| Remanence Characteristic of Nanostructure of Hard／Soft Magnetic Multilayered Systems |
| |
| 引用本文： | HUJing－Guo LIUJi－Wen 等.Remanence Characteristic of Nanostructure of Hard／Soft Magnetic Multilayered Systems[J].理论物理通讯,2001,35(6):740-744. |
| |
| 作者姓名： | HUJing－Guo LIUJi－Wen |
| |
| 作者单位： | [1]NationalLaboratoryofSolidStateMicrostructures,NanjingUniversity,Nanjing210093,China [2]NationalLaborator,NanjingUniversity,Nanjing210093,China |
| |
| 摘 要： | The relation between microscopic properties (e.e.,layer thickness,easy axis orientation) and the macroscopic magnetic properties such as remanent magnetization of the ferromagnetic multilayer system is investigated based on a simple micromagnet approach.We concentrate on a multilayer design with periodic boundary condition,where alternating soft/hard layers build a nanostructured multilayer.For any easy axis direction in the soft and hard layers a simple explicit expression of remanence of the system has been derived analytically.We find that the remanence clearly depends on the thickness of the soft magnetic layer and is nearly independent of the thickness of hard magnetic layer.On the other hand,the remanence increases upon reducing the angle enclosed by the saturation magnetization and the easy axis directions of soft magnetic layer.However,it is unsensitive to the easy axis direction of hard magnetic layer,but there exists a maximum remanence for a certain easy axis direction of hard magnetic layer.
|
| 关 键 词： | 磁性材料 磁多层系统 剩磁特征 |
| 收稿时间： | 2000-06-27 |
Remanence Characteristic of Nanostructure of Hard/Soft
Magnetic Multilayered Systems |
| |
| HU Jing-Guo,LIU Ji-Wen and MA Yu-Qiang.Remanence Characteristic of Nanostructure of Hard/Soft
Magnetic Multilayered Systems[J].Communications in Theoretical Physics,2001,35(6):740-744. |
| |
| Authors: | HU Jing-Guo LIU Ji-Wen and MA Yu-Qiang |
| |
| Institution: | 1. National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China
;2. Department of Physics, Yangzhou University, Yangzhou
225002, China |
| |
| Abstract: | The relation between microscopic properties (e.g., layer thickness, easy axis orientation) and the macroscopic magnetic properties such as remanent magnetization of the ferromagnetic multilayer system is investigated
based on a simple micromagnet approach. We concentrate on a multilayer design with periodic boundary condition,
where alternating soft/hard layers build a nanostructured multilayer.
For any easy axis direction in the soft and hard layers a simple explicit expression of remanence of the system has been derived analytically. We find that the remanence clearly depends
on the thickness of the soft magnetic layer and is nearly independent
of the thickness of hard magnetic
layer. On the other hand, the remanence increases upon reducing
the angle enclosed by the saturation magnetization and the easy axis directions of soft magnetic layer. However, it is unsensitive to the easy axis direction of hard magnetic layer,
but there exists a maximum remanence for a certain easy axis direction of hard magnetic layer. |
| |
| Keywords: | nanostructured two-phase magnet exchange-spring behavior micromagnetics remanence |
| 本文献已被 维普 等数据库收录！ |
| 点击此处可从《理论物理通讯》浏览原始摘要信息 |
| 点击此处可从《理论物理通讯》下载免费的PDF全文 |
|
