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X-射线荧光光谱法测定溶样后熔融制样金属硅中铁、铝、钙、钛、磷、铜
引用本文:谷松海,宋义,李旭辉.X-射线荧光光谱法测定溶样后熔融制样金属硅中铁、铝、钙、钛、磷、铜[J].光谱学与光谱分析,2001,21(3):400-403.
作者姓名:谷松海  宋义  李旭辉
作者单位:天津出入境检验检疫局
摘    要:本文提出了溶解、蒸干然后用熔剂熔融残渣的样品制备方法,解决了金属硅不易直接熔融制样的难题,可以同时测定金属硅中多种杂质元素,消除了基体效应的影响,克服了标准样品对测定的限制,测定范围广,准确度高,通过安排正交试验确定了样品制备条件。

关 键 词:X-射线荧光光谱法  金属硅  熔融残渣制样方法              测定
修稿时间:2000年9月26日

Determination of Fe,Al,Ca,Ti,P and Cu in Silicon Metal by XRF
S Gu,Y Song,X Li.Determination of Fe,Al,Ca,Ti,P and Cu in Silicon Metal by XRF[J].Spectroscopy and Spectral Analysis,2001,21(3):400-403.
Authors:S Gu  Y Song  X Li
Institution:Test and Quarantine Bureau of Tianjin Arrival-Departure Port, 300201 Tianjin.
Abstract:This article puts forward a sample preparation method that first dissolve the sample by acid and evaporate the solution then melt the remains by flux. This method resolves the problem that silicon metal can't easy to prepare sample by fusion, and it can determine several elements in the sample simultaneously. This method overcomes the limit of standard sample and removes the matrix effects. The range of determination is wide and the results is accurate. The condition of preparing sample was confirmed by test.
Keywords:X  ray fluorescence spectrometer    Silicon metal    Melting the ramains method for sample preparation
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