首页 | 本学科首页   官方微博 | 高级检索  
     检索      

Prototype of time digitizing system for BESⅢ endcap TOF upgrade
引用本文:曹平,孙维佳,季筱璐,范欢欢,王思宇,刘树彬,安琪.Prototype of time digitizing system for BESⅢ endcap TOF upgrade[J].中国物理 C,2014,38(4):61-69.
作者姓名:曹平  孙维佳  季筱璐  范欢欢  王思宇  刘树彬  安琪
作者单位:1 State Key Laboratory of Particle Detection and Electronics, Hefei 230026, China;;2 Anhui Key Laboratory of Physical Electronics, Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China;;3 Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
基金项目:Supported by National Natural Science Foundation of China(10979003,11005107)
摘    要:The prototype of a time digitizing system for the BESⅢ endcap TOF (ETOF) upgrade is introduced in this paper. The ETOF readout electronics has a distributed architecture. Hit signals from the multi-gap resistive plate chamber (MRPC) are signaled as LVDS by front-end electronics (FEE) and are then sent to the back-end time digitizing system via long shield differential twisted pair cables. The ETOF digitizing system consists of two VME crates, each of which contains modules for time digitization, clock, trigger, fast control, etc. The time digitizing module (TDIG) of this prototype can support up to 72 electrical channels for hit information measurement. The fast control (FCTL) module can operate in barrel or endcap mode. The barrel FCTL fans out fast control signals from the trigger system to the endcap FCTLs, merges data from the endcaps and then transfers to the trigger system. Without modifying the barrel TOF (BTOF) structure, this time digitizing architecture benefits from improved ETOF performance without degrading the BTOF performance. Lab experiments show that the time resolution of this digitizing system can be lower than 20 ps, and the data throughput to the DAQ can be about 92 Mbps. Beam experiments show that the total time resolution can be lower than 45 ps.

关 键 词:BESⅢ  endcap  upgrade  time-of-flight  high  precision  time  measurement  readout  electronics
收稿时间:2013-6-3
修稿时间:2013-7-11
本文献已被 CNKI 等数据库收录!
点击此处可从《中国物理 C》浏览原始摘要信息
点击此处可从《中国物理 C》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号