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星载差分吸收光谱仪噪声分析及处理方法
引用本文:张泉,黄书华,田禹泽,鲁月林,赵敏杰,周海金,赵欣,王煜,司福祺.星载差分吸收光谱仪噪声分析及处理方法[J].光谱学与光谱分析,2018,38(9):2976-2981.
作者姓名:张泉  黄书华  田禹泽  鲁月林  赵敏杰  周海金  赵欣  王煜  司福祺
作者单位:1. 中国科学院安徽光学精密机械研究所,安徽 合肥 230031
2. 中国科学技术大学,安徽 合肥 230026
基金项目:国家重点研发计划项目(2016YFC0200400),国家自然科学基金项目(41605017,U1407135),高分专项应用共性关键技术项目(50-Y20A38-0509-15/16)资助
摘    要:噪声对星载大气痕量气体差分吸收光谱仪信噪比具有重大影响,其是衡量光谱仪成像质量和痕量气体反演能力的标准。为量化并去除光谱仪系统噪声从而提高信噪比,分析了光谱仪噪声来源并给出了相应噪声模型,在此基础上建立了光谱仪信噪比模型。研究了入射光强度、积分时间和系统增益对系统信噪比的影响。通过光谱仪辐射定标试验数据对不同工作模式和不同参数与信噪比的关系进行了对比验证。并提出主要系统噪声的处理方法:利用线性拟合取截距法确定系统偏置噪声;在地面利用暗电流温度相关性获得温度修正因子实现载荷在轨暗电流校正;在探测器响应线性范围内利用两点校正法对PRNU噪声进行修正。结果表明:全幅成像模式下,可见1通道电子学偏置噪声响应DN值2 625,可见2通道电子学偏置噪声响应DN值2 763;暗电流噪声在CCD成像面温度高于0 ℃时占主要部分,温度下降至-20 ℃时其余噪声起主导作用,验证了CCD最佳制冷温度;光谱仪信噪比随着入射光响应和积分时间的增加而增大,系统增益不会影响信噪比;PRNU噪声通过校正得到明显改善,由3.32%下降到0.47%,提高了光谱仪成像质量。该噪声分析和处理方法对后期光谱数据的痕量气体反演提供帮助。

关 键 词:CCD  暗电流噪声  成像光谱仪  PRNU  信噪比  
收稿时间:2017-09-20

Noise Analysis and Processing Method of Environment Monitoring Instrument
ZHANG Quan,HUANG Shu-hua,TIAN Yu-ze,LU Yue-lin,ZHAO Min-jie,ZHOU Hai-jin,ZHAO Xin,WANG Yu,SI Fu-qi.Noise Analysis and Processing Method of Environment Monitoring Instrument[J].Spectroscopy and Spectral Analysis,2018,38(9):2976-2981.
Authors:ZHANG Quan  HUANG Shu-hua  TIAN Yu-ze  LU Yue-lin  ZHAO Min-jie  ZHOU Hai-jin  ZHAO Xin  WANG Yu  SI Fu-qi
Institution:1. Key Laboratory of Environment Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China 2. University of Science and Technology of China, Hefei 230026, China
Abstract:The noise has a significant effect on the Signal to Ratio(SNR) of the trace gas absorption spectrometer, which is a standard for evaluating the imaging quality and trace gas retrieving capability. To quantitatively assess factors affecting SNR, and remove the noise of the spectrometer system, the noise source of the spectrometer is analyzed and the corresponding noise model is given. On this basis, the SNR model of the spectrometer is established in this paper. In addition, the effects of incident light intensity, integration time and system gain on the SNR are studied. The relationship between the different operating modes and different parameters and SNR is verified by the calibration experiment data of the spectrometer. And the main system noise is proposed: the linear deviation is used to determine the system offset noise. Besides, the temperature correction factor is obtained by using the dark current temperature correlation on the ground to realize the load in-orbit dark current correction. In the linear range of the detector response PRNU noise is corrected by the two-point correction method. The results show that the DN value of UV1 channel electronic offset noise is 2 625, and UV2 is 2 763. The dark current noise is the main part when the CCD imaging surface temperature is higher than 0 ℃, The temperature decreases to -20 ℃ when the rest of the noise plays a leading role to verify the best cooling temperature of the CCD; SNR increases with the increasing incident light response and integration time, the system gain will not affect SNR; PRNU noise was significantly improved by correction, decreasing from 3.32% to 0.47%, improving the spectral quality of the spectrometer. The noise analysis and processing methods are conducive to trace gas retrieve of further spectral data.
Keywords:CCD  Dark current noise  Imaging spectrometer  PRNU  SNR  
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