Enhancement of upconversion luminescence of YAlO3:Er3+ by Gd3+ doping

The upconversion luminescences of YAlO3:Er3+ phosphor co-doping with different Gd3+ concentrations are investigated under the excitation of 980- and 532-nm diode lasers. A near ultraviolet upconversion emission at 410 nm is observed in YAlO3 under 532-nm excitation. Moreover, the inactive Gd3+ ions can improve the upconversion intensity efficiently in a certain range of concentration. Under 980-nm excitation, the visible upconversion emissions at 546 and 646 nm are enhanced by about 10 and 8 times at the Gd3+ concentration of 40%, respectively. The upconversion emission at 410 nm under 532-nm excitation is also enhanced by 7 times. The substitution of Gd3+ ions for Y3+ sites changes the local symmetry of Er3+, leading to the improvement of upconversion efficiency.     

机械合金化制备金属间化合物SbSn及其在原油乳液脱硫中的应用

原油中有机硫化物的增多和重质化[1]在炼制过程中易造成设备腐蚀,同时部分硫氧化生成的SO2排放至大气中,可产生酸雨,对环境造成污染.世界各国对成品油中硫含量的规定日益严格,尤其是在各国燃料结构中占有较高份额的汽油、煤油和柴油.     

层状钠锰氧化物的制备及离子交换反应动力学

层状钠锰氧化物的制备及离子交换反应动力学     

Annealing behaviour of structure and morphology and its effects on the optical gain of Er3+/Yb3+ co-doped Al2O3 planar waveguide amplifier

Using transmission electron microscopy (TEM) and x-ray diffraction analysis, we have studied the structural and morphological evolution of highly Er/Yb co-doped Al₂O₃ films in the temperature range from $600\,^{\circ}\mkern-1mu$C--900$\,^{\circ}\mkern-1mu$C. By comparison with TEM observation, the annealing behaviours of photoluminescence (PL) emission and optical loss were found to have relation to the structure and morphology. The increase of PL intensity and optical loss above 800$\,^{\circ}\mkern-1mu$C might result from the crystallization of amorphous Al₂O₃ films. Based on the study on the structure and morphology, a rate equation propagation model of a multilevel system was used to calculate the optical gains of Er-doped Al₂O₃ planar waveguide amplifiers involving the variation of PL efficiency and optical loss with annealing temperature. It was found that the amplifiers had an optimized optical gain at the temperature corresponding to the minimum of optical loss, rather than at the temperature corresponding to the maximum of PL efficiency, suggesting that the optical loss is a key factor for determining the optical gain of an Er-doped Al₂O₃ planar waveguide amplifier.     

Microstructure and photoluminescence of Er-doped SiOx films synthesized by ion beam assisted deposition

Er-doped SiO_x films were synthesized at 500℃ by ion beam assisted deposition technique and annealed at 800 and 1100℃ for 2h in the air atmosphere. The analysis by using energy dispersive x-ray spectroscopy showed that the ratio of Si to O decreased from 3 in the as-deposited films to about 1 in the annealed films. The investigation by using transmission electron microscopy and x-ray diffraction indicated that annealing induces a microstructure change from amorphous to crystalline. The grain sizes in the films were about 10 and 40nm when annealed at 800 and 1100℃, respectively. The films annealed at temperatures of 800 and 1100℃ exhibited a sharp photoluminescence (PL) at 1.533μm from the Er centres when pumped by 980nm laser. The influence of microstructure and grain size on the PL from Er-doped SiO_x films has been studied and discussed.     

