1.0 MeV电子碰撞引起Ta 和Au 内壳电离截面的测量

无论对深入理解电子-原子的作用机制,还是在材料等领域的实际应用,电子轰击原子的内壳电离截面都具有重要意义。当前电子碰撞引起原子内壳电离的实验数据多集中在几十keV 入射能量和中小Z 靶原子,其它数据相对比较缺乏。本工作以能量为1.0 MeV电子轰击Ta 和Au 靶,通过测量靶原子特征X射线的产额,获得其K壳电离截面分别为13.3 和10.1 b,L 壳电离截面分别为554 和338 b。并将实验结果和相应的理论进行了对比,结果显示,本实验测得的K壳电离截面与Casnati、Hombourger 理论值、L 壳电离截面与Scoeld和Born-Bethe 的理论值相符。Accurate experimental data for atomic inner-shell ionization cross-sections by electrons are of basic importance both in understanding inelastic electron-atom interaction and its application. Up to now, most of available data on this process were mainly concentrated on the low and medium Z atoms by the bombardment of low energy electrons. In present experiments K-shell and L-shell ionization cross-sections of Ta and Au in collisions with 1.0 MeV eleltron were determined by measuring the characteristic X-rays emitted from the target atoms. For the present collision systems the K-shell ionization cross-sections were found to be 13.3 and 10.1 b,and the L-shell ionization cross sections were 554 and 338 b, respectively. The measured K-shell ionization cross sections are in reasonable agreement with the theoretic predictions of Casnati and Hombourger, while L-shell ionization cross sections are consistent with the theoretical results of Soc eld and Born-Bethey.     

刻槽绝缘平行板对电子束的导向效应研究

采用不同材质的刻槽绝缘平行板,包括高纯度石英玻璃、聚四氟乙烯（Teflon）、酚醛树脂（电木）和聚甲醛板（赛钢板）,并在15 pA/mm2 ~14.3 nA/mm2范围内改变入射流强,利用1 500 eV电子束入射上述绝缘平行板,实验研究了上述平行板对电子束的导向行为。实验发现,上述电子束通过上述平行板时存在明显的导向现象,其导向行为与束流流强和绝缘材质无关。据此,可排除绝缘平行板内表面沉积电荷自组织充放电过程中,以绝缘材料的面电阻和体电阻对地泄放的线性形式放电过程。Adopting several grooved parallel plates made by different insulators, such as high-purity fused quartz, Teflon, Bakelite and POM (Polyformaldehyde), and further adjusting the electron beam current in a wide range (tens of pA~tens of nA), the discharging mechanism in the self-organizing charge and discharge processes of electron guiding was investigated and discussed by using 1 500 eV incident electron beam. The present results show that, the electron guiding behaviors are obviously existing when such electron beam is transmitted through the above grooved insulating parallel plates, which are independent on beam current and insulators. Our results suggest that, the possibilities of the accumulated charges on inner-surface of grooved parallel plates linearly discharging through surface and bulk resistances of plates into the ground should be excluded.