Ku波段开腔电介质高温自动测量系统

 介绍了一种测量低损耗天线罩材料的开腔高温自动测量系统。该系统采用扫频方式程控标量网络分析仪对开腔进行扫频测量，得到介质加载前后腔体的谐振频率与Q值，并由此计算出被测材料的介电常数和损耗角正切；介质采用特制硅碳管加热，由温度控制器对其控制，最高温度可达1 000 ℃以上。用此系统对聚四氟乙烯和一种低损耗天线罩材料进行测量对比。结果表明，测得的聚四氟乙烯结果与文献结果相近，天线罩材料相对介电常数的实部随温度升高而增加。     

基于TM0mn模式微波介质材料复介电常数的测量

 提出了一种基于闭式谐振腔TM_0mn模式测量微波介质材料复介电常数的方法。利用模式匹配技术、Ritz-Galerkin方法以及传输模品质因数测量法导出了介质材料相对介电常数和损耗角正切的测量公式。最后,利用矢量网络分析仪对常用天线罩材料进行了扫频测量,结果表明：高分子量聚乙烯在3~6 GHz范围内的相对介电常数为2.30±0.05,损耗角正切为(1.8~2.0)×10^-4。     

薄板型介质材料复介电常数的无损测量

采用带法兰结构的TE01n圆柱谐振腔,用无损检测的方法测量薄板型微波介质材料的复介电常数。利用轴向模式匹配法对谐振腔内的电磁场进行了求解,给出了相对介电常数和损耗角正切的计算公式,并利用矢量网络分析仪对几种常用微波介质材料进行了测量,其结果表明:该测量方法对相对介电常数的测量误差不超过1%,而对损耗角正切的测量误差不超过10%。该方法还具备一腔多模的测试能力,测量频率可调,可用于介质材料频率特性的测量。     

微波铁氧体的介电常数和磁导率的测量

本文利用反射式谐振腔,通过测量放入样品前后谐振腔反射系数的变化,确定介电常数虚部ε″和磁导率虚部μ″。研究了样品形状和放在谐振腔不同位置对介电常数和磁导率测量的影响。测量系统有较高的灵敏度。通过提高谐振腔的品质因数和使谐振腔接近临界耦合,并适当减小谐振腔的体积,使系统测量损耗角正切达到10^-5数量级并不困难。     

温度相关的微波频率下氯化钠水溶液介电特性

针对NaCl水溶液(0.001–0.5 mol/L)介电特性, 实验调查了频率(200–6.25 GHz), 温度(293–353 K)、 浓度相关复介电常数. 结果表明: 频率增大的过程中虚部呈逐渐减小的趋势, 高温使离子扰动增大, 破坏了溶液内部水分子四面体结构和氢键构象而使介电常数实部减小. 与纯水相比, 溶液的损耗角正切在高温353 K低频区下降明显. 同时发现2.45和5.8 GHz的复介电常数随温度变化的温度窗效应, 温度窗效应导致微波加热时耗散功率的振荡变化, 温度分布不均匀现象在实验中得以证实. 关键词： 微波 复介电常数 介电特性 高温探头     

EAST上基于端口密度测量的低杂波耦合研究

介绍了一套安装在EAST装置低杂波天线端口上方,用来测量端口附近电子密度的Langmuir三探针系统及其初步实验结果。此探针系统由探针、测量电路、数据采集以及数据处理四部分构成。实验结果表明：在低杂波天线端口充气的条件下,低杂波注入后端口密度会有明显的增加。端口密度与反射系数的关系与理论趋势一致,EAST上低杂波耦合的最佳密度出现在4~5×10¹⁷m^-3。     

