_xHg_1-xTe样品的远红外反射光谱。实验观察到了类CdTe光学声子反射带的精细结构和低组份样品类HgTe反射带的复杂结构,研究了这些结构对组份和温度的关系,并用多振子模型讨论了反射光谱的这种精细结构。对实验反射光谱用经典的振子匹配方法进行了拟合计算,并从这种拟合运算获得了Cd_(x^-)Hg_1-xTe的远红外介电函数谱及其它光学常数和频率的关系。 关键词：     

Cost Optimized Non-Contacting Experimental Modal Analysis Using a Smartphone

The vibrations behavior analysis is an essential step in the mechanical design process. Several methods such as analytical modelling, numerical analysis and experimental measurements can be used for this purpose. However, the numerical or analytical models should be validated through experimental measurements, usually expensive. This paper introduces an inexpensive smartphone as an accurate, non-intrusive vibrations’ behavior measurement device. An experimental measurement procedure based on the video processing method is presented. This procedure allows the measurement of the natural frequencies and the mode shapes of a vibrating structure, simply by using a smartphone built-in camera. The experimental results are compared to those obtained using an accurate analytical model, where the natural frequencies error is less than 2.7% and the modal assurance criterion is higher than 0.89. In order to highlight the obtained results, a comparison has been done using a high quality and high frame per second (fps) camera-based measurement of material properties. Since the highest recovered natural frequency and its associated mode shape depend on the frame per second rate of the recorded video, this procedure has great potential in low frequencies problems such as for big structures like buildings and bridges. This validated technique re-introduces the personal smartphone as an accurate inexpensive non-contacting vibration measurement tool.     

Static dielectric constant assessment from capacitance over a wide range of electrode separations

Static dielectric constant extraction from two-electrode capacitance measurement over a wide range of electrode separations and dielectric constants involves careful assessment of fringe fields. Finite-element method has been employed to compute capacitance and quantify fringe fields for parallel electrode capacitor of (finite thickness, radii r, electrode separation d), with a homogeneous dielectric medium extending up to the geometric limits of the electrodes. Two distinct regimes, in the fringe field contributions are seen. A procedure to extract the static dielectric constant has been proposed for the first regime and a validation has been provided for the same.     

Kamers-Kronig关系在反射太赫兹时域光谱测量中的应用

太赫兹时域光谱技术是材料介电参数测量的重要方法,是材料研究、鉴别和分析的重要工具。太赫兹时域光谱技术是一种太赫兹频段的相干探测技术,可以同时获得太赫兹波的幅度和相位信息,通过透射测量、反射测量可获得材料的复透射率或复反射率来反演材料的电磁参数。在实际中,大多数被测材料太赫兹波无法穿透,或者不满足透射材料参数反演需要的弱吸收近似,因此反射测量更具应用价值。在已发表的研究结果中,研究人员仍普遍采用透射测量的方案,很少见使用反射测量方案获取材料参数。究其原因,在反射测量时,由于样品和参考板位置的放置误差很难消除,从而导致无法准确提取反射相位。将光学领域广泛使用的Kamers-Kronig关系应用于太赫兹时域光谱系统反射测量中,以解决反射测量中无法准确获得相位信息从而无法提取介电参数的问题。为了验证Kamers-Kronig关系的准确性,一方面,通过透射、反射方法分别测量硅材料的复透射率、复反射率并反演了其材料参数,两者的反演结果一致性较好。另一方面,利用同一组硅的反射测量数据分别用Kamers-Kronig关系和最大熵法对其材料参数进行反演,两种处理方法也可以实现相互印证,进一步确保了提取数据的可靠性。对Kamers-Kronig关系和最大熵方法所取得的结果进行了对比讨论,通过Kamers-Kriong关系和最大熵法获得的折射率、消光系数以及复介电参数结果一致性较好,且基于Kamers-Kriong反演了一种精神药物的吸收谱,与透射结果做了比对。结果表明,Kamers-Kronig关系非常适合提取材料光学参数和吸收谱,且相比最大熵法其普适性更强,甚至对于无法获取相位信息的非相干测量系统依然适用,但该方法需要整个频段的反射率幅度信息,对于没有测量的频率需要进行外推,对于反射率随频率变化不大的物质更加适用。该研究成果对于利用反射式太赫兹时域光谱系统获取材料太赫兹波段的光学参数提供了一种有效方法,可解决绝大数情况下反射测量参数提取问题,对太赫兹时域光谱技术的实际应用具有重要意义。     

