| ICP-AES法测定金属硅中的Al、B、Ba、Ca、Cr、Cu、 Fe、Mg、Mn、Ni、Sr、Ti、V和Zn杂质元素 |
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| 引用本文： | 张桂广,黄奋,孙晓纲.ICP-AES法测定金属硅中的Al、B、Ba、Ca、Cr、Cu、 Fe、Mg、Mn、Ni、Sr、Ti、V和Zn杂质元素[J].光谱学与光谱分析,2000,20(1):71-73. |
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| 作者姓名： | 张桂广 黄奋 孙晓纲 |
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| 作者单位： | 广东省韶关进出口商品检验局,512023,韶关 |
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| 摘 要： | 本文提供了一种测定金属硅中Ｂ，Ｆｅ，Ａｌ，Ｃａ，Ｍｎ等１４个杂质元素的ＩＣＰ－ＡＥＳ方法，在样品处理过程中，加入适量体积的甘露醇能够抑制Ｂ的挥发。用本方法测定了一个国家地球化学标准样（ＧＳＲ－４），结果令人满意。
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| 关 键 词： | ICP－AES 金属硅 杂质元素 光谱分析 |
| 修稿时间： | 1998年12月8日 |
Determination of Al, B, Ba, Ca, Cr, Cu, Fe, Mg, Mn, Ni, Sr,Ti, V and Zn Impurities in Silicon Metal by ICP-AES |
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| Guiguang ZHANG,Feng HUANG,Xiaogang SUN.Determination of Al, B, Ba, Ca, Cr, Cu, Fe, Mg, Mn, Ni, Sr,Ti, V and Zn Impurities in Silicon Metal by ICP-AES[J].Spectroscopy and Spectral Analysis,2000,20(1):71-73. |
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| Authors: | Guiguang ZHANG Feng HUANG Xiaogang SUN |
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| Institution: | Guangdong Import and Export, Commodity Inspection Bureau, Shaoguan Branch, 512023 Shaoguan. |
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| Abstract: | In this paper,an ICP AES method for determining Al,B,Ba,Ca ets impuries in silicon metal is described.The interference factors in the analysis of impurity elements in silicon metal has been studied.The problems of background interference,organic matter(mannitol)interference,major elements interference are discussed.In the procedure of sample preparation,a proper volume of mannitol solution was added to sample,and this can protect B from volatilization.The feasibility of the proposed method is evaluated by analyzing one national geochemical reference samples(GSR 4),The results are satisfactory. |
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| Keywords: | ICP AES Silicon metal Impurity analysis |
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