| Thickness-dependent Orientation Structure in Poly（ethylene oxide） Multi-layer Crystals |
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| 引用本文： | 周建军.Thickness-dependent Orientation Structure in Poly（ethylene oxide） Multi-layer Crystals[J].高分子科学,2014,32(9):1253-1259. |
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| 作者姓名： | 周建军 |
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| 作者单位： | [1]Beijing Key Laboratory of Energy Transition and Storage Materials, College of Chemistry, Beijing Normal University, Beoing 100875, China; [2]Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China |
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| 基金项目： | This work was financially supported by the Natural Science Foundation of China （Nos. 20634050, 20804053 and 21074015）, the Science Foundation of Beijing （No. 212030）, the National Basic Research Program of China （973 Project No. 2011 CB605605） and the Fundamental Research Funds for the Central Universities. |
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| 摘 要： | Poly(ethylene oxide) multi-layer crystals were obtained and the re-crystallization behavior was studied to give insight into how melt thickness and temperature affect the lamellar orientation. For a special re-crystallization temperature, there exists a critical transition thickness range for the occurrence of edge-on lamellar orientation. Below the critical thickness, only flat-on lamellae were observed. While above the critical thickness, both flat-on and edge-on lamellae were found and the proportion of the edge-on lamellae increases with thickness. At low re-crystallization temperatures(below 30 °C), the critical transition thickness gradually increases from about 15 nm to 35 nm when the re-crystallization temperature was increased from 20 °C to 30 °C. However, when the re-crystallization temperature is above 30 °C, the critical transition thickness becomes constant. Our results demonstrated that the lamellar orientation could be specially modified by changing the melt thickness and re-crystallization temperature.
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| 关 键 词： | 晶体厚度 取向结构 环氧乙烷 依赖性 再结晶温度 临界厚度 再结晶行为 薄片 |
Thickness-dependent orientation structure in poly(ethylene oxide) multi-layer crystals |
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| Yi-ning He,Xiao Liu,Qi Liao,Jian-jun Zhou,Hong Huo,Lin Li.Thickness-dependent orientation structure in poly(ethylene oxide) multi-layer crystals[J].Chinese Journal of Polymer Science,2014,32(9):1253-1259. |
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| Authors: | Yi-ning He Xiao Liu Qi Liao Jian-jun Zhou Hong Huo Lin Li |
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| Institution: | 1. Beijing Key Laboratory of Energy Transition and Storage Materials, College of Chemistry, Beijing Normal University, Beijing, 100875, China
2. Institute of Chemistry, Chinese Academy of Sciences, Beijing, 100190, China
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| Abstract: | Poly(ethylene oxide) multi-layer crystals were obtained and the re-crystallization behavior was studied to give insight into how melt thickness and temperature affect the lamellar orientation. For a special re-crystallization temperature, there exists a critical transition thickness range for the occurrence of edge-on lamellar orientation. Below the critical thickness, only flat-on lamellae were observed. While above the critical thickness, both flat-on and edge-on lamellae were found and the proportion of the edge-on lamellae increases with thickness. At low re-crystallization temperatures (below 30 °C), the critical transition thickness gradually increases from about 15 nm to 35 nm when the re-crystallization temperature was increased from 20 °C to 30 °C. However, when the re-crystallization temperature is above 30 °C, the critical transition thickness becomes constant. Our results demonstrated that the lamellar orientation could be specially modified by changing the melt thickness and re-crystallization temperature. |
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| Keywords: | PEO multi-layer crystal Lamellar orientation Re-crystallization temperature |
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