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物理学   1篇
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A retarding field energy analyzer(RFEA) is used to measure the time-averaged ion energy distributions(IEDs) on the substrate in both continuous wave(CW) and synchronous pulse modulated radio-frequency(RF) inductively coupled Ar plasmas(ICPs).The effects of the phase shift θ between the RF bias voltage and the RF source on the IED is investigated under various discharge conditions.It is found that as θ increases from 0 to π,the IED moves towards the low-energy side,and its energy width becomes narrower.In order to figure out the physical mechanism,the voltage waveforms on the substrate are also measured.The results show that as θ increases from 0 to π,the amplitude of the voltage waveform decreases and,meanwhile,the average sheath potential decreases as well.Specifically,the potential drop in the sheath on the substrate exhibits a maximum value at the same phase(i.e.,θ = 0) and a minimum value at the opposite phase(i.e.,θ = π).Therefore,when ions traverse across the sheath region above the substrate,they obtain less energies at lower sheath potential drop,leading to lower ion energy.Besides,as θ increases from π to 2π,the IEDs and their energy widths change reversely.  相似文献   
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