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Third-Order Optical Nonlinearity of a Novel Material:(Tetramethylammonium) bis (1,3-dithiole-2-thione-4,5-dithiolato) Copper 下载免费PDF全文
A novel dmit^2- salt: (tetramethylammonium)bis(1,3-dithiole-2-thione-4,5-dithiolato) copper, abbreviated as MECu, is synthesized and its third-order optical nonlinearity is characterized by Z-scan technique at a wavelength of 1064nm with laser duration of 30ps. Z-scan curves reveal a negative Kerr coefficient at 1064nm and no nonlinear absorption is observed. The nonlinear refraction coefficient n2 and the second hyperpolarizability γ have been determined to be as large as 2.15 × 10^-11 esu and 3.23 × 10^-31 esu, respectively, suggesting MECu is a potential material for optical device applications. 相似文献
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The third-order optical nonlinearities of [(CH3)4N]Au(dmit)2 (dmit = 4,5-dithiolate-1,3-dithiole-2-thione) at 532 nm and 1064 nm are investigated using the Z-scan technique with pulses of picoseconds duration. The Z-scan spectra reveal a strong nonlinear absorption (reverse saturable absorption) and a negative nonlinear refraction at 532 nm. No nonlinear absorption is observed at 1064 nm. The molecular second-order hyperpolarizability γ for the [(CH3)4N]Au(dmit)2 molecule at 532nm is estimated to be as high as (2.1 ±0.1) × 10^-31 esu, which is nearly three times larger than that at 1064 nm. The mechanism responsible for the difference between the results is analysed. Nonlinear transmission measurements suggest that this material has potential applications in optical limiting. 相似文献
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合成了一种新型有机金属配合物Cetyltrimethylammonium-bis(2-thioxo-1,3- dithiole- 4,5-dithiolato)-copper(简称CtCu)材料.采用单光束Z扫描测试技术,在波长为1 053 nm,脉宽为1 ns的条件下研究了该样品的三阶非线性光学性质.研究发现,该材料具有很强的饱和吸收特性,激发态的有效吸收截面为σeff=1.10×10-19 cm2,与基态吸收截面的比值为1∶484.利用非线性透过率实验验证了材料的饱和吸收特性,并对其产生机理进行了分析.实验结果表明,该材料在近红外波段的激光脉冲压缩方面有潜在的应用前景. 相似文献
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Photoluminescence spectroscopy is used to study defects found in single ZnO nano/microwires at 90 K. The defect, acting as binding site for bound exciton (BX) transition, is represented by BF, the fractional intensity of the BX peak in the whole near-band edge ultraviolet (UV) luminescence. The concentration of defects as origins of the visible emissions is proportional to the intensity fraction DF, i.e., the intensity fraction of visible emissions in the sum total of all UV and visible luminescences. By comparing BF and DF, it is concluded that the two defects are not correlated to each other. The former kind of defect is considered to be related to the blueshift of the near-band edge peak as the radius of the nano/microwires decreases at room temperature. 相似文献
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