水蒸气对二氧化硅膜的影响：吸附性能与渗流效应

研究了在50和90 oC时水蒸气对孔径约为4 ?的二氧化硅膜的吸附性能和渗流效应影响，采用椭圆偏振光谱分析水蒸气的吸附性能，以及测定氦气-H₂O二元混合气体的透过性能. 研究表明水蒸气在二氧化硅膜上的吸附行为符合一阶Langmuir等温线，同时，在H₂O分子存在的条件下，氦气的透过率会急剧下降. 通常，在极小孔内气体分子的传输被认为是不连续的，而是在势能下从一个占有位置跳跃到另外一个空位上. 当在二氧化硅表面的H₂O分子覆盖率上升时，氦气的透过率急剧下降可能与渗流效应有关，其中吸附在二氧化硅表面的H₂O分子阻碍了氦气分子的跳跃.

Influence of Water Vapor on Silica Membrane: Adsorption Properties and Percolation Effect

The influence of water vapor on silica membrane with pore size of 4 ? has been investigated in terms of adsorption properties and percolation effect at 50 and 90 oC. Two methods are employed: spectroscopic ellipsometry for water vapor adsorption and gas permeation of binary mixture of helium and H₂O. The adsorption behaviors on the silica membrane comply with the first-order Langmuir isotherm. The investigation demonstrates that helium flux through the silica membrane decreases dramatically in presence of H₂O molecules. The transport of gas molecules through such small pores is believed not to be continuous any more, whereas it is reasonably assumed that the gas molecules hop from one occupied site to another unoccupied one under the potential gradient. When the coverage of H₂O molecules on the silica surface increases, the dramatic decrease of helium flux could be related to percolation effect, where the adsorbed H₂O molecules on the silica surface block the hopping of helium molecules.