Adhesion hysteresis in dynamic atomic force microscopy |
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Authors: | Mariana Köber Enrique Sahagún Martina Fuss Fernando Briones Mónica Luna Juan José Sáenz |
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Institution: | 1. Instituto de Microelectrónica de Madrid (IMM‐CSIC), Isaac Newton 8, 28760 Tres Cantos, Madrid, Spain;2. Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid, 28049 Madrid, Spain |
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Abstract: | The effects of adhesion hysteresis in the dynamic‐dissipation curves measured in amplitude‐modulation atomic force microscopy are discussed. Hysteresis in the interaction forces is shown to modify the dynamics of the cantilever leading to different power dissipation curves in the repulsive and attractive regimes. Experimental results together with numerical simulations show that power dissipation, as measured in force microscopy, is not always proportional to the energy dissipated in the tip–sample interaction process. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) |
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Keywords: | 07 79 Lh 62 25 − g 68 35 Np 68 37 Ps 87 64 Dz |
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