Microwave transmission and reflection of stratified lossy dielectric segments partially filling waveguide

The microwave transmission and reflection is evaluated for stratified lossy dielectric segments partially filling the rectangular waveguide by the method which combines the multimode network theory with the rigorous mode matching procedure. As an example, we investigate in detail the microwave scattering properties of II-VI-epitaxial layer on a lossy dielectric substrate inserted in the rectangular waveguide. The experimental data verify the accuracy and the effectiveness of the present method. Extensive numerical results are presented to establish useful guidelines for the contactless microwave measurement of the conductivity of the epitaxial layer.     

Dielectric properties of an ytterbium-based nematic liquid-crystal complex

The dielectric properties of an yttrium-based paramagnetic thermotropic nematic liquid-crystal complex have been studied. The conditions for the measurement of the magnitude and sign of the dielectric anisotropy of the mesophase have been determined. The relaxation of the components of the relative permittivity of a macroscopically homogeneously oriented sample has been observed. A high polarity of the metallomesogenic complex has been revealed.     

天线罩电厚度与材料电参数六端口测量系统设计

 介绍了一个可用于天线罩电厚度与介质材料介电常数测量的六端口反射计系统，它由对称波导五端口结与定向耦合器组成，其关键部件波导五端口结用HFSS软件仿真与设计。介绍了天线罩相对电厚度复反射系数的测量方法。用该系统对滑动短路器复反射系数进行了测量，测量结果表明，系统工作稳定，测试精度高。利用短路波导法测量了材料介电常数和损耗角正切，测量结果显示：介电常数测量的精度和稳定度较高，损耗正切的测量误差较大。     

New microwave system to determine the complex permittivity of small dielectric and semiconducting samples

This paper describes the new microwave bridge system with dielectric antennas of very small transverse dimensions (smaller than 10 mm) convenient for measurements of the complex dielectric permittivity of slab materials. The system enables (i) to measure by nondestructive way the complex permittivity of dielectric and semiconducting samples the dimensions of which are comparable or smaller than the wavelength of probing microwaves, (ii) to detect the material inhomogeneities. This system was verified at the frequency 37·5 GHz. In this paper measurements of the resistivity of the Si samples are given. Results obtained are in good agreement with the theory.     

Effect of cation disorder on structural, magnetic and dielectric properties of La2MnCoO6 double perovskite

The origin of dielectric anomalies and magnetodielectric response of La(2)MnCoO(6) has been investigated by means of ultra-high resolution synchrotron x-ray powder diffraction, neutron powder diffraction, resistivity, magnetization and dielectric measurements. The study has been performed on two different bulk samples presenting different degrees of Mn/Co order: 95 and 74%. Beside the well-known influence on magnetic properties, our results show that the main effect of disorder lies on the electrical resistivity. Bond distances clearly show Mn(4+)/Co(2+) valence states in the well-ordered sample, while for the disordered one this picture still holds. AC resistivity data show dielectric anomalies and a small magnetodielectric effect, but impedance complex plane analyses prove that these phenomena appear at the frequency-temperature region where extrinsic effects dominate the dielectric response.     

Automatic measurement for dielectric properties of solid material at 890 GHz

An automatic measurement system has been used to measure the complex dielectric constant of solid materials at 890GHz. This instrument can be used as a two-beam interferometer for determining the refractive index or as a transmitter for measuring the absorption coefficient of dielectric materials at FIR and SMMW frequency. The results for seven low-loss solid materials and the accuracy of the measurement are presented.Project supported by the Fund of the National Sciences of P.R.China.