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天线罩电厚度与材料电参数六端口测量系统设计
引用本文:韦高,许家栋,吴昌英,杨金孝.天线罩电厚度与材料电参数六端口测量系统设计[J].强激光与粒子束,2007,19(8):1347-1351.
作者姓名:韦高  许家栋  吴昌英  杨金孝
作者单位:西北工业大学 电子信息学院, 西安 710072
基金项目:陕西省自然科学基金;西北工业大学校科研和教改项目
摘    要: 介绍了一个可用于天线罩电厚度与介质材料介电常数测量的六端口反射计系统,它由对称波导五端口结与定向耦合器组成,其关键部件波导五端口结用HFSS软件仿真与设计。介绍了天线罩相对电厚度复反射系数的测量方法。用该系统对滑动短路器复反射系数进行了测量,测量结果表明,系统工作稳定,测试精度高。利用短路波导法测量了材料介电常数和损耗角正切,测量结果显示:介电常数测量的精度和稳定度较高,损耗正切的测量误差较大。

关 键 词:复反射系数  六端口  五端口结  电厚度  介电常数  天线罩
文章编号:1001-4322(2007)08-1347-05
收稿时间:2007/3/5
修稿时间:2007-03-05

Designing six-port measurement system for measuring electrical thickness of radome and permittivity of materials
WEI Gao,XU Jia-dong,WU Chang-ying,YANG Jin-xiao.Designing six-port measurement system for measuring electrical thickness of radome and permittivity of materials[J].High Power Laser and Particle Beams,2007,19(8):1347-1351.
Authors:WEI Gao  XU Jia-dong  WU Chang-ying  YANG Jin-xiao
Institution:School of Electronics and Information, Northwestern Polytechnical University, Xi’an 710072, China
Abstract:A six-port reflectometer for measuring the electrical thickness of radome and permittivity of dielectric material is introduced,which consists of a symmetrical five-port waveguide junction and a directional coupler.The key part of this system is the five-port junction,it has been simulated and designed by HFSS.The reflection coefficient of sliding shorts measured by this system has been given and the result shows that the system is stable and accurate.A measurement method of the reflection coefficient of the radome electrical thickness has been introduced.Through measuring the phase of reflection coefficients of radome wall,the relative change of electrical thickness of radome wall can be got.Short circuits waveguide method to measure the permittivity of materials has been given,the permittivity of material will be calculated by the measured reflection coefficients of the vacant and loaded waveguide and the results measured by this system are stable and close to the data of literature.
Keywords:Reflection coefficient  Six-port  Five-port junction  Electrical thickness  Permittivity  Radome
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