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GaN基p-i-n型雪崩探测器的制备与表征
引用本文:李广如,秦志新,桑立雯,沈波,张国义.GaN基p-i-n型雪崩探测器的制备与表征[J].发光学报,2011,32(3):262-265.
作者姓名:李广如  秦志新  桑立雯  沈波  张国义
作者单位:北京大学物理学院人工微结构和介观物理国家重点实验室;
基金项目:Projects supported by National Natural Science Foundation of China Grant(10774001,60736033,60876041,60577030)~~
摘    要:制备和表征了p-i-n型的GaN基雪崩探测器.器件在-5V下的暗电流约为0.05 nA,-20 V下的暗电流小于0.5 nA.响应增益-偏压曲线显示,可重复的雪崩增益起始于80 V附近,在85 V左右增益达到最大为120,表明所制备的器件具有较好的质量.C-V测量用来确定载流子的分布和耗尽信息,结果显示,P型层在15 ...

关 键 词:紫外探测器  雪崩  碰撞电离

Fabrication and Characterization of GaN Based P-i-n Avalanche Photodetectors
LI Guang-ru,QIN Zhi-xin,SANG Li-wen,SHEN Bo,ZHANG Guo-yi.Fabrication and Characterization of GaN Based P-i-n Avalanche Photodetectors[J].Chinese Journal of Luminescence,2011,32(3):262-265.
Authors:LI Guang-ru  QIN Zhi-xin  SANG Li-wen  SHEN Bo  ZHANG Guo-yi
Affiliation:LI Guang-ru,QIN Zhi-xin*,SANG Li-wen,SHEN Bo,ZHANG Guo-yi (State Key Laboratory of Artificial Microstructure and Mesoscopic Physics,School of Physics,Peking University,Beijing 100871,China)
Abstract:p-i-n GaN based avalanche UV photodetectors were fabricated and characterized.Dark current of the device is as low as 0.05 nA at the reverse bias of 5 V and <0.5 nA at 20 V.Repeatable photocurrent avalanche gain,began at around 80 V and grew up to a peak of 120 at about 85 V,demonstrating a good material quality.C-V mea-surement was used to determine carrier distribution and depletion information,and it showed that p-layer fully depleted at reverse bias of about 15 V,resulting in a hole concentration of 1.9...
Keywords:UV photodetector  avalanche  impact ionization  
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