| 利用线阵CCD测量透明介质折射率 |
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| 引用本文： | 花世群.利用线阵CCD测量透明介质折射率[J].大学物理,2004,23(6):51-53. |
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| 作者姓名： | 花世群 |
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| 作者单位： | 江苏大学,理学院,江苏,镇江,212013 |
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| 摘 要： | 根据光线穿过厚度均匀的透明介质平板时所产生的横向偏移量，提出了一种利用线阵CCD和计算机测量透明介质折射率的新方法．该方法充分利用了线阵CCD分辨率高的特点，并且具有一定的实用价值和应用前景．
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| 关 键 词： | CCD 透明介质 折射率 |
| 文章编号： | 1000-0712(2004)06-0051-03 |
| 修稿时间： | 2003年1月8日 |
Measuring index of refraction of transparent medium with linear CCD |
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| HUA Shi-qun.Measuring index of refraction of transparent medium with linear CCD[J].College Physics,2004,23(6):51-53. |
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| Authors: | HUA Shi-qun |
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| Abstract: | According to the traverse deviation of light caused by passing through a transparent medium plate of even thickness, a new method of measuring index of refraction of transparent medium by means of CCD and computer is proposed. This method uses linear array CCD characteristic with high resolution capacity and has certain practical value and application prospect. |
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| Keywords: | CCD transparent medium index of refraction |
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