用于短波长RT不稳定性的莫尔条纹成像技术

瑞利-泰勒(RT)不稳定性对内爆有十分不利的影响,在很多情况下,10μm左右的波长的小尺度扰动增长是最快的,这要求诊断设备的空间分辨好于几μm,但是现有的设备难以做到这一点。为了测量短波长的RT不稳定性,利用莫尔条纹技术的差拍放大作用,发展了莫尔条纹技术,并在“星光Ⅱ”装置上进行了莫尔干涉法的实验。采用两个周期相近10μm和12μm的光栅成像,获得了周期为60μm的清晰的莫尔条纹图像,图像放大了5倍。实验结果表明,莫尔条纹技术是可行的。     

箍缩背光照相

 利用PPG-Ⅰ脉冲功率装置（500 kV,400 kA,100 ns）驱动X箍缩负载,得到了μm量级的亚纳秒脉冲X射线辐射点源。在阴阳极轴线和回流柱上同时安装X箍缩负载,前者可作为背光照相的X射线点源;后者可作为被拍照的目标X箍缩。获得了X箍缩发展过程不同时刻的时间序列图像,在背光照相的图像中可以清晰观察到X箍缩交叉点处等离子体的外爆、箍缩以及最终的崩溃阶段。将阴阳极轴线上的X箍缩负载用Z箍缩丝阵负载代替,实现了对丝阵负载Z箍缩放电起始阶段的X射线背光照相,观察到了最初的各单丝电爆炸、等离子体膨胀及融合过程,同时观察到了双丝Z箍缩发展过程中的等离子体不稳定性。实验结果有助于深入理解Z箍缩发展的物理过程,同时可为有效的模拟建模分析提供基本的实验数据。     

Control of Luminescence by Tuning of Crystal Symmetry and Local Structure in Mn4+‐Activated Narrow Band Fluoride Phosphors

Mn⁴⁺‐doped fluoride phosphors have been widely used in wide‐gamut backlighting devices because of their extremely narrow emission band. Solid solutions of Na₂(Si_xGe_1?x)F₆:Mn⁴⁺ and Na₂(Ge_yTi_1?y)F₆:Mn⁴⁺ were successfully synthesized to elucidate the behavior of the zero‐phonon line (ZPL) in different structures. The ratio between ZPL and the highest emission intensity υ₆ phonon sideband exhibits a strong relationship with luminescent decay rate. First‐principles calculations are conducted to model the variation in the structural and electronic properties of the prepared solid solutions as a function of the composition. To compensate for the limitations of the Rietveld refinement, electron paramagnetic resonance and high‐resolution steady‐state emission spectra are used to confirm the diverse local environment for Mn⁴⁺ in the structure. Finally, the spectral luminous efficacy of radiation (LER) is used to reveal the important role of ZPL in practical applications.     

X-ray absorption spectroscopy for wire-array Z-pinches at the non-radiative stage

Absorption spectroscopy was applied to wire-array Z-pinches on the 1 MA pulsed-power Zebra generator at the Nevada Terawatt Facility (NTF). The 50 TW Leopard laser was coupled with the Zebra generator for X-ray backlighting of wire arrays at the ablation stage. Broadband X-ray emission from a laser-produced Sm plasma was used to backlight Al star wire arrays in the range of 7–9 Å. Two time-integrated X-ray conical spectrometers recorded reference and absorption spectra. The spectrometers were shielded from the bright Z-pinch X-ray burst by collimators. The comparison of plasma-transmitted spectra with reference spectra indicates absorption lines in the range of 8.1–8.4 Å. Analysis of Al K-shell absorption spectra with detailed atomic kinetics models shows a distribution of electron temperature in the range of 10–30 eV that was fitted with an effective two-temperature model. Temperature and density distributions in wire-array plasma were simulated with a three-dimension magneto-hydrodynamic code. Post-processing of this code’s output yields synthetic transmission spectrum which is in general agreement with the data.     

激光驱动X射线单色背光照相系统优化设计

 基于球面几何光学对激光驱动X射线单色背光照相系统的空间分辨力和成像效率等关键性能参数进行了理论推导,分析了当系统光学参数发生变化时,系统空间分辨力和成像效率互为制约的关系,由此提出了在保证能探测到图像的前提下,尽量提高系统空间分辨能力的优化设计方法。按照此方法具体设计了光子能量分别为5.07 keV和5.41 keV的两套背光照相系统,并用光线追迹模拟实验进行了验证。结果表明：设计的两套系统都能够在大约1 cm²的视场范围内,具有优于10 μm的空间分辨力。     

