On thickness dependence of electrical and optical properties of Te thin films |
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Authors: | M Rusu |
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Institution: | (1) “Al. I. Cuza” University, Faculty of Physics, Bd. Copou, 11, R-6600, Iassy, Romania (Fax: +40-32/213330, E-mail: rusugxg@uaic.ro), RO |
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Abstract: | Received: 1 July 1997/Accepted: 6 August 1997 |
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Keywords: | PACS: 68 55 Jk 73 61 Cw 78 66 Db |
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