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| The specular component of light scattering and the charac- terization of the height distribution for random surfaces | |
| 作者姓名： | 程传福 亓东平 滕树云 刘曼 贾天卿 徐至展 |
| 作者单位： | Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，China Department of Physics，Shandong Normal University，Jinan 250014，China，Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，China，Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，China，Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，China Department of Physics，Shandong Normal University，Jinan 250014，China，Department of Physics，Shandong Normal University，Jinan 250014，China，Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，China |
| 基金项目： | This work was supported by the National Natural Science Foundation of China (Grant No. 69978012)，the National Key Basic Research Special Foundation (NKBRSF) of China (Grant No. G1999075200) |
| 摘 要： | The relations between the specular reflection component of the intensity scattered by random surfaces and the height distributions of the surfaces are analyzed theoretically. In the extraction of the height distribution, both the phase and the amplitude of the specular wave are required. The measured specular intensity data versus the perpendicular component of the wave vector are used for the retrieval of the phase distribution of the specular wave, in which the Ger-chberg-Saxton iterative algorithm is employed, and the characterization of the height distribution of random surfaces is accomplished. In the experiment, two samples with Gaussian and quasi-two level height distributions, respectively, are practically measured and the results of the height probability density function obtained by light scattering method are in good accordance with those by atomic force microscopy. The method of this paper is of important significance for the characterizations and studies of random surfaces. |
The specular component of light scattering and the characterization of the height distribution for random surfaces |
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| CHENG Chuanfu,Ql Dongping TENG Shuyun LIU Man,JIA Tianqing & XU Zhizhan.The specular component of light scattering and the charac- terization of the height distribution for random surfaces[J].Science in China(Physics Astronomy),2003,46(5). | |
| Authors: | CHENG Chuanfu Ql Dongping TENG Shuyun LIU Man JIA Tianqing & XU Zhizhan |
| Institution: | 1. Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China;Department of Physics, Shandong Normal University, Jinan 250014, China 2. Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China 3. Department of Physics, Shandong Normal University, Jinan 250014, China |
| Abstract: | The relations between the specular reflection component of the intensity scattered by random surfaces and the height distributions of the surfaces are analyzed theoretically. In the extraction of the height distribution, both the phase and the amplitude of the specular wave are required. The measured specular intensity data versus the perpendicular component of the wave vector are used for the retrieval of the phase distribution of the specular wave, in which the Ger-chberg-Saxton iterative algorithm is employed, and the characterization of the height distribution of random surfaces is accomplished. In the experiment, two samples with Gaussian and quasi-two level height distributions, respectively, are practically measured and the results of the height probability density function obtained by light scattering method are in good accordance with those by atomic force microscopy. The method of this paper is of important significance for the characterizations and studies of random surfaces. |
| Keywords: | light scattering height distributions specular reflection phase retrieval |
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