| 利用DIP技术测定荷质比 |
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| 引用本文： | 魏爱俭,刘明,祁海峰.利用DIP技术测定荷质比[J].光学技术,2004,30(3):327-329. |
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| 作者姓名： | 魏爱俭 刘明 祁海峰 |
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| 作者单位： | 山东大学,光电系,济南,250100;山东大学,光电系,济南,250100;山东大学,光电系,济南,250100 |
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| 基金项目： | 教育部世行贷款面向21世纪初教学改革项目赞助课题(128IE08212) |
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| 摘 要： | 将数字图像处理(DIP)技术用于汞546.1nm谱线塞曼分裂横效应π谱线、σ谱线的图像处理,建立了CCD实时测量系统。通过多图像平均,图像细化,取样分析,快速方便地测量计算了电子的荷质比。结果表明,直接测量无法分辨的σ谱线可以通过数字图像处理测量;测量π谱线引起的相对误差小于1%,比直接测量法降低了近一个数量级。
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| 关 键 词： | 数字图像处理 塞曼效应 CCD |
| 文章编号： | 1002-1582(2004)03-0327-03 |
| 修稿时间： | 2003年8月25日 |
Measurement of the charge-mass ratio of electron using digital image processing (DIP) technique |
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| WEI Ai-jian,LIU Ming,QI Hai-feng,.Measurement of the charge-mass ratio of electron using digital image processing (DIP) technique[J].Optical Technique,2004,30(3):327-329. |
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| Authors: | WEI Ai-jian LIU Ming QI Hai-feng |
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| Abstract: | The technique of digital image processing(DIP) is used in Zeeman transverse effect experiment to process π and σ spectral lines generated by Hg 546.1nm line. A real-time CCD measurement system is designed and constructed. The charge-mass ratio can be measured expediently by multiple image averaging, fringe thinning and sample analyzing. It is shown that the DIP technique can measure the σ spectral line that cannot be distinguished by eyepiece directly and the relative error in determining the π spectral line is smaller than 1% ,which is about one order smaller than that measured by eyepiece directly. |
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| Keywords: | digital image processing Zeeman effect CCD |
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