Properties of high-k Ti1−xSixO2 gate dielectric layers prepared at room temperature |
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Authors: | Sungyeon Kim Jae-Woong Lee Jae-Min Myoung |
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Institution: | a Information and Electronic Materials Research Laboratory, Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-Dong, Seodaemun-Gu, Seoul 120-749, Republic of Korea b School of Nano and Advanced Materials Engineering, Changwon National University, 9 Sarim-dong, Changwon, Gyeongnam 641-773, Republic of Korea |
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Abstract: | High-k Ti1−xSixO2 gate dielectric layers were prepared at room temperature by RF magnetron sputtering using SiO2 and TiO2 targets to investigate their applicability to transparent thin-film transistors as well as metal-oxide-semiconductor field-effect transistors. Based on XRD and XPS analyses, it was found that, regardless of the deposition time, the Ti1−xSixO2 gate dielectric layers had more stable Si-based phases with stronger Si-O bonds with increasing SiO2 RF power. As SiO2 RF power increased, the capacitance of the dielectric layers decreased due to the higher fraction of the Si-based phases, and the leakage current decreased, dominantly because of the decrease in oxygen vacancies due to the formation of stoichiometric SiO2. The Ti1−xSixO2 gate dielectric layers exhibited high transparency above 80% and moderate bandgap of 4.1-4.2 eV, which can be applied to transparent thin-film transistors. |
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Keywords: | 68 37 Hk 71 55 &minus i 72 20 &minus i 77 55 +f 77 84 Bw 81 15 Cd 82 80 Pv 84 37 +q 85 30 Tv |
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