Study of Co thin films deposited on low-index Cu surfaces by photoemission electron microscopy |
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| Authors: | Yuet-Loy Chan Jo-Hsuan SunYJ Hsu DH Wei |
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| Institution: | National Synchrotron Radiation Research Center, 101 Hsin-Ann Rd., Hsinchu Science Park, Hsinchu, 30076, Taiwan |
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| Abstract: | The domain structures of Co ultrathin film prepared with μm- and mm-dimension laterally were acquired and compared using X-ray Photoemission Electron Microscope (PEEM). Through depositing the Co film with different thickness on two copper single-crystal surfaces; Cu(1 0 0) and Cu(1 1 0), we report the impacts of thin film lateral dimensions, crystal orientations, and film thickness to the domain structures of Co layer. |
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| Keywords: | 68 37 Xy 73 50 Gr 75 70 Kw 78 70 Dm |
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