三维面形测量中基于模版匹配的变形条纹修复

在基于条纹投影和相位分析的三维面形测量中,由于被测物体表面标志点或复杂面形的阴影遮挡存在,会造成变形条纹局部区域的条纹数据缺失,影响相位和高度信息的最终重建,需要人为地对缺失图像信息进行修复。提出了一种新的缺失条纹数据修复方法——基于模版匹配的图像修复算法,通过图像中已有条纹信息(特别是与待修复区域周围相位信息相似度较高的已知条纹信息)对缺失的变形条纹信息进行估算,实现数据修复。该方法修复效果好,运算过程无需人为参与,便于计算机自动实现,尤其适合于待修复图像整体结构明显、纹理清晰图像的数据修复,有助于提高被测物体相位计算质量和在此基础上的三维面形重建质量。     

A composite-structured-light 3D measurement method based on fringe parameter calibration

This paper proposes a novel method for reducing measurement error caused by spectrum overlapping in composite-structured-light 3D measurement systems. For a composite-structured-light 3D measurement system, spectrum overlapping causes parameters of each deformed phase-shifting fringe to change, and therefore leads to phase measurement errors. The proposed fringe parameter calibration method is based on the fact that variations in each deformed fringe's parameters are independent of height and reflectivity of the measured object. Three frames of composite grating are projected on the reference plane, and each carrier channel includes the information of three phase-shifting sinusoidal gratings used in Phase Measuring Profilometry (PMP). With the parameter calculation formulas of PMP, the parameters of fringes demodulated from the same carrier channel can be calculated, and therefore parameter relation coefficients between fringes demodulated from different carrier channels may be obtained. When an object is measured, these relation coefficients can be used to calibrate the parameters of the deformed phase-shifting fringes. A new 3D measurement mathematical model is established to reconstruct the shape of the object. Experimental data proved that the proposed method can effectively restrain the effect of spectrum overlapping and improve measurement accuracy by more than three times.     

Iterative two-step temporal phase-unwrapping applied to high sensitivity three-dimensional profilometry

Although temporal phase unwrapping method can be applied to solve some problems to measure an object with steep shapes, isolated parts or fringe undersampling in three-dimensional (3D) shape measurement, it needs to acquire and process a sequence of fringe pattern images which would take much time. Servin et al. proposed a 2-step temporal phase unwrapping algorithm, which only needs the 2 extreme phase-maps to achieve exactly the same results as standard temporal unwrapping method. But this method is only validated by computer simulation, shortage of experimental demonstration, its sensitivity coefficient G is limited, and it cannot be used when the G value is larger. We proposed an iterative two-step temporal phase-unwrapping algorithm which is an extension of Servin׳s method. First, add a fringe pattern with an intermediate sensitivity, project the fringe patterns of different sensitivity onto the tested object’s surface, and collect deformed fringe patterns with a CCD camera. Then we obtain the unwrapped phase with larger sensitivity coefficient G by cascading the sensitivity coefficients. And we derive the initial phase conditions of the 2-step temporal phase unwrapping algorithm. Finally, the experimental evaluation is conducted to prove the validity of the proposed method. The results are analyzed and compared with Servin׳s method. The experimental results show that the proposed method can achieve higher sensitivity and more accurate measurement, and it can overcome the main disadvantages encountered by Servin׳s method.     

嵌入式三维数字成像系统

提出一种基于数字信号处理器(DSP)的嵌入式三维数字成像系统设计方案。该方案的硬件平台由条纹投影模块、数据采集模块、条纹自动分析模块及储存器等其他辅助电路组成。条纹投影模块将DSP输出的正弦光栅条纹, 经视频编码后用DLP投射到物体表面; 数据采集模块通过CCD相机采集被物体表面三维信息调制后的变形条纹图, 并进行视频解码; 条纹自动分析模块中利用相移算法计算折叠相位, 再结合相位展开算法求绝对相位分布。系统软件采用多线程技术并行控制三个模块。在相位解调过程中以软件流水线为主综合运用了循环展开、数据预取和内联函数等多种方法优化解调程序。实验结果表明, 该系统可以高速、准确地实现三维轮廓测量,优化后相位展开程序速度是优化前的7倍。     

