紫外光激发下氧化锌纳米线的发光特性研究

室温条件下,用355 nm的激光激发氧化锌纳米线,测量了其发光光谱.观察到半宽度较小、峰值波长约382 nm的紫光峰和半宽度较宽、峰值波长约507 nm的绿光峰;两峰的发光强度随激发光功率密度的变化而变化,且均存在饱和效应,但各自的变化规律及饱和值的大小不同;紫光峰的中心波长随激发光功率密度的增加而发生了明显的红移.对两峰产生的机理、强度饱和值存在的原由、强度随激发光功率密度变化及紫光峰红移的起因进行了分析.     

n型多孔硅光致发光研究

对在无光照条件下,电化学阳极腐蚀方法制备的n型多孔硅进行了光致发光性能研究.在325nm的激发光照射下,多孔硅样品的发光峰在620nm处,其橙红色的发光肉眼可见,并随阳极电流密度与腐蚀时间乘积的增加.先增强,后减弱.其发光峰位置与量子限制效应、表面态及缺陷态有关,发光强度与样品表面深度较浅孔洞所占的面积比成正比.     

ZnO纳米线阵列的定向生长、光致发光及场发射性能

采用光刻和脉冲准分子激光沉积技术在Si衬底上制备了图形化的ZnO种子层薄膜。分别采用气相输运和水热合成法,制备了最小单元为30μm的图形化的垂直定向生长的ZnO纳米线阵列。X射线衍射(XRD)分析显示ZnO纳米线阵列具有高度的c轴[001]择优取向生长特性。从扫描电子显微镜(SEM)照片看出,阵列图形完整清晰,边缘整齐。纳米线阵列室温下光致发光(PL)谱线中在380nm左右具有强烈的紫外发射峰,可见光区域发射峰得到了抑制,证明ZnO纳米线缺陷少,晶体质量高。场致电子发射测量表明,ZnO纳米线阵列开启电场和阈值电场分别为2.3,4.2V/μm,具有较好的场致电子发射性能。     

ZnO纳米线的制备

利用磁控溅射技术在Si衬底上沉积的锌膜进行热氧化后,得到一维ZnO纳米线。     

Y掺杂Si纳米线的光致发光特性

以n型单晶Si(111)为衬底,利用Au作为催化剂,在温度、N₂流量和生长时间分别为1 100 ℃,1.5 L·min-1和60 min的条件下,基于固-液-固生长机制,生长了直径为60～80 nm、长度为数十微米的高密度Si纳米线。随后,以Y₂O₃粉末为掺杂源,采用高温扩散方法对Si纳米线进行了钇(Y)掺杂。利用扫描电子显微镜、X射线衍射仪和荧光分光光度计对不同掺杂温度(900～1 200 ℃)、掺杂时间(15～60 min)和N₂流量(0～400 sccm)等工艺条件下制备的Y掺杂Si纳米线的形貌、成分、结晶取向以及激发光谱和发射光谱特性进行了详细的测量和表征。结果表明,在掺杂温度为1 100 ℃,N₂流量为200 sccm、掺杂时间为30 min和激发波长为214 nm时,Y掺杂Si纳米线样品表现出较好的发光特性。样品分别在470～500和560～600 nm范围内出现了两条发光谱带。560～600 nm的发光带由两个发光峰组成,峰位分别为573.6和583.8 nm,通过结构分析可以推测,这两个发光峰是由Y3+在Si纳米线的带隙中引入的杂质能级引起的。而470～500 nm较宽的发光带同样来源于Y离子在Si纳米线带隙中引入的与非晶SiO_x壳层中氧空位能级十分接近的杂质能级。     

ZnO/CuO 核壳结构纳米线光致发光性能 与CuO壳层厚度的关系

通过分别生长核层与壳层制备出了ZnO/CuO核壳结构的纳米线。形貌和结构分析表明,ZnO核为单晶纳米线而CuO则以多晶形式覆盖在核层表面上。光致发光(PL)研究表明,ZnO纳米线PL强度随CuO壳层厚度的变化而变化。当壳层比较薄时ZnO的PL强度增大,这主要是由于CuO壳层对ZnO核层的修饰减少了表面态,而当壳层厚度增加到一定程度时,ZnO的PL强度不再变化,这主要是由于在核壳结构中形成了type-I型结构的原因。我们对这一现象做了详细的讨论。     

Photoluminescence study of ZnO nano-islands

ZnO nano-islands, with much more uniform size, have been grown through two-step method by metal organic chemical vapor deposition (MOCVD). The room temperature band-edge UV emission intensity of nano-islands was usually undetectable or much smaller than that of thin film. Photoluminescence (PL) emission of those nano-islands shows the high intensity nearly as that of ZnO thin film, which is great different from previous reports. By meaningfully analyzing both PL and growth condition of those three samples (bulk ZnO wafer, nano-islands and film), neutral-donor-bound-exciton (D⁰X) emission observed on ZnO nano-islands sample is eventually attributed to hydrogen and aluminum, respectively. The abnormal phenomenon of nano-islands PL intensity has been explained by the point of zinc vacancies (V_Zn) complex defects. It is considered to govern the nonradiative combination and lead enhanced intensity of UV emission in ZnO nano-islands.     