环状烯烃聚合物基底材料的太赫兹复介电常数和损耗特性研究

太赫兹时域光谱(THz-TDS)已被用于研究包括液体,半导体,爆炸物和气体等多种材料。然而自由空间太赫兹光谱系统存在着一些检测局限性,如微量物质难以被检测、系统尺寸难以实现微型化、空气中水的强烈吸收引起的信号衰减较大等问题。为了解决这些问题,研究人员设计了基于金属波导传输线结构的太赫兹芯片集成器件,通过飞秒红外激光激励传输线上的光电导材料实现太赫兹波的产生和检测。然而,在这些芯片上传输的太赫兹信号的频谱宽度很难达到自由空间太赫兹时域光谱系统的频带宽度,一个重要原因是由于传输信号受到随频率增加的传输线损耗所导致的衰减。通常这些损耗主要由三个部分组成：导体损耗,介电损耗和辐射损耗。研究表明：使用低介电常数材料作为共面传输线的衬底,将减少这种介电常数的失配,从而避免冲击波辐射损失;使用具有低损耗角正切的基底材料可以减少太赫兹传输线的损耗。环烯烃聚合物(COP)是一种具有环状烯烃结构的非晶性透明共聚物的材料,在太赫兹波段具有很高的透射率,为了探究这种材料是否能用于共面传输线的衬底,需要通过太赫兹时域光谱技术和介电函数理论分析它在太赫兹频段的光谱和介电特性,以及对这种材料作为基底时用在太赫兹传输线的传输特性进行仿真计算分析。使用透射式太赫兹时域光谱系统,对三种COP、熔融石英和PMMA进行了光谱测试,提取了它们的透射时域信号,采用Dorney和Duvillaret等提出的物理模型计算复介电函数。实验表明：与其他两种材料相比,COP材料在1 THz处的透过率更高,可以达到94.5%,同时介电损耗和介电常数更低,其中介电损耗在1 THz处达到4.31×10-4,因此将COP作为传输线基底材料时能有效减少基底的介电损耗。同时COP材料的介电常数在0.2～2.8 THz范围内维持在约2.3的水平,也有效减弱了辐射损耗。对实验材料基底组成的共面波导传输线进行了HFSS模拟,获得了它们的正向传输衰减系数(S₂₁ parameter),并对由基底引起的介电损耗和辐射损耗进行了计算分析。模拟和计算结果也表明在同一传输线结构下,与其他材料相比COP作为基底时的损耗更小。通过太赫兹时域光谱法与介电响应分析,表明了在太赫兹波段具有较低介电常数的COP材料更适合作为太赫兹传输线结构的基底材料,它可以有效的降低因基底引起的介电损耗和辐射损耗。这为太赫兹传输线的设计过程中衬底材料的选择与应用提供了实验和理论依据。     

基于共面波导微带线的光探测器高频电参量提取

针对不能在片测量的光探测器芯片,本文提出了一个简单而有效的实验方案来提取其等效电路模型的高频电参量.首先设计了和微波探针匹配的共面波导微带线,测量其输出反射系数,测试结果与理论设计符合很好;然后将芯片装载到微带线上,测量包含光探测器的整个测试结构的输出反射系数.仿真中涉及光探测器测试结构的等效电路模型,包含光探测器、键合金丝和共面波导微带线等因素.通过拟合已测的整个测试结构的输出反射系数,提取了光探测器的高频电参量.     

PT-PEK-c电光聚合物薄膜的厚度和介电性质

研制了新的PT-PEK-c电光聚合物薄膜材料,用准波导耦合m线方法测量了PT-PEK-c电光聚合物薄膜的厚度,并测量了该聚合物薄膜在1×10²Hz到1×10⁷Hz频率范围内的室温介电常数.测量结果为:厚度d=2.328±0.315μm,在10KHz下,介电常数ε_r＝4023±0.063,介电损耗tanδ＝0.003.     

损耗电介质在镜像法测试装置中的应用

 通过在校准头的耦合波导中填充介电常数为10,损耗角正切为0.6的损耗电介质材料,利用该介质对电磁波的损耗来近似测试头中的输入输出耦合环对电磁场能量的影响,以满足镜像法中测试头和校准头中电磁场分布一致这一要求。这一损耗介质材料的引入,改进了测试头和校准头的设计,使得测试头在取得较大耦合量的同时能保持与校准头的对称性,减小了以往测试装置低耦合量所引起的测试误差。     

Analysis of Dielectrc-Filled Waveguide Coupling to Plasmas in the ICRF

Dielectric-filled waveguides may be advantageous for heating reactor-grade tokamak plasmas, due to their compactness and power-handling capability. We present a theoretical analysis of coax excitation and plasma impedance for a dielectric-filled rectangular waveguide. The plasma reflection coefficient is obtained by matching plasma and waveguide fields at the interface. The numerical results show that the reflection coefficients can be made small by careful tailoring of the waveguide dimensions to the density profile for heating at the second or third harmonic of deuterium. We present a scattering matrix approach for the design of a coaxial feed to match the waveguide in the presence of a wide range of plasma loading. For a waveguide filled with a high permittivity dielectric, a shorted probe gives better coupling than an open-ended probe.     

