Nanometer Scale Electrical Characterization of Artificial Mesostructures |
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Authors: | C Durkan M E Welland |
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Institution: | Nanoscale Science Laboratory, Department of Engineering, University of Cambridge, Trumpington St. CB2 1PZ, UK |
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Abstract: | In this article, we review advances in experimental techniques for the electrical characterization of artificial mesostructures from nanometer to micrometer size. As the scale of electronic devices is rapidly approaching the 100-nm benchmark, new tools are becoming necessary to study and characterize them. We are also at a point where new tools to fabricate these devices are becoming increasingly relevant. We discuss the various characterization techniques applicable to objects of this scale, with particular emphasis on scanned probe methods. |
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Keywords: | nanoelectronics electronic devices electronic transport atomic force microscopy |
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