Yb掺杂对Er/Yb共掺Al2O3薄膜光致荧光性能的影响

采用反应射频磁控溅射技术,通过调整溅射靶面上金属Er和Yb的面积比例制备出了不同Yb含量的Er／Yb共掺Al2O3薄膜,重点探讨了薄膜制备过程中Er、Yb成分比例控制的可靠性及Yb的掺杂浓度对Er／Yb共掺Al2O3薄膜室温光致荧光谱强度及峰型的影响。利用卢瑟福背散射谱(RBS)和电子能谱(EDX)对薄膜成分进行的分析表明：薄膜中Er、Yb成分的比例与实际的Er、Yb靶面积比基本一致。薄膜经过1000℃退火2h的室温光致发光谱表明：Yb掺杂显著提高了薄膜的光致荧光强度,当Yb／Er靶面积比为4：1时,光致荧光强度和半峰全宽最大。研究结果表明：对于Al2O3薄膜,合适的Yb／Er浓度,不仅可以显著改善薄膜的发光效率,而且可以增加频带带宽。     

退火温度对Er/Yb共掺Al2O3薄膜的光致荧光光谱的影响

通过对不同退火条件下Er/Yb共掺Al_２O_３薄膜光致荧光(PL)光谱的 系统分析，研究了高Er/Yb掺杂浓度所导致的晶体场变化对薄膜PL光谱的影响，并结合薄膜结构分析，探讨了Al_２O_３薄膜的结晶状态在Er^３＋激活、PL光谱宽化 中的作用及可能的物理机理.研 究结果表明：退火处理所导致的Er^３＋ PL光谱的变化与薄膜的微观状态之 间有着密 切的联系.在600—750℃范围内，薄膜呈非晶态结构，薄膜荧光强度的增加主要是薄膜内缺 陷减少所致；在800—900℃范围内，γ-Al_２O_３相的出现是导致荧 光强度明显增加的主 要原因；当退火温度为1000℃时，Er，Yb的大量析出致使荧光强度的急剧下降.此外，对PL 光谱线形分析表明，各子能级跃迁的相对强度变化是导致荧光光谱宽化的主要因素. 关键词： Er/Yb共掺 ２O_３薄膜')" href="#">Al_２O_３薄膜 光致荧光     

退火温度对Er/Yb共掺Al2O3薄膜的光致荧光光谱的影响

通过对不同退火条件下Er/Yb共掺Al2O3薄膜光致荧光(PL)光谱的系统分析,研究了高Er/Yb掺杂浓度所导致的晶体场变化对薄膜PL光谱的影响,并结合薄膜结构分析,探讨了Al2O3薄膜的结晶状态在Er3+激活、PL光谱宽化中的作用及可能的物理机理.研究结果表明:退火处理所导致的Er3+ PL光谱的变化与薄膜的微观状态之间有着密切的联系.在600-750℃范围内,薄膜呈非晶态结构,薄膜荧光强度的增加主要是薄膜内缺陷减少所致;在800-900℃范围内,γ-Al2O3相的出现是导致荧光强度明显增加的主要原因;当退火温度为1000℃时,Er,Yb的大量析出致使荧光强度的急剧下降.此外,对PL光谱线形分析表明,各子能级跃迁的相对强度变化是导致荧光光谱宽化的主要因素.     

高浓度Er/Yb共掺ZnO薄膜的结构及室温光致发光特性

采用射频磁控溅射方法制备了Er/Yb共掺ZnO薄膜,研究了退火处理对高浓度Er/Yb共掺ZnO薄膜的结构演化和光致发光(PL)特性的影响。X射线衍射分析结果表明:Er/Yb掺杂导致ZnO薄膜的晶粒细化及择优取向性消失,ZnO晶粒随退火温度的增加而逐渐长大。900℃退火时,出现Er3 、Yb3 偏析,退火温度高于1000℃时,薄膜与基体间发生了界面反应,1200℃时,ZnO完全转变为Zn2SiO4相。光致发光测量结果表明:高于900℃退火处理后,Er/Yb共掺ZnO薄膜在1540 nm附近具有明显的光致发光,发光强度在退火温度为1050℃时达到最大值;光致发光光谱呈现典型的晶体基质中Er3 离子发光光谱所具有的明锐多峰结构特征。此外,探讨了薄膜结构演化及其对光致发光光谱的影响。