Fe掺杂ZnO纳米薄膜的光致发光

采用溶胶-凝胶法制备了Zn_1-xFe_xO(x=0.01,0.05,0.10)纳米薄膜。X射线衍射谱显示所有样品均具有六角纤锌矿结构。而且在X射线衍射谱中没有发现其他相存在。研究了在不同的溶液浓度、退火温度和Fe浓度下制备的掺杂ZnO薄膜的光致发光谱。结果表明,热退火提高了样品的光学质量。溶液浓度为0.1mol/L,且Fe含量较低的条件下,样品的光学质量有所提高。     

掺杂和未掺杂氧化锌薄膜的拉曼光谱

利用拉曼光谱分别对不同衬底上,未掺杂和掺杂以及掺杂浓度不同的ZnO薄膜进行了系统的分析研究。其中ZnO薄膜均由溶胶-凝胶法制得,掺杂源为LiCl。测得的拉曼光谱显示,Pt/Ti/SiO2/Si衬底上生长的ZnO薄膜的拉曼特征峰(437cm-1)的强度明显高于SiO2/Si衬底上ZnO薄膜的拉曼特征峰的强度,说明Pt/Ti/SiO2/Si衬底上ZnO的晶化程度比SiO2/Si上ZnO的晶化程度高;但ZnO拉曼特征峰的位置和半高宽并没有发生变化,说明两种衬底上ZnO薄膜中应力大小没有发生变化。掺Li+后,580cm-1处的峰位向高频方向移动,且掺杂浓度越大频移量越大,说明掺杂已经在不同程度上引起了ZnO晶体中自由载流子浓度的变化。此外,还分析了掺Li+未在很大程度上引起ZnO晶格畸变的原因。     

非晶碳氧化硅纳米线的合成与光致发光

利用直流电弧放电合成非晶碳氧化硅(SiCO)纳米线,不使用催化剂和模板,独立的SiCO 纳米线沉积在石墨锅的表面．通过XRD、SEM、TEM、XPS、FTIR等对SiCO纳米线进行了表征．结果表明,纳米线长度为20～100 μm,直径为10～100 nm,Si原子同C原子和氧原子分享成键组成SiCO单元．SiCO纳米线的光致发光谱在454和540 nm呈现了强而稳定的白色发光峰． SiCO纳米线的生长机制为等离子辅助气―固生长机制．     

First-Principles Study of Fe-Doped ZnO Nanowires

Using first-principles theory,we predict magnetic,electronic and optical properties in Fe-doped ZnO nanowires.The results show that ferromagnetic(FM)coupling of...     

Photoluminescence from electron irradiated ZnO

Photoluminescence of ZnO ceramics irradiated with electrons of 0.8 MeV and 2.6 MeV energy has been investigated. The irradiated samples have been annealed in air at temperatures up to 1100° C. Irradiation causes quenching of the PL green band and as a consequence a peak at 470 nm emerges. Results indicate that part of the quenching can be attributed to damage in the oxygen sublattice.     

Nonlinear Photoluminescence from ZnO Nanobelts

The nonlinear photoluminescence （PL） including second-harmonic generation （SHG） and the multiphoton luminescence （MPL） around 385 nm and 530 nm from ZnO nanobelts are investigated by using near-infrared excitations. The excitation wavelength dependence of MPL intensity reveals resonant energy transfer from SHG to MPL near the band gap excitation. The lifetime measurement of the MPL shows a much slower decay process of the defect emission, which results from the generation and recombination of both donors and acceptors on the disordered surface of the ZnO nanobelts.     

Photoluminescence properties of Co-doped ZnO nanocrystals

We performed photoluminescence experiments on colloidal, Co²⁺-doped ZnO nanocrystals in order to study the electronic properties of Co²⁺ in a ZnO host. Room temperature measurements showed, next to the ZnO exciton and trap emission, an additional emission related to the Co²⁺ dopant. The spectral position and width of this emission does not depend on particle size or Co²⁺ concentration. At 8 K, a series of ZnO bulk phonon replicas appear on the Co²⁺-emission band. We conclude that Co²⁺ ions are strongly localized in the ZnO host, making the formation of a Co²⁺d-band unlikely. Magnetic measurements revealed a paramagnetic behaviour.     

