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射频等离子硫钝化GaAs(100)的表面特性
引用本文:许留洋,高欣,袁绪泽,夏晓宇,曹曦文,乔忠良,薄报学.射频等离子硫钝化GaAs(100)的表面特性[J].发光学报,2016,37(5):556-560.
作者姓名:许留洋  高欣  袁绪泽  夏晓宇  曹曦文  乔忠良  薄报学
作者单位:长春理工大学高功率半导体激光国家重点实验室, 吉林长春 130022
基金项目:国家自然科学基金(61176048;61308051),吉林省科技发展计划(20150203007GX;20130206016GX),中物院高能激光重点实验室基金(2014HEL01)
摘    要:采用射频等离子方法,对Ga As(100)衬底片表面进行干法硫等离子体钝化,旨在得到性能稳定含硫钝化层。样品经过360℃温度条件下的快速热退火,光致发光(PL)测试表明,钝化后的样品PL强度上升了71%。同时,钝化样品的稳定性测试结果表明,样品放置在实验室空气中30 d,其PL强度未出现明显变化,说明Ga As的等离子体干法硫钝化具有较好的性能稳定性。

关 键 词:射频等离子体  光致发光  钝化  GaAs
收稿时间:2015-12-23

RF Sulfur-plasma Passivation of GaAs(100) Surface
XU Liu-yang,GAO Xin,YUAN Xu-ze,XIA Xiao-yu,CAO Xi-wen,QIAO Zhong-liang,BO Bao-xue.RF Sulfur-plasma Passivation of GaAs(100) Surface[J].Chinese Journal of Luminescence,2016,37(5):556-560.
Authors:XU Liu-yang  GAO Xin  YUAN Xu-ze  XIA Xiao-yu  CAO Xi-wen  QIAO Zhong-liang  BO Bao-xue
Institution:State Key Laboratory of High Power Semiconductor Lasers, Changchun University of Science and Technology, Changchun 130022, China
Abstract:Sulfur-plasma process was proposed to clean and passivate the surface of (100) oriented GaAs wafers for stable sulfur passivation effect. The photoluminescence ( PL) intensity of processed samples with sulfur-plasma had an obvious improvement after 360 ℃ annealing, and 71% higher than the unpassivated sample. The stability of passivation was also tested. There was no obvious PL intensity degradation while the sample stored in open air over a month. The experiment results show that the passivation of GaAs surface treated by sulfur-plasma process has good stability.
Keywords:RF plasma  PL  passivation  GaAs
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