Preparation and structural properties of thin carbon films by very-high-frequency magnetron sputtering

Growth and structural properties of thin a-C films prepared by the 60 MHz very-high-frequency(VHF) magnetron sputtering were investigated. The energy and flux of ions impinging the substrate were also analyzed. It is found that the thin a-C films prepared by the 60 MHz sputtering have a lower growth rate, a smooth surface, and more sp~3 contents.These features are related to the higher ion energy and the lower ions flux onto the substrate. Therefore, the 60 MHz VHF sputtering is more suitable for the preparation of thin a-C film with more sp~3 contents.     

氟化非晶碳薄膜的光学带隙分析

研究了CHF3C6H6沉积的氟化非晶碳(αC∶F)薄膜的光学带隙.发现αC∶F薄膜光学带隙的大小取决于薄膜中C—F,CC的相对含量.这是由于CC形成的窄带隙π键和C—F形成的宽带隙σ键含量的相对变化,改变了带边态密度分布的结果.在微波功率为140—700W、沉积气压为01—10Pa、源气体CHF3∶C6H6流量比为1∶1—10∶1条件下沉积的αC∶F薄膜,光学带隙在176—398eV之间 关键词： 氟化非晶碳(αC∶F)薄膜 光学带隙 键结构     

Initial growth and microstructure feature of Ag films prepared by very-high-frequency magnetron sputtering

The initial growth and microstructure feature of Ag films formation were investigated, which were prepared by using the very-high-frequency(VHF)(60 MHz) magnetron sputtering. Because of the moderate energy and very low flux density of ions impinging on the substrate, the evolutions of initial growth for Ag films formation were well controlled by varying the sputtering power. It was found that the initial growth of Ag films followed the island(Volmer—Weber, VW) growth mode, but before the island nucleation, the adsorption of Ag nanoparticles and the formation of Ag clusters dominated the growth. Therefore, the whole initial stages of Ag films formation included the adsorption of nanoparticles, the formation of clusters, the nucleation by the nanoparticles and clusters simultaneously, the islands formation, and the coalescence of islands.     

Effect of driving frequency on the structure of silicon grown on Ag(111) films by very-high-frequency magnetron sputtering

The effect of driving frequency on the structure of silicon grown on Ag(111) film is investigated, which was prepared by using the very-high-frequency(VHF)(40.68 MHz and 60 MHz) magnetron sputtering. The energy and flux density of the ions impinging on the substrate are also analyzed. It is found that for the 60-MHz VHF magnetron sputtering, the surface of silicon on Ag(111) film exhibits a small cone structure, similar to that of Ag(111) film substrate, indicating a better microstructure continuity. However, for the 40.68-MHz VHF magnetron sputtering, the surface of silicon on Ag(111) film shows a hybrid structure of hollowed-cones and hollowed-particles, which is completely different from that of Ag(111)film. The change of silicon structure is closely related to the differences in the ion energy and flux density controlled by the driving frequency of sputtering.