| ICP—AES直接测定钨产品中杂质元素 |
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| 引用本文： | 杨秀环,贺柏龄.ICP—AES直接测定钨产品中杂质元素[J].光谱学与光谱分析,1998,18(5):576-579. |
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| 作者姓名： | 杨秀环 贺柏龄 |
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| 作者单位： | [1]中山大学化学系 [2]广东省进出口商品检验局 |
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| 摘 要： | 本文通过实验详细研究了钨产品中钨基体对杂质元素突出谱线的光谱干扰情况及基体效应，选择了基本步受钨基体干扰的待测元素的分析谱线并利用单纯型加速法优化ＩＣＰ操作条件，建立了一种快速分析钨产品杂质元素的ＩＣＰ－ＡＥＳ法，用本法测定了三氧化钨标准样ＢＹＧ１２０１－２，３，４号样）结果表明所建立的方法灵敏、快速和可靠。
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| 关 键 词： | ICP AES 钨产品 杂质元素 金属钨 测定 |
DIRECT DETERMINATION OF TRACE ELEMENTS IN TUNGSTEN PRODUCTS WITH ICP AES |
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| X Yang,L Wang,B Tang,Z Zhang,B He,J Li,T Peng.DIRECT DETERMINATION OF TRACE ELEMENTS IN TUNGSTEN PRODUCTS WITH ICP AES[J].Spectroscopy and Spectral Analysis,1998,18(5):576-579. |
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| Authors: | X Yang L Wang B Tang Z Zhang B He J Li T Peng |
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| Institution: | Department of Chemistry, Zhongshan University, 510275 Guangzhou. |
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| Abstract: | A direct determination of Al,As,Ca,Cd,Co,Cr,Cu,Fe,Mg,Mn,Mo,Ni,Sn,Ti and V in tungsten products with ICP AES is presented.The influence of tungsten matrix is studied.Based on the selected optimum operating parameters,the feasibility of the proposed method is evaluated by analyzing three WO 3 National References.The results are satisfactory. |
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| Keywords: | ICP AES Tungsten product Matrix interference |
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