快点火背光照相数值模拟

在激光惯性约束聚变实验研究中,诊断燃料层密度通常利用纳秒激光束辐照金属靶片产生特征X射线作为背光照明光源,对内爆球壳进行瞬态辐射照相,进而推断球壳内爆燃料层的密度。利用蒙特卡罗程序,对快点火X射线背光照相进行了研究,模拟了针孔成像中不同的针孔大小、障板厚度、背光能量对成像质量的影响,对于快点火实验中微米尺寸塑料小球,进行了诊断方案优化。模拟结果表明,综合考虑光通量及成像空间分辨,针孔半径为10 m时成像效果最佳;此时,采用2.7 keV的Mo背光源可以获得最佳的密度分辨。     

神光Ⅱ装置靶丸内爆过程X射线背光照相实验研究

在神光Ⅱ装置上,8路激光注入金柱腔靶产生X射线驱动位于柱腔中心的DD靶丸内爆,第9路激光辐照Pd背光靶产生的L线X射线透视内爆靶丸,用针孔成像方式获得靶丸的透视图像,高速X射线条纹相机记录靶丸透视图像,建立了间接驱动内爆靶丸背光照相的实验方法,清晰地观测到了靶丸内爆的过程,对透视图像分析获得了内爆靶丸壳层运动轨迹和速度的实验数据,所获实验结果可用于间接驱动靶丸优化设计,还可用于内爆动力学数值模拟建模和计算结果的验证。     

End-on x-ray backlighting experiments for axial diagnostics of wire-array Z-pinch plasma on PPG-1

An X-pinch axial backlighting system has been designed to quantitatively measure the density distribution of wirearray Z-pinch plasmas. End-on backlighting experiments were carried out on a 200 kA, 100 ns pulsed-power generator(PPG-1) at the Tsinghua University. Compared with side-on backlighting, end-on measurements provide an axial view of the evolution of Z-pinch plasmas. Early stages of 2-, 4-, and 8-wire Z-pinch plasmas were observed via point-projection backlighting radiography with a relatively high success rate. The density distribution of Z-pinch plasma on the r–θ plane was obtained directly from the images with the help of step wedges, and the inward radial velocity was calculated. The ablation rates obtained by X-pinch backlighting experiments are compared in detail with those calculated by the rocket model and the results show consistency.     

在发光二极管背光源上极具应用前景的Beta-sialon (Si6-zAlzOzN8-z):Eu2+窄带绿色荧光粉

基于氮化镓的白光发光二极管(LED)是目前一项崭新的背光源技术,广泛应用于宽色域、高光效的液晶显示屏。 在此项技术中,作为关键材料的荧光粉决定着背光单元的色域范围、发光效率和可靠性,因而要求它应具合适的发射波长和窄带发射。 β-sialon:Eu²⁺(sialon:silicon aluminum oxynitride(赛龙))就是一款非常适合背光应用的绿色荧光粉,这得益于其位于525~545 nm发射峰和只有55 nm狭窄的峰宽。 此文回顾和综述了β-sialon:Eu²⁺的合成方法、光谱特性、电子结构、晶体结构、可靠性和它的具体应用。 计算模拟和实验测试结果表明,Eu²⁺位于沿c轴方向的大孔道之中,并与6个最紧邻的(O,N)原子等距离配位。 因而,Eu²⁺的狭窄发射峰源自于Eu²⁺局域结构的高度对称性。 β-sialon:Eu²⁺的发射波长和带宽都能通过组成裁剪,即z值,进行调控;低z值组成能够实现更短波长发射和更窄带宽。 与传统的基于钇铝石榴石(YAG)荧光粉的背光源相比,β-sialon:Eu²⁺再搭配红色荧光粉制备的背光源具有更宽的色域,色域范围可提高15%以上。 其优异的发光性能和高可靠性使得β-sialon:Eu²⁺成为应用于先进显示屏的极其重要的绿色发光材料。     

“阳”加速器钛丝X箍缩光源辐射特性实验研究

为了利用X箍缩产生的点光源作为背光光源对丝阵Z箍缩内爆早期的负 载内部结构进行背光照相, 在"阳"加速器(电流峰值为500-800 kA, 上升时间约80 ns)上开展了钛丝(丝交叉角度为60°) X箍缩光源辐射特性的初步实验研究. 通过X射线二极管探测器、透射光栅谱仪、晶体谱仪和狭缝相机等诊断设备获取了箍缩点光源的辐射功率达到1.5 GW左右, 辐射能量约为1 J, 光子能量为keV量级的辐射能谱范围主要集中在1-4 keV能段, 点光源尺寸小于15 μm, 其时间尺度(辐射脉冲半高宽)达到了200 ps. 对光源特征信息进行了初步分析, 同时掌握了有效获取钛丝X箍缩单脉冲点光源的方法.