On-line phase measuring profilometry based on a single frame of deformed pattern

Three frames of deformed patterns are needed at least in conventional Phase Measuring Profilometry (PMP). It is generally applied to the profile measurement of a static object. For on-line measurement, because of the moving object, it is difficult to capture three or more frames of deformed patterns that satisfy the requirement of PMP. A new method of on-line 3-D shape measurement through only one frame deformed pattern in PMP is presented. A static sinusoidal fringe is projected and any one frame of real-time deformed patterns is captured by CCD. N frames of sub-images are extracted from the captured deformed pattern. Improved Stoilov algorithm is proposed to get phase. Computer simulation and experimental results show its feasibility and affectivity to reconstruct a 3-D shape and the accuracy is higher than Fourier Transform Profilemetry (FTP) which is also a method that only needs one frame of deformed pattern.     

单幅条纹图相位解调的小波分析方法

相位解调是条纹相位分析的关键问题.本文提出一种应用小波频率估计联合频率导数对变形条纹进行瞬时频率分析,从中提取参考基频,从而依靠单一变形条纹实现相位解调的方法.首先,理论上证明了当变形条纹瞬时频率空间导数等于零,该空间点的瞬时频率等于参考基频频率;其次,引入Gabor小波提取变形条纹的瞬时频率空间分布,利用变形条纹瞬时频率的空间导数分布识别提取参考基频,从而实现相位解调.利用该方法进行了三维形貌测量的实验,结果表明该方法在实现相位解调中效果良好.     

单幅条纹图相位解调的小波分析方法

相位解调是条纹相位分析的关键问题.本文提出一种应用小波频率估计联合频率导数对变形条纹进行瞬时频率分析,从中提取参考基频,从而依靠单一变形条纹实现相位解调的方法.首先,理论上证明了当变形条纹瞬时频率空间导数等于零,该空间点的瞬时频率等于参考基频频率;其次,引入Gabor小波提取变形条纹的瞬时频率空间分布,利用变形条纹瞬时频率的空间导数分布识别提取参考基频,从而实现相位解调.利用该方法进行了三维形貌测量的实验,结果表明该方法在实现相位解调中效果良好.     

Study on Fourier transforms profilometry based on bi-color projecting

Projecting a bicolor sinusoidal fringe pattern consisting of two interlaced RGB format base color fringe patterns with π phase difference onto an object thought digital light projector, we can capture a deformed color pattern by color digital camera, then decode two individual sinusoidal fringe patterns with π phase difference by color-separating technique. Accessing these two fringe patterns, not only are zero-order spectra eliminated, but mask function is also built to mark valid unwrapping area in FTP, automatically.Moreover, because the wrapped phase just inside the valid areas is needed unwrapping, we can mark these areas with mask function, which avoids the error transferring resulting from unwrapping the invalid areas and shortens the unwrapping time. Furthermore, in Fourier transform processing, the full-field deformed fringe pattern generally needed to guarantee measurement precision can be formed by expanding non-full-field fringe pattern captured using the mask function.     

Automatic fringe analysis for moiré topography

Two digital systems are developed for the automatic measurement of 3-D shapes using moiré techniques—an automatic 3-D shape measuring system using the scanning moiré method and an interactive fringe analysing system for moiré fringe photographs. In the automatic 3-D shape measuring system, a deformed grating is scanned and sampled with an electronic image scanning device so that moiré fringes are generated in a computer. This technique of electronic fringe generation eliminates ambiguity with regard to the sign of the moiré fringes. The interactive fringe analyser provides a flexible and versatile tool for moiré fringe analysis. Medical applications of these analysing systems are discussed.     

