| 光电子材料光学参数的无损检测 |
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| 引用本文： | 连洁,魏爱俭,李桂秋,王青圃,张淑芝,张晓阳.光电子材料光学参数的无损检测[J].光学技术,2001,27(5):466-468. |
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| 作者姓名： | 连洁 魏爱俭 李桂秋 王青圃 张淑芝 张晓阳 |
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| 作者单位： | 山东大学!济南250100 |
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| 摘 要： | 利用消光式椭圆偏振光谱法 ,在室温下可见光区对光电子材料镓铟磷的光学参数进行了测量 ,得到该材料的折射率和吸收系数随光子能量的变化关系曲线 ,并对结果进行了分析和讨论 ,给出了镓铟磷带隙的位置
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| 关 键 词： | 无损检测技术 椭偏光谱 带隙 |
| 文章编号： | 1002-1582(2001)05-0466-03 |
| 修稿时间： | 2001年2月19日 |
Undamaged measurement of optical parameters of optoelectronical materials |
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| LIAN Jie,WEI Ai jian,LI Gui qiu,WANG Qing pu,ZHANG Shu zhi,ZHANG Xiao yang.Undamaged measurement of optical parameters of optoelectronical materials[J].Optical Technique,2001,27(5):466-468. |
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| Authors: | LIAN Jie WEI Ai jian LI Gui qiu WANG Qing pu ZHANG Shu zhi ZHANG Xiao yang |
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| Abstract: | Optical parameters of GaInP were measured by using null ellipsometric spectrum method in the visible light region at room temperature The dependencies of refractive index and absorption coefficient for three samples on the energy of photons were obtained, and the result was analyzed and discussed The positions of energy gap of three samples were given |
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| Keywords: | undamaged measurement technique ellipsometric spectroscopy energy gap |
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