基于等效层法分析对称性倍频分束镜的半波孔

半波孔问题严重影响了倍频分束镜在高功率激光系统中的应用.为研究半波孔的产生机理,分别模拟了由高、低折射率膜层厚度失配和膜料色散失配引起的1/4波长对称规整膜系的半波孔.基于等效层理论,在Matlab 平台上计算膜系的等效折射率E,绘出其对应的反射率极值包络曲线.通过研究对称膜系的等效折射率、反射率光谱和反射率包络之间的关系,从原理上分析了半波孔的大小、位置和变化趋势等特点.结果表明,膜层的厚度失配使对称膜系的等效折射率在光谱半波处产生截止带.膜层数越多,膜层厚度和膜料色散的失配越严重,则倍频分束镜的半波孔越深.     

一种抑制二倍频半波孔现象的短波通设计方法

短波通滤色片是光学系统,尤其是激光系统中普遍使用的一种薄膜,它的基本结构为(0.5LH0.5L)N。但薄膜的非均质性会产生半波孔现象,从而影响滤色片的光学特性。利用导纳技术分析了折射率非均质性产生半波孔现象的原因:非均质性使常规膜系基本周期内导纳轨迹的终点偏离起点;这种偏离越大,半波孔现象就越严重。优化了常规膜系的基本周期结构,通过在高低折射率膜层之间引入导纳匹配层,使得改良后的基本周期导纳轨迹的终点与起点偏差大大减小,提高了半波处的透射率,从而提出了一种可以抑制由非均质性引起的半波孔现象的短波通设计方法,并依据实际制备工艺进行了误差分析。最终成功制备出了具有超宽透射带的短波通滤色片,实验和理论曲线具有很好的一致性。     

电光调制晶体半波电压倍频测量方法的讨论

在电光调制晶体的半波电压倍频法测量中,基于晶体电光效应分析了不同偏压下输出信号与调制信号之间的线性与倍频关系,并利用计算机模拟分析了调制信号的调制幅度对倍频信号的影响,分析结果表明倍频信号受高阶谐波分量的干扰产生波形畸变,不利于晶体半波电压的倍频法测量。提出利用李萨如图形的对称性来确定电光调制的倍频位置,克服了调制幅度波形畸变问题的干扰。通过对半波电压不同测量方法的实验测量和对比分析,说明该方法可操作性好,测量精确度也比直接观察倍频信号输出波形要高。     

高损伤阈值三倍频分离膜

设计了Nd：YAG激光用三倍频分离膜,膜层材料为SiO2和HfO2。经过优化,膜系在355 nm处的反射率在99%以上,在532 nm和1 064 nm处透射率也在99%以上。采用电子束蒸发技术,在熔融石英基底上制备了样品,经测量,制备的分离膜光学性能与设计值接近。分离膜在355 nm激光辐照下的损伤阈值为5.1 J/cm2,并用微分干涉显微镜表征了薄膜损伤形貌。     

高损伤阈值三倍频分离膜

 设计了Nd：YAG激光用三倍频分离膜,膜层材料为SiO₂和HfO₂。经过优化,膜系在355 nm处的反射率在99%以上,在532 nm和1 064 nm处透射率也在99%以上。采用电子束蒸发技术,在熔融石英基底上制备了样品,经测量,制备的分离膜光学性能与设计值接近。分离膜在355 nm激光辐照下的损伤阈值为5.1 J/cm²,并用微分干涉显微镜表征了薄膜损伤形貌。     

膜层渗透产生短波通截止滤光片半波孔现象的分析

半波孔现象的出现会极大地影响短波通截止滤光片的光谱性能,已有文献报道膜料色散、膜层折射率非均匀性以及膜厚控制误差积累等是产生半波孔现象的几个可能因素。本文通过模拟计算发现膜层间的相互渗透也是产生半波孔现象的重要原因之一,分析表明不同的渗透模式对半波孔现象的形成及大小具有不同的影响。     

1 064 nm激光与远红外共窗口成像系统波长分离膜的研制

根据激光与远红外共窗口成像系统的技术要求,研制了一种波长分离膜,实现通过共窗口的激光与远红外光分离成像,即1064nm高反射、8~14μm高透射.分析薄膜的微观结构,研究了薄膜材料吸潮前后的折射率变化,结合光学薄膜理论,优化膜系结构.在薄膜应力的基础上,优化膜层厚度,提高薄膜牢固性.研制的分离膜,1064nm反射率为99.71%,8~12μm平均透过率为97.1%,12~14μm平均透过率为90.1%,满足户外环境中长期使用的要求.     

一种用于Yb:YAG激光器的波长分离膜的研制

以1 030 nm高反,940,980 nm高透的波长分离膜作为实例,为提高该薄膜元件的波长分离效果,从膜系的优化方面做了一系列的研究,诸如采用带通滤光片的设计思想,在膜堆两侧加入了匹配层,调整膜堆的周期厚度,并用膜系设计软件对通带作进一步的优化.通过这一系列的优化设计后,利用RF双离子束溅射工艺在BK7玻璃基底上沉积样品薄膜,并在基底背面加镀通带增透膜.结果显示,透射带在940和980 nm处的透过率分别为97.73%和93.63%,反射带在1 030 nm的反射率为99.99%.对所制备的样品薄膜进行了激光损伤阈值测量,得到了35 J/cm2(1 064 nm,12 ns)的结果.     

1 053，527，351 nm倍频分离膜的制备与性能研究

用电子束蒸发及光电极值监控技术在石英基底上沉积了三倍频分离膜,将部分样品置空气中于250 ℃温度下进行3 h热退火处理。然后用Lambda900分光光度计测量了样品的光谱性能;用表面热透镜技术测量了样品的弱吸收值;用调Q脉冲激光装置测试了样品分别在355 nm和1 064 nm的抗激光损伤阈值。实验结果发现,样品的实验光谱性能良好,退火前后其光谱性能几乎没有发生温漂,说明薄膜的温度稳定性好;同时弱吸收平均值从退火前的1.07×10-4下降到退火后的6.2×10-5,从而使对基频的抗激光损伤阈值提高,从14.6 J/cm2上升到18.8 J/cm2,但是三倍频阈值在退火后有显著降低,从7.5 J/cm2下降到2.5 J/cm2。     

1 053，527，351 nm倍频分离膜的制备与性能研究

 用电子束蒸发及光电极值监控技术在石英基底上沉积了三倍频分离膜，将部分样品置空气中于250 ℃温度下进行3 h热退火处理。然后用Lambda900分光光度计测量了样品的光谱性能；用表面热透镜技术测量了样品的弱吸收值；用调Q脉冲激光装置测试了样品分别在355 nm和1 064 nm的抗激光损伤阈值。实验结果发现，样品的实验光谱性能良好，退火前后其光谱性能几乎没有发生温漂，说明薄膜的温度稳定性好；同时弱吸收平均值从退火前的1.07×10^-4下降到退火后的6.2×10^-5，从而使对基频的抗激光损伤阈值提高，从14.6 J/cm²上升到18.8 J/cm²，但是三倍频阈值在退火后有显著降低，从7.5 J/cm²下降到2.5 J/cm²。     

Acoustic method for obtaining the pressure reflection coefficient using a half-wave layer

This paper describes a method for obtaining the pressure reflection coefficient by using a half-wave layer. Two transducers were placed in reference liquid and test liquid respectively. The reference and test liquid were separated by the thin half-wave layer. Both transducers could operate in two modes. One acted as a transmitter and worked in pulse-echo mode, and the other operated in receiver mode. By adjusting the frequency of drive signal according to the thickness and material property of the half-wave layer, it was possible to generate the maximum interference signal of multiple waves reflected at the two interfaces of the layer. Therefore, the amplitude of reflection wave in steady-state depended only on the reflection coefficient at the interface between the half-wave layer and the test liquid. The effects of the signal-to-noise-ratio and the half-wave layer attenuation on the uncertainty characteristics of the pressure reflection coefficient were discussed. The experimental results showed high accuracy for measurement of reflection coefficient.     

The refractive index enhancement at Eg in narrow-gap semiconductors: comparison between the interband absorption edge and the oscillator model

A comparison is made between the refractive index enhancement near the M₀-type absorption edge in direct narrow-gap semiconductors and the dispersive structure of a Lorentz oscillator. Phenomenologically, both absorptive structures can be described by three parameters, and the analogy between both models concerning n(E) is discussed. Examples for the predicted dependencies are given. With increasing energy gap the n(E) enhancement becomes related to discrete excitonic bands rather than to free-to-free transitions, thereby undergoing a spectral shift from energies above gap to energies below gap.     

单光分束器的量子变换算符研究

针对理想情况下单光分束器,得到了其对应的变换矩阵.用相干态表象和有序算符内积分技术,给出其对应的幺正变换算符.纠缠态的实验制备方案,说明单光分束器在量子信息源研究中具有十分重要的作用.     

薄膜层数对偏振分束棱镜性能的影响

采用电子枪蒸镀离子源辅助技术,讨论了薄膜层数对偏振分束棱镜性能的影响.结果表明:随着薄膜层数的增加,p偏振光的透射率逐渐增大,s偏振光的透射率逐渐减小,p偏振光和s偏振光透射率的比值逐渐增大.     

Measurement of modulation index and half-wave voltage of an electro-optical phase modulator with a dispersion-based phase filter

In this paper, a novel method based on the use of an optical phase filter is proposed to evaluate the modulation index, as well as the half-wave voltage of an optical phase modulator. When a phase modulated signal propagates along the length of a dispersive fiber, the fiber dispersion acts as an optical phase filter and spectrally alters the relative phasing of the phase modulated signal, causing the phase modulation to become intensity modulation, which allows the swept frequency measurement of phase modulators by using a vector network analyzer. The modulation index and half-wave voltage as a function of the modulation frequency are experimentally measured for a commercial phase modulator, which agree well with the results obtained using the widely accepted optical spectrum analysis method. The proposed method requires only a length of dispersive fiber and works without any small-signal approximation, which is applicable for different driving levels and operating wavelengths with the same setup.     

On use of ghost-less beam splitter in reversal shear interferometer for measurement of spatial coherence of large cross-section laser beam

A configuration of reversal shear interferometer suitable for measurement of spatial coherence of high average power, large cross-section laser beam has been discussed. Ghost-less beam splitters in which unwanted multiple reflections from the surfaces have been suppressed by total internal reflection are used for beam splitting and re-combination. Advantages and drawbacks of this configuration have been discussed.     

Design and fabrication of ultra-high precision thin-film polarizing beam splitter

An ultra-high precision thin-film polarizing beam splitter (PBS) has been designed and fabricated. Using Needle optimization technology, we design the thin-film polarizing beam splitter that is transparent for P polarization and reflective for S polarization with ultra-high precision at 64.8° angle of incidence and 632.8 ± 10 nm wavelength band. The experiments with the fabricated thin-film PBS demonstrate that both the reflectance of P polarization and transmittance of S polarization at 64.8° angle of incidence and 632.8 nm wavelength point are less than 0.02%, which is ultra-high for reported PBSs.     

A spatial electrostatic beam splitter for polar molecules in weak-field-seeking states

A spatial electrostatic beam splitter composed of six charged poles for polar molecules in weak-field-seeking states is proposed. First, the schematic diagram is given. With the help of finite element software the spatial distribution of the electrical field is calculated. The dynamic process of the loading and splitting polar molecules is simulated using the classical Monte Carlo method. The influences of the longitudinal velocity of the incident molecular beam and the voltages on the loading efficiency are studied. Two output arms of the beam splitter can be cut off at a certain position to adjust the splitting ratio of the molecular beam. Then the influences of the voltages and cutting positions on the splitting ratio are investigated. The results indicate that the splitting ratio can be manipulated conveniently from 0% to 100%.     

Interferometric determination of refraction and dispersion of a birefringent material: non-numerical procedure

Fringes of equal chromatic order are produced in air, immersion liquid and mica sample interferometric gaps. The three gaps are of the same thickness and simultaneously enclosed in a wedge interferometer. A single-shot interferogram contains fringes in the three gaps is sufficient to deduce the needed experimental data. A non-numerical procedure is used for determining the refractive indices of the immersion liquid and mica sample across the visible spectrum. There is no need for any numerical fitting stage nor for the application of any theoretical model concerning the dispersion behavior of the sample under test. A modified two-term Sellmeier dispersion formula has been used for fitting the experimental data and deducing the needed dispersion parameters.