Roughness and dynamics of a contact line of a viscous fluid on a disordered substrate |
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Authors: | S Moulinet C Guthmann E Rolley |
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Institution: | (1) Laboratoire de Physique Statistique de l'Ecole Nomale Supérieure associé au CNRS et aux Universités Paris 6 et Paris 7, 24 rue Lhomond, 75231 Paris Cedex 05, France, FR |
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Abstract: | We have studied the roughness and the dynamics of the contact line of a viscous liquid on a disordered substrate. We have
used photolithographic techniques to obtain a controlled disorder with a correlation length ξ = 10μm. Liquids with different
viscosity were used: water and aqueous glycerol solution. We have found that the roughness W of the contact line depends neither on the viscosity nor on the velocity v of the contact line for v in the range 0.2-20μm/s. W is found to scale with the length L of the line as L
ζ with a roughness exponent ζ = 0.51±0.03. This value is similar to the one obtained with superfluid helium. In the present
experiment, we have checked that the motion of the contact line is actually overdamped, so that the phenomenological equation
first proposed by Ertas and Kardar should be relevant. However, our measurement of ζ is in disagreement with the predicted
value ζ = 0.39. We have also analyzed the avalanche-like motion of the contact line. We find that the size distribution does
not follow a power law dependence.
Received 18 April 2002 |
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Keywords: | PACS 46 65 +g Random phenomena and media – 64 60 Ht Dynamic critical phenomena |
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