一种分析薄膜振动模式的结构光条纹时间平均法

提出了一种用于振动物体表面快速测量的光学测试系统和方法。该系统采用结构光三维传感技术,利用时间平均法来实现对振动表面的测量和振动模式分析。用低帧频商用CCD相机记录由光栅投影到振动物体表面上形成的一系列变形正弦条纹,对获取的一帧变形条纹经过二维傅里叶变换、频谱滤波、逆傅里叶变换等处理得到调制物体振幅的零级贝塞尔函数分布。给出了该方法的理论分析,推导了相应的计算公式。计算机模拟和实验验证了该方法的可行性。实验证明,该方法具有数据获取速度快,全场非接触测量以及实验装置简单等优点。     

Defect information detection of a spare part by using a dual-frequency line-scan method

The surface defect of a moving spare part is measured by a line-scan system online. The experimental system is combined with a line-scan CCD, a LCD projector, a translation stage, and a personal computer. The deformed fringe patterns of the spare part can be captured and stored in the personal computer. The Fourier transform method is used to extract the fringe deformation. Following the geometric relationship between the fringe deformation and the surface height, the full-field surface 3D information can be obtained. Furthermore, the projection dual-frequency composite grating technique is used to solve 2π phase ambiguity problem because of some bigger surface defect steps. Some experimental results are presented to prove the feasibility of the proposed method and the inspection system.     

Modified polarization point diffraction interferometer with extended measurable NA for spherical surface testing

The small pinhole of point diffraction interferometer based on pinhole-point diffraction places ultra-high requirement on both the adjustment of testing system and performance of CCD camera. Besides, poor fringe contrast due to the low reflectivity of test spherical surface would limit the measurement precision in the processing of fringe pattern. A modified polarization point diffraction interferometer with extended measurable numerical aperture (NA) is presented for testing the spherical surfaces with low reflectivity. Measurement error factors as well as the corresponding calibration procedure are introduced in detail. Comparing with the results of Zygo interferometer, measurement accuracy with root-mean-square (RMS) value about 0.0026λ and peak-to-valley (PV) 0.0134λ is achieved. The system has good measurement repeatability, and the standard deviation of measurement results RMS better than 0.0010λ is obtained. The proposed interferometer reduces the difficulty in the adjustment of the system and provides a feasible way for testing the surfaces with low reflectivity and high NA.     

Absolute fringe order calculation using optimised multi-frequency selection in full-field profilometry

We present novel algorithms using multi-frequency analysis for full-field profilometry. The technique provides absolute order of interference in an interferogram. The process is based on an optimisation criterion to utilise the minimum number of projected fringe frequencies to give the largest possible measurement dynamic range. The algorithms presented have been generalised for n frequencies. A set of solutions for three-frequency interferometry is presented that satisfies the optimisation criterion. Results are presented for 3 projected fringe frequencies and we demonstrate by simulation that the approach is indeed optimal. The algorithms given are generic and are equally applicable to any metrological measurement using interferometry.     

Shifted-phase calibration for a 3-D shape measurement system based on orthogonal composite grating projection

This paper proposes a novel method for reducing measurement error caused by spectrum overlapping in orthogonal-composite-grating-based 3-D measurement method. For 3-D measurement systems based on orthogonal composite grating projection, spectrum overlapping causes phase of each deformed phase-shifting fringe changed differently, which violates the principle that the shifted phases between adjacent deformed fringes must be equivalent to 2π/3, and therefore results in phase measurement error. The proposed shifted-phase calibration method is based on that phase variation of each deformed fringe is independent of height and reflectivity of the measured object. Three composite gratings are projected on the reference plane, and each carrier channel includes three phase-shifting gratings needed in phase measuring profilometry (PMP). Because the adjacent phase-shifting fringes demodulated from the same carrier channel have the phase difference of 2π/3, we can respectively calculate the reference plane's phases of three carrier channels by the phase algorithm of PMP method, and the shifted phases between them are obtained. When an object is measured, the shifted phases between deformed phase-shifting fringes can be calibrated. A new 3-D measurement mathematical model is set to reconstruct object. Our experiments prove that the proposed method can effectively restrain the effect of spectrum overlapping and improve measurement accuracy almost one times.     

