Theoretical analysis of BLM system for HLS Ⅱ

Hefei Light Source (HLS) is being upgraded to HLS Ⅱ. Its emittance will be much lower than before, therefore the Touschek scattering will increase significantly and become the dominant factor of beam loss. So it is necessary to build a new beam loss monitoring (BLM) system that, in contrast to the old one, is able to obtain the quantity and position information of lost electrons. This information is useful in the commissioning, troubleshooting, and beam lifetime studying for HLS Ⅱ. This paper analyzes the distribution features of different kinds of lost electrons, introduces the operation parameters of the new machine and discusses how to choose proper monitoring positions. Based on these comprehensive analyses, a new BLM system for HLS Ⅱ is proposed.     

CSNS/RCS脉冲电源均匀传输线障碍点分析

通过研究均匀传输线特征阻抗失配原理,发现传输电缆特征阻抗失配会导致负载终端励磁电流幅值发生畸变。对电源主电路关键参数进行分析,发现均匀传输线匹配阻抗失配会造成磁铁处励磁电流幅值变小,上升时间变短。建立均匀传输线障碍点等效模型,推导出脉冲电源传输线障碍点处反射系数,对串联电阻和并联电阻障碍点深入分析,发现传输线特征阻抗失配,会导致匹配负载处有功功率减小。最后通过高压电缆被击穿故障使其得以验证。