CCD采集系统线性斜率及非线性研究

 为给物理实验数据提供切实可行的修正参数,利用测量的CCD像素强度值与像素平均值的最大偏离度表征法，全面系统地对ICF研究领域中的科学级光学CCD在ADC处于不同参数设置下的线性斜率和非线性规律进行了探索研究。实验结果表明:该台CCD在小尺度计数范围下（低于饱和计数15%）线性度优于1%，同时通过线性斜率的数据分析发现,CCD在ADC处于slow和fast两种类型下，线性斜率近乎相同,分别为0.27和0.01。这充分证明了CCD系统增益在ADC处于同一类型下它不随读出速率发生变化的特性，同时通过标定提供了该台CCD在用于大尺度计数时物理实验数据可参考的校正曲线。

Linearity slope and nonlinear scale for CCD sampling and collecting system

As one of the most important feartures of CCD, linearity can have great influence on data analysis especially in the region of quantitative calculations. The experimental research on the linearity slope and nonlinear scale of scientific optical CCD related to the application in the ICF field is comprehensively carried out by the maximal deviation method, which shows that the system gain of CCD is dependent on the type of ADC(analog to digital converter) but not on its readout rate and the nonlinear scale is less than 1% when the count is less than 15% of full scale. The calibrated data will be used as the basis of quantitatve calculation and analysis related to our ICF research.