A new method to measure permittivity and permeability in nanopowder materials in microwave range

A new method for measuring the electromagnetic properties (permittivity and permeability) of nanopowder materials in a wide microwave region is presented. Unlike previously developed systems, our experimental setup is based on reflection measurements over a short-circuited transmission line combined with the application of a uniform magnetostatic field. When this field is sufficiently high to saturate the material, the effective permeability of the sample equals the permeability of free space, without modifying its electrical properties. Hence, for each frequency, the permittivity can be obtained through the measurement of a single scattering parameter, such as the reflection coefficient. After this first measurement, and once the external field is removed, the reflection coefficient can be used again to obtain the permeability by means of the permittivity value obtained before. As the major advantage, this procedure allows the recording of the experimental data in just one sweep, using one-port measurements, and without modifying the geometrical characteristics of the sample holder. Hence, the measurement process can be easily automated.     

红外光学材料折射率温度系数测量装置

本文介绍一台红外光学材料折射率温度系数测量装置。该装置是由温控系统、精密测角系统、光学系统和电器控制系统等组成的一台高精度全自动化测量系统，采用改进的自准直法测量折射率温度系数值。该装置达到的主要技术指标：工作波长为2～12μm，温度范围为-50～150℃，测量不确定度为3%，可满足各种红外光学材料折射率温度系数测量的要求。利用该装置对红外材料锗折射率温度系数值进行了测量，并对测量数据进行了报道。     

Computation of the Reflection Coefficient of a Triangular Semiconductor Prism in a Rectangular Waveguide

In this paper we present a method to solve Maxwell's equations that enables to compute waveguide structure containing a semiconductor triangular prism. The numerical study has showed that the triangular prism in the waveguide has a wider frequency band in comparison with a square rod under equal conditions. The reflection coefficient dependencies on frequency, prism size and its permittivity have been computed. The algorithm and computer programme have been tested and compared with the numerical results and experimental data of the paper [1] with good agreement.     

Antiferromagnetic material with the magnetoelectric effect as an example of a left-handed medium

The propagation of electromagnetic waves in an antiferromagnetic material with the magnetoelectric effect is theoretically studied. The frequency dependences of the wavenumbers, dynamical permeability and permittivity, and reflection coefficient of electromagnetic waves for various energy parameters of the antiferromagnetic material have been obtained. It has been shown that there is a frequency range where the dynamical permeability and permittivity, as well as one of the wavenumbers, are simultaneously negative in the antiferromagnetic material with the magnetoelectric effect. In this case, the antiferromagnetic material is an example of a so-called left-handed medium. The reflection coefficient of electromagnetic waves from the surface of the antiferromagnetic material decreases anomalously in this frequency range.     

The possibility of measuring the coefficient of ultrasound attenuation in a one-side accessible layered medium

The possibility of measuring the ultrasound attenuation coefficient and its frequency dependence in a one-side accessible medium is considered under the assumption that the medium contains reflectors with unknown reflection coefficients and the measurements are performed in the reflection geometry. The possibility of measuring the reflection coefficients themselves is indicated. All the above parameters can be measured even when the reflector has the form of a layered structure.     

简易测量柔性材料线胀系数的方法

介绍了一种简易测定柔性材料线胀系数的实验装置和测量方法.利用原有FD-LE线膨胀系数测定仪,使用圆珠笔中的弹簧、笔芯和笔头制作了材料和千分表的连接装置,并利用改进后的仪器测量了几种柔性材料的线胀系数.     

Microstrip photonic crystals used for measuring parameters of liquids

Computer simulation and experimental study of the frequency dependences of the transmission and reflection coefficients of photonic crystals based on a microstrip structure are carried out in the case when the periodicity of the structure is violated by a change in the permittivity of the substrate of one of the alternating segments of the microstrip line. A method is developed for measuring parameters of the material playing the role of inhomogeneity in the open microwave photonic structure. The complex permittivity is determined for a number of polar and nonpolar liquids.     

弱电离尘埃等离子体层反射与透射的SO-FDTD方法分析

将弱电离尘埃等离子体复介电常数表示以jω 为自变量的分式多项式形式, 利用移位算子时域有限差分(SO-FDTD)方法, 给出了弱电离尘埃等离子体频域本构关系的时域形式. 推导了弱电离尘埃等离子体电磁特性的时域递推关系式. 用SO-FDTD方法计算了弱电离尘埃等离子体层的反射和透射系数, 分析了尘埃粒子浓度和尘埃粒子半径的变化对反射系数和透射系数的影响. 结果表明: 有尘埃粒子时的反射系数比没有尘埃粒子时反射系数小, 而透射系数要比没有尘埃粒子时的透射系数大; 当尘埃粒子浓度或尘埃粒子半径增大时, 其反射系数均减小.