Application of robust color composite fringe in flip-chip solder bump 3-D measurement

This study developed a 3-D measurement system based on flip-chip solder bump, used fringes with different modulation intensities in color channels, in order to produce color composite fringe with robustness, and proposed a multi-channel composite phase unwrapping algorithm, which uses fringe modulation weights of different channels to recombine the phase information for better measurement accuracy and stability. The experimental results showed that the average measurement accuracy is 0.43μm and the standard deviation is 1.38 µm. The results thus proved that the proposed 3-D measurement system is effective in measuring a plane with a height of 50 μm. In the flip-chip solder bump measuring experiment, different fringe modulation configurations were tested to overcome the problem of reflective coefficient between the flip-chip base board and the solder bump. The proposed system has a good measurement results and robust stability in the solder bump measurement, and can be used for the measurement of 3-D information for micron flip-chip solder bump application.     

Analysis on 3D object measurement based on fringe projection

A coordinate measuring method is presented, which is specially devised to perform the measurement of coordinates with projected fringe techniques of projectors in three dimensions. The system is composed of two parts: one is a target which can move freely in three dimensions, and the other is a stationary two-dimensional array of photodetectors. The mini-projector is tied to the target, and the projected fringe is monitored by the photodetectors. The phase of the photodetectors can be precisely measured with the phase-shifting algorithm, so that, the xyz location of the target can be determined with the geometric model of multilateration using the method of optimization. In this paper, the measuring principle, iterative method, computer simulation and preliminary results are given. The phase-shifting technique has the advantages of high accuracy and noise endurance. The method will provide the basis for follow-up iterative optimization calculation. The experimental results prove that the proposed coordinate measuring method is of high precision.     

一种用于在线三维测量的五步非等步相移算法

提出了一种五步非等步相移算法,并成功应用于在线三维测量中。仅投影一固定正弦光栅条纹到物体上,通过物体在线运动产生等效相移,在一个条纹周期范围内任意采集五帧变形条纹图,通过像素匹配使各帧条纹图中的物点一一对应并计算出相应的等效相移量。采用所提出的五步非等步相移算法,即可重构物体。计算机模拟与实验验证了该方法的可行性和有效...     

Rapid 3D surface profile measurement of industrial parts using two-level structured light patterns

This paper aims to present a rapid 3D shape measurement system based on novel monochromatic structured light patterns. The system consists of projectors shooting the fringe patterns onto the inspected parts and cameras recording the corresponding distorted images. Using the two-level fringe patterns, the correspondence between the projector image and camera image can be established with sub-pixel accuracy. The two-level pattern is based on three spatiotemporal binary stripes, in which the value of the stripe boundary (first-level coding) is determined by the two adjacent stripes patterns over time and the codeword of the strip boundary (second-level coding) depends on its values and neighbor boundary values in space. The proposed pattern is robust to ambience light variation and part texture. Moreover, the occlusion can be overcome and high density measurement can be achieved. Experiments with different 3D parts are conducted to evaluate the robustness and accuracy of the inspection system using the two-level patterns. The results show that the system has desired properties of high accuracy, high density, rapid acquisition, and robustness, which are essential for industrial application.     

Microscopic structured light 3D profilometry: Binary defocusing technique vs. sinusoidal fringe projection

This paper compares the binary defocusing technique with conventional sinusoidal fringe projection under two different 3D microscopic profilometry systems: (1) both camera and projector use telecentric lenses and (2) only camera uses a telecentric lens. Our simulation and experiments found that the binary defocusing technique is superior to the traditional sinusoidal fringe projection method by improving the measurement resolution approximately 19%. Finally, by taking the speed advantage of the binary defocusing technique, we presented a high-speed (500 Hz) and high-resolution (1600×1200) 3D microscopic profilometry system that could reach kHz.     

BP neural network applied to 3D object measurement based on fringe pattern projection

In the fringe projection profilometry, the traditional triangle method, such as Fourier-transform profilometry (FTP), is difficult to recover the stepped shape object from the deformed fringe pattern. In order to solve this problem, the neural network is introduced to deal with this kind of fringe patterns and gain the three-dimensional (3D) information of the measured object. By training the network, the relationship between the deformed fringe pattern and the height of the object can be obtained, and thereby the height of the object can be obtained. Furthermore, the object can be reconstructed perfectly without knowing the optical parameters of the experiment system. An obvious merit of this network method is that it can recover the 3D object in a short time and only need one deformed fringe pattern. Computer simulations and experiment validate the feasibility of the method.