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基于椭偏光谱仪的石英晶体1310nm处双折射率的精密测量
引用本文:Han PG,Hao DZ,Song LK,Su FF,Shi M,Lü TF,Wu FQ,Li GH.基于椭偏光谱仪的石英晶体1310nm处双折射率的精密测量[J].光谱学与光谱分析,2012,32(4):1142-1144.
作者姓名:Han PG  Hao DZ  Song LK  Su FF  Shi M  Lü TF  Wu FQ  Li GH
作者单位:山东省激光偏光与信息技术重点实验室曲阜师范大学激光研究所
基金项目:国家自然科学基金项目(60976015);山东省自然科学基金项目(ZR2009GL010);浙江省科技厅分析测试科技计划项目(2011C37046)资助
摘    要:为了对石英晶体在通讯波段1 310 nm处的双折射率进行精密测量,基于椭偏光谱仪对P和S两方向上偏振光相位差的精密测量原理,在透射模式下,通过对琼斯矩阵的分析,设计了一种精密测量晶体双折射率的方法,并在室温(22℃)下对通讯波段1 310 nm处石英晶体的双折射率进行了精密测量,测量结果和对误差的分析显示,此方法给出的...

关 键 词:晶体光学  双折射率  椭偏光谱仪  石英  1310  nm

Precision measurement of the birefringence of quartz crystal at 1 310 nm based on the spectroscopic ellipsometer
Han Pei-gao,Hao Dian-zhong,Song Lian-ke,Su Fu-fang,Shi Meng,Lü Ting-fen,Wu Fu-quan,Li Guo-hua.Precision measurement of the birefringence of quartz crystal at 1 310 nm based on the spectroscopic ellipsometer[J].Spectroscopy and Spectral Analysis,2012,32(4):1142-1144.
Authors:Han Pei-gao  Hao Dian-zhong  Song Lian-ke  Su Fu-fang  Shi Meng  Lü Ting-fen  Wu Fu-quan  Li Guo-hua
Institution:Shandong Provincial Key Laboratory of Laser Polarization and Information Technology, Laser Institute, Qufu Normal University, Qufu 273165, China. pghan@foxmail.com
Abstract:In order to get the precision measurement of birefringence of quartz crystal at the communication wavelength 1310nm, based on the principle of precision measurement of phase difference between P and S polarized lights of spectroscopic ellipsometer, a method for precision measurement of birefringence of crystal was designed through the analysis of the Jones matrix under the transmission mode, and the precision measurement of birefringence of quartz crystal at 1 310 nm at room temperature (22 degrees C) was made, the measuring results and error analysis show that the precision reached 10(-6) level, this is the most precise birefringence parameter available, and it is of important significance for the improvement of designing precision of phase retardation devices of quartz.
Keywords:Crystal optics  Birefringence  Spectroscopic ellipsometer  Quartz  1 310 nm
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