Hardness and phase analysis of IN 718 deformed at high strain rate

Specimens of the nickel base alloy IN 718 deformed at high strain rate (~10 s^–1), as realized in a screw press, have higher strength than parts forged conventionally in a hydraulic press. Microstructure analyses in light and transmission electron microscopes reveal the precipitation of very small Ni₃Nb particles (nc35rbq2r56/xxlarge947.gif" alt="gamma" align="MIDDLE" BORDER="0">nc35rbq2r56/xxlarge8243.gif" alt="Prime" align="MIDDLE" BORDER="0">-phase) to be the reason for the increased hardness. Several processing routes are discussed and analyzed in relation to the TTT-diagram of IN 718.     

用拉曼散射光谱估算纳米Ge晶粒平均尺寸

用射频共溅射技术和真空退火方法制备了埋入ＳｉＯ２基底中的纳米Ｇｅ复合膜（ｎｃ－Ｇｅ／ＳｉＯ２）测量了不同温度退火后该复合膜的拉曼散射光谱，其结果与晶体Ｇｅ的拉曼谱相比，纳米Ｇｅ的拉曼峰红移峰形变宽，用拉曼谱的参数计算了纳米Ｇｅ晶粒的平均尺寸，所得结果与声子限域理论模型符合。     

发蓝绿光纳米硅薄膜的快速热处理制备

使用除氢、高温成核和低温生长的三段式快速热处理方法,将常规方法制备的氢化非晶硅(a-SiH)薄膜晶化成纳米硅(nc-Si)薄膜。该薄膜在波长为457.9nm的Ar⁺激光的激发下,在室温发射出蓝绿光。     

掺铒硅基材料发光的新途径

关键词：     

掺铒nc-Si/SiO2薄膜中nc-Si和Er3+与非辐射复合缺陷间相互作用对薄膜发光特性的影响

对nc-Si/SiO2薄膜中纳米硅(nc-Si)、Er3+和非辐射复合缺陷三者间的关系作了研究.在514.5 nm光激发下，nc-Si/SiO2薄膜在750nm和1.54μm处存在较强的发光，前者与薄膜中的nc-Si有关，后者对应于Er3+从第一激发态4I13/2到基态4I15/2的辐射跃迁.随薄膜中Er3+含量的提高，1.54μm处的发光强度明显增强，750 nm处的发光强度却降低.H处理可以明显增强薄膜的发光强度，但是对不同退火温度样品，处理效果却有所不同.根据以上实验结果，可得如下结 关键词： Er3+ nc-Si H处理     

Raman characterization of the structural evolution in amorphous and partially nanocrystalline hydrogenated silicon thin films prepared by PECVD

Hydrogenated silicon (Si:H) thin films were obtained by plasma‐enhanced chemical vapor deposition (PECVD). Raman spectroscopy was used to investigate the structural evolution in phosphor‐doped n‐type amorphous hydrogenated silicon thin films, which were prepared under different substrate temperatures and gas pressures. Meanwhile, the effect of nitrogen doping on the structure of P‐doped thin films was also investigated by Raman spectroscopy. Moreover, the transition from the amorphous state to the nanocrystalline state of undoped Si:H films deposited through low argon dilution was studied by Raman spectroscopy, X‐ray diffraction, and transmission electron microscopy. The results show that Raman spectroscopy can sensitively detect the structural evolution in hydrogenated silicon thin films deposited under different conditions in a PECVD system. Copyright © 2010 John Wiley & Sons, Ltd.     

磁控溅射淀积掺Er富Si氧化硅膜中Er3+ 1.54μm光致发光

用磁控溅射淀积不同富Si程度的掺Er富Si氧化硅薄膜.室温下测量其光致发光谱,观察到各谱中都含有1.54和1.38μm两个发光峰,其中1.54和1.38μm的光致发光峰分别来自Er³⁺和氧化硅中某种缺陷.系统研究了Er³⁺1.54μm光致发光峰强度对富Si程度及退火温度的依赖关系.还发现1.54μm发光峰强度与1.38μm发光峰强度相互关联,对此进行了讨论 关键词： Er 富Si氧化硅 光致发光 纳米硅     

磁控溅射淀积掺Er富Si氧化硅膜中Er~(3 ) 1.54μm光致发光

用磁控溅射淀积不同富Si程度的掺Er富Si氧化硅薄膜 .室温下测量其光致发光谱 ,观察到各谱中都含有 1.5 4和 1.38μm两个发光峰 ,其中 1.5 4和 1.38μm的光致发光峰分别来自Er3 和氧化硅中某种缺陷 .系统研究了Er3 1.5 4μm光致发光峰强度对富Si程度及退火温度的依赖关系 .还发现 1.5 4μm发光峰强度与 1.38μm发光峰强度相互关联 ,对此进行了讨论