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In this work, a portable slit imaging system is developed to study both the electron beam diameter and the profile of the newly developed Shanghai Electron Beam Ion Trap (Shanghai EBIT). Images are detected by a charge coupled device (CCD) sensitive to both X rays and longer wavelength photons (up to visible). Large scale ray tracings were conducted for correcting the image broadening effects caused by the finite slit width and the finite width of the CCD pixels. A numerical de-convolution method was developed to analyse and reconstruct the electron beam density distribution in the EBIT. As an example of the measured beam diameter and current density, the FWHM (full width at half maximum) diameter of the electron beam at 81 keV and 120 mA is found to be 76.2 μm and the density 2.00 × 10^3 A.cm-2, under a magnetic field of 3 T, including all corrections.  相似文献   
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大气中激光等离子体通道寿命的延长及测量分析   总被引:2,自引:0,他引:2       下载免费PDF全文
介绍了一种反卷积方法.利用该方法分析了实验中测得的等离子体通道的光电信号特征,获 得了空气中等离子体通道的真实寿命.还证明了利用双脉冲激光结构,可以将等离子体寿命 延长近5倍. 关键词: 反卷积 大气激光等离子体通道 等离子体寿命  相似文献   
3.
In this work,a portable slit imaging system is developed to study both the electron beam diameter and the profile of the newly developed Shanghai Electron Beam Ion Trap (Shanghai EBIT).Images are detected by a charge coupled device (CCD) sensitive to both X rays and longer wavelength photons (up to visible).Large scale ray tracings were conducted for correcting the image broadening effects caused by the finite slit width and the finite width of the CCD pixels.A numerical de-convolution method was developed to analyse and reconstruct the electron beam density distribution in the EBIT.As an example of the measured beam diameter and current density,the FWHM (full width at half maximum) diameter of the electron beam at 81 keV and 120 mA is found to be 76.2 μm and the density 2.00 × 10 3 A·cm 2,under a magnetic field of 3 T,including all corrections.  相似文献   
4.
SPH方法在模拟线弹性波传播中的运用   总被引:4,自引:0,他引:4  
通过对固体中波动问题的模拟建立了一种光滑粒子法的新形式,一种运用SPH的核函数的类似有限体积法的计算方法。通过对统计体积的修正以及对边界粒子的核函数修正,较好地解决了SPH方法中长期以来制约其被广泛应用的主要问题之一边界条件的表述。在此基础上成功地在光滑粒子法中实现了透射边界条件的模拟。同时利用反卷积修正使得较大粒子间距下的计算结果的精度大大提高。这种方法不但保持了SPH的简单性,而且很容易实现应力边界条件。  相似文献   
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