强反型区下纳米MOSFET的射频噪声机理分析

为了有效地表征纳米MOSFET强反型区下的射频噪声特性,研究了其噪声建模的方法。在分析45 nm MOSFET射频小信号等效电路参数提取结果的基础上,建立了该器件漏极电流噪声的简洁模型。该模型完整地表征了决定45 nm器件噪声机理的三个组成部分:本征漏极电流噪声、栅极管脚寄生电阻热噪声和栅漏衬底寄生电磁耦合噪声。噪声测量在验证所建模型准确性和精度的同时,还表明:45 nm MOSFET的本征漏极电流噪声为受抑制的散粒噪声,并且随着栅源偏压的降低受抑制性逐渐减弱直至消失。     

Observation of nonconservation characteristics of radio frequency noise mechanism of 40-nm n-MOSFET

Bias non-conservation characteristics of radio-frequency noise mechanism of 40-nm n-MOSFET are observed by modeling and measuring its drain current noise. A compact model for the drain current noise of 40-nm MOSFET is proposed through the noise analysis. This model fully describes three kinds of main physical sources that determine the noise mechanism of 40-nm MOSFET, i.e., intrinsic drain current noise, thermal noise induced by the gate parasitic resistance, and coupling thermal noise induced by substrate parasitic effect. The accuracy of the proposed model is verified by noise measurements, and the intrinsic drain current noise is proved to be the suppressed shot noise, and with the decrease of the gate voltage, the suppressed degree gradually decreases until it vanishes. The most important findings of the bias non-conservative nature of noise mechanism of 40-nm n-MOSFET are as follows.(i) In the strong inversion region, the suppressed shot noise is weakly affected by the thermal noise of gate parasitic resistance. Therefore, one can empirically model the channel excess noise as being like the suppressed shot noise.(ii) In the middle inversion region, it is almost full of shot noise.(iii) In the weak inversion region, the thermal noise is strongly frequency-dependent, which is almost controlled by the capacitive coupling of substrate parasitic resistance. Measurement results over a wide temperature range demonstrate that the thermal noise of 40-nm n-MOSFET exists in a region from the weak to strong inversion, contrary to the predictions of suppressed shot noise model only suitable for the strong inversion and middle inversion region. These new findings of the noise mechanism of 40-nm n-MOSFET are very beneficial for its applications in ultra low-voltage and low-power RF, such as novel device electronic structure optimization, integrated circuit design and process technology evaluation.     

乌药提取物的抗肿瘤及抗氧化活性

使用不同极性的有机溶剂分离得到了5种（石油醚、氯仿、乙酸乙酯、正丁醇、水）乌药提取物,并采用多种实验方法研究了其抗肿瘤及抗氧化活性.抗肿瘤活性研究结果显示：乌药石油醚萃取物对供试4种人癌细胞的细胞毒性最强;而HepG2细胞对乌药石油醚部位的细胞毒性最为敏感,半数抑制率（IC50）为（71.9±1.1）mg·L-1;乌药石油醚萃取物是通过诱发细胞凋亡来达到其体外抗HepG2作用的.抗氧化活性研究结果显示：乌药乙酸乙酯萃取物具有最强的体外抗氧化能力.