重离子轰击Ta靶引起的多电离效应

在兰州重离子加速器国家实验室分别测量了H⁺, He²⁺, Ar¹¹⁺和Xe²⁰⁺离子轰击Ta表面过程中辐射的X射线谱, 并得到了Ta特征X射线谱中M_γ (M₃N₅)和N_αβ (M_4,5N_6,7)线的强度, 即I_γ和I_αβ. 分析结果表明, 强度比值I_γ/I_αβ 随着入射离子原子序数的增加而显著增加, 这是由于碰撞过程中Ta原子的多电离效应使M₃支壳层的荧光产额ω₃产生了显著增强.

Multiple ionization effect of Ta induced by heavy ions

The M X-ray spectra of Ta induced by H⁺, He²⁺, Ar¹¹⁺ and Xe²⁰⁺ are measured in Heavy Ion Research Facility in Lanzhou. The intensities of M_γ (M₃N₅) and N_αβ (M_4,5N_6,7), i.e. I_γ and I_αβ, are also derived from the spectra. It is found that the intensity ratio of I_γ/I_αβ increases with the increase of projectile atomic number. The results show that the M₃-subshell fluorescence yield ω₃ of Ta target is greatly enhanced, owing to multiple ionization effect in collision with heavy ions.