散射环境下钨的质量吸收系数测量

在30 MeV的射频加速器上进行的原理性实验及在60Co放射源上的定量测量实验已证明了理论推导的CsI∶T1晶体对X光响应具有线性的结论.而在实际应用中,由于各种散射因素的影响可能使这种线性关系变坏而给处理带来困难；利用钨台阶在12 MeV LIA的实验环境下完成了CsI∶T1晶体对X光响应的研究,对一些散射因素进行了分析,说明在一定的条件下仍然能够获得较好的线性响应,同时对钨在相应条件下的质量吸收系数进行了测量,结果为0.806～0.823,误差约在2.0％以内.

Mass Absorption Coefficient Measurement for Tungsten under 12MeV LIA

The principle experiments carried on 30MeV frequency modulation accelerator and the quantitative measurements on the 60Co radiative source have proved the linear responsibility of CsI∶T1 crystal to the incident x-ray.In practical applications,many factors especially the scatter can bring some unmanageable problems to study work.The tungsten step is adopted to study the responsibility of CsI∶T1 crystal under 12 MeV LIA condition in order to know how the scatter acts.The good linear responsibility can be still obtained for the system under scatter environment.The tungsten mass absorption coefficient is measured and the results are between 0.806 cm－1 and 0.823 cm－1,while the error is below 2.0％.