Surface-Induced Enhancement of Piezoelectricity in ZnO Nanowires

Piezoelectric nanowires are promising building blocks in various micro-electromechanical systems. Using firstprinciples calculations, we systematically investigate the influence of surface and volume changes on piezoelectric coefficients in [001]-oriented ZnO nanowires and hollow nanowires. We find that the increased non-axial ion displacements under strain near the {100} surface cause a notable enhancement in piezoelectric coefficients for these nanowires. Furthermore, by introducing the obtained surface modifications, we break through the limitation of simulation size and obtain the piezoelectric coefficients at the experimental size. Our findings are of importance to expand simulations and guide experimental explorations.     

ZnO纳米线的合成与生长机理

采用化学气相沉积系统制备ZnO纳米线,以覆盖一层约5nm厚的Ag薄膜的单晶Si(001)为衬底,纳米线的生长遵循气-液-固(VLS)机理。对得到的样品采用X射线衍射(XRD)和扫描电镜(SEM)进行晶体结构和形貌的表征。XRD结果表明衬底温度在600~700℃时生长的ZnO纳米线具有六方结构和统一的取向。通过扫描电子显微镜分析,比较了生长温度对纳米线直径和长度的影响。实验表明我们可以通过催化剂和温度来实现ZnO纳米线生长的可控。与传统的VLS生长方式不同的是在我们制备的ZnO纳米线顶端并没有看到催化剂颗粒,表明纳米线的生长方式是底部生长,我们对其生长机理进行了研究。     

氧化锡纳米线的拉曼光谱和光致发光光谱研究

用表面限制剂对水热法生成的前驱物加以限制生长的方法成功制备了氧化锡纳米线结构,TEM和HRTEM的结果表明该纳米线由沿[001]方向生长的氧化锡单晶组成,纳米线直径在5-10纳米、长度100-500纳米。利用拉曼光谱和发光光谱对其生长过程和发光现象进行了详细的研究,结果表明,细长的氧化锡纳米线出现356、515、691 cm-1新的拉曼振动模以及600 nm较强的光致发光。     

Tb掺杂Si纳米线的光致发光特性

以金属Au-Al为催化剂,在温度为1 100 ℃,N₂气流量为1 500 sccm、生长时间为30 min,从Si(100)衬底上直接生长了直径约为50～120 nm、长度为数百纳米的高密度、大面积的Si纳米线。然后,利用Tb₂O₃在不同温度(1 000～1 200 ℃)、掺杂时间(30～90 min)和N₂气流量(0～1 000 sccm)等工艺条件下对Si纳米线进行了Tb掺杂。最后,对Si(100)衬底进行了Tb掺杂对比。室温下,利用荧光分光光度计(Hitachi F-4600) 测试了Tb掺杂Si纳米线的光致发光特性。实验研究了不同掺杂工艺参数(温度、时间和N₂气流量)对Tb3+绿光发射的影响。根据Tb3+能级结构和跃迁特性对样品的发射光谱进行了分析。结果表明,在温度为1 100 ℃,N₂气流量为1 500 sccm、时间为30 min等条件下制备的Si纳米线为掺杂基质,Tb掺杂温度为1 100 ℃,N₂气流量为1 000 sccm、光激发波长为243 nm时,获得了最强荧光发射,其波长为554 nm(5D₄→7F₅),同时还出现强度相对较弱的494 nm(5D₄→7F₆),593 nm(5D₄→7F₄)和628 nm(5D₄→7F₃)三条谱带。Tb掺杂的体Si衬底在波长554 nm处仅有极其微弱的光致发光峰。     

厚度对未掺杂ZnO薄膜光谱性能的影响

X射线衍射光谱、拉曼光谱和紫外可见透射光谱技术是薄膜材料检测的重要技术手段.通过对薄膜材料光谱性能的分析,可以获得薄膜材料的物相、晶体结构和透光性能等信息.为了解厚度对未掺杂ZnO薄膜的X射线衍射光谱、拉曼光谱和紫外可见透射光谱性能的影响,利用溶胶-凝胶法在石英衬底上旋涂制备了不同厚度的未掺杂ZnO薄膜样品,并对薄膜样...     

Photoluminescence properties of various CVD-grown ZnO nanostructures

We have studied systematically room-temperature photoluminescence (PL) properties of many nanostructured ZnO samples grown by chemical vapour deposition (CVD). Their PL spectra consist of two emissions peaked in the ultraviolet (UV) and green regions. The relative intensity of these emissions depends on the excitation energy density, size and morphology of ZnO nanostructures. Based on the excitation-density dependence of the integrated intensity ratio of UV-to-green emission, we could classify PL spectra of ZnO nanostructures into three groups characteristic of size and morphology. Our study also reveals that with increasing excitation density, the UV-peak position shifts slightly towards longer wavelengths while the green emission around 514-520 nm is almost unchanged. This green-luminescence emission is dominant when the nanostructure sizes range from 20 to 200 nm, which is related to a large surface